Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII):
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Bibliographic Details
Corporate Authors: Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials Reno, Nev (Author), State of the Art Program on Compound Semiconductors (Author)
Format: Conference Proceeding Book
Language:English
Published: Pennington, NJ Electrochemical Soc. 1995
Series:Electrochemical Society: Proceedings 1995,6
Subjects:
Physical Description:IX, 377 S. Ill., graph. Darst.
ISBN:1566771005

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