Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII):
Gespeichert in:
Körperschaften: | , |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Pennington, NJ
Electrochemical Soc.
1995
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Schriftenreihe: | Electrochemical Society: Proceedings
1995,6 |
Schlagworte: | |
Beschreibung: | IX, 377 S. Ill., graph. Darst. |
ISBN: | 1566771005 |
Internformat
MARC
LEADER | 00000nam a2200000zcb4500 | ||
---|---|---|---|
001 | BV013175935 | ||
003 | DE-604 | ||
005 | 20001019 | ||
007 | t | ||
008 | 000529s1995 ad|| |||| 10||| eng d | ||
020 | |a 1566771005 |9 1-56677-100-5 | ||
035 | |a (OCoLC)33428300 | ||
035 | |a (DE-599)BVBBV013175935 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-703 | ||
050 | 0 | |a TK7871.99.C65 | |
084 | |a UP 3100 |0 (DE-625)146372: |2 rvk | ||
111 | 2 | |a Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials |d 1995 |c Reno, Nev. |j Verfasser |0 (DE-588)5283583-2 |4 aut | |
245 | 1 | 0 | |a Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) |c ed. by V. Malhotra ... |
264 | 1 | |a Pennington, NJ |b Electrochemical Soc. |c 1995 | |
300 | |a IX, 377 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Electrochemical Society: Proceedings |v 1995,6 | |
650 | 7 | |a Composés semiconducteurs |2 ram | |
650 | 7 | |a Plaquettes à gravure en semiconducteurs |2 ram | |
650 | 4 | |a Compound semiconductors |x Design and construction |v Congresses | |
650 | 4 | |a Semiconductor wafers |v Congresses | |
650 | 0 | 7 | |a Verbindungshalbleiter |0 (DE-588)4062623-4 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1995 |z Reno Nev. |2 gnd-content | |
689 | 0 | 0 | |a Verbindungshalbleiter |0 (DE-588)4062623-4 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Malhotra, V. |e Sonstige |4 oth | |
711 | 2 | |a State of the Art Program on Compound Semiconductors |n 22 |d 1995 |c Reno, Nev. |j Verfasser |0 (DE-588)1801004-0 |4 aut | |
830 | 0 | |a Electrochemical Society: Proceedings |v 1995,6 |w (DE-604)BV001900941 |9 1995,6 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-008977282 |
Datensatz im Suchindex
_version_ | 1804127876386127872 |
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any_adam_object | |
author_corporate | Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials Reno, Nev State of the Art Program on Compound Semiconductors |
author_corporate_role | aut aut |
author_facet | Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials Reno, Nev State of the Art Program on Compound Semiconductors |
author_sort | Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials Reno, Nev |
building | Verbundindex |
bvnumber | BV013175935 |
callnumber-first | T - Technology |
callnumber-label | TK7871 |
callnumber-raw | TK7871.99.C65 |
callnumber-search | TK7871.99.C65 |
callnumber-sort | TK 47871.99 C65 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | UP 3100 |
ctrlnum | (OCoLC)33428300 (DE-599)BVBBV013175935 |
discipline | Physik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01870nam a2200421zcb4500</leader><controlfield tag="001">BV013175935</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20001019 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000529s1995 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1566771005</subfield><subfield code="9">1-56677-100-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)33428300</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013175935</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.99.C65</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 3100</subfield><subfield code="0">(DE-625)146372:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials</subfield><subfield code="d">1995</subfield><subfield code="c">Reno, Nev.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5283583-2</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII)</subfield><subfield code="c">ed. by V. Malhotra ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Pennington, NJ</subfield><subfield code="b">Electrochemical Soc.</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 377 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Electrochemical Society: Proceedings</subfield><subfield code="v">1995,6</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Composés semiconducteurs</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Plaquettes à gravure en semiconducteurs</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Compound semiconductors</subfield><subfield code="x">Design and construction</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductor wafers</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Verbindungshalbleiter</subfield><subfield code="0">(DE-588)4062623-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1995</subfield><subfield code="z">Reno Nev.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Verbindungshalbleiter</subfield><subfield code="0">(DE-588)4062623-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Malhotra, V.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">State of the Art Program on Compound Semiconductors</subfield><subfield code="n">22</subfield><subfield code="d">1995</subfield><subfield code="c">Reno, Nev.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)1801004-0</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Electrochemical Society: Proceedings</subfield><subfield code="v">1995,6</subfield><subfield code="w">(DE-604)BV001900941</subfield><subfield code="9">1995,6</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008977282</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1995 Reno Nev. gnd-content |
genre_facet | Konferenzschrift 1995 Reno Nev. |
id | DE-604.BV013175935 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:40:19Z |
institution | BVB |
institution_GND | (DE-588)5283583-2 (DE-588)1801004-0 |
isbn | 1566771005 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008977282 |
oclc_num | 33428300 |
open_access_boolean | |
owner | DE-703 |
owner_facet | DE-703 |
physical | IX, 377 S. Ill., graph. Darst. |
publishDate | 1995 |
publishDateSearch | 1995 |
publishDateSort | 1995 |
publisher | Electrochemical Soc. |
record_format | marc |
series | Electrochemical Society: Proceedings |
series2 | Electrochemical Society: Proceedings |
spelling | Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials 1995 Reno, Nev. Verfasser (DE-588)5283583-2 aut Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) ed. by V. Malhotra ... Pennington, NJ Electrochemical Soc. 1995 IX, 377 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electrochemical Society: Proceedings 1995,6 Composés semiconducteurs ram Plaquettes à gravure en semiconducteurs ram Compound semiconductors Design and construction Congresses Semiconductor wafers Congresses Verbindungshalbleiter (DE-588)4062623-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1995 Reno Nev. gnd-content Verbindungshalbleiter (DE-588)4062623-4 s DE-604 Malhotra, V. Sonstige oth State of the Art Program on Compound Semiconductors 22 1995 Reno, Nev. Verfasser (DE-588)1801004-0 aut Electrochemical Society: Proceedings 1995,6 (DE-604)BV001900941 1995,6 |
spellingShingle | Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) Electrochemical Society: Proceedings Composés semiconducteurs ram Plaquettes à gravure en semiconducteurs ram Compound semiconductors Design and construction Congresses Semiconductor wafers Congresses Verbindungshalbleiter (DE-588)4062623-4 gnd |
subject_GND | (DE-588)4062623-4 (DE-588)1071861417 |
title | Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) |
title_auth | Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) |
title_exact_search | Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) |
title_full | Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) ed. by V. Malhotra ... |
title_fullStr | Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) ed. by V. Malhotra ... |
title_full_unstemmed | Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) ed. by V. Malhotra ... |
title_short | Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the Twenty Second State of the Art Program on Compound Semiconductors (SOTAPOCS XXII) |
title_sort | proceedings of the symposium on nondestructive wafer characterization for compound semiconductor materials and the twenty second state of the art program on compound semiconductors sotapocs xxii |
topic | Composés semiconducteurs ram Plaquettes à gravure en semiconducteurs ram Compound semiconductors Design and construction Congresses Semiconductor wafers Congresses Verbindungshalbleiter (DE-588)4062623-4 gnd |
topic_facet | Composés semiconducteurs Plaquettes à gravure en semiconducteurs Compound semiconductors Design and construction Congresses Semiconductor wafers Congresses Verbindungshalbleiter Konferenzschrift 1995 Reno Nev. |
volume_link | (DE-604)BV001900941 |
work_keys_str_mv | AT symposiumonnondestructivewafercharacterizationforcompoundsemiconductormaterialsrenonev proceedingsofthesymposiumonnondestructivewafercharacterizationforcompoundsemiconductormaterialsandthetwentysecondstateoftheartprogramoncompoundsemiconductorssotapocsxxii AT malhotrav proceedingsofthesymposiumonnondestructivewafercharacterizationforcompoundsemiconductormaterialsandthetwentysecondstateoftheartprogramoncompoundsemiconductorssotapocsxxii AT stateoftheartprogramoncompoundsemiconductorsrenonev proceedingsofthesymposiumonnondestructivewafercharacterizationforcompoundsemiconductormaterialsandthetwentysecondstateoftheartprogramoncompoundsemiconductorssotapocsxxii |