Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy: NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Amsterdam [u.a.]
Elsevier
2000
|
| Series: | Applied surface science
157,4 |
| Subjects: | |
| Item Description: | Einzelaufnahme eines Zeitschr.-H. |
| Physical Description: | IX S., S. 207 - 428 Ill., graph. Darst. |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013139032 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 000508s2000 ad|| |||| 00||| eng d | ||
| 035 | |a (OCoLC)174820045 | ||
| 035 | |a (DE-599)BVBBV013139032 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-355 |a DE-29T |a DE-706 | ||
| 111 | 2 | |a International Workshop on Noncontact Atomic Force Microscopy |n 2 |d 1999 |c Pontresina |j Verfasser |0 (DE-588)1901991-9 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy |b NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 |c ed. by R. Bennewitz ... |
| 246 | 1 | 3 | |a NC-AFM 99 |
| 264 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 2000 | |
| 300 | |a IX S., S. 207 - 428 |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Applied surface science |v 157,4 | |
| 500 | |a Einzelaufnahme eines Zeitschr.-H. | ||
| 650 | 0 | 7 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1999 |z Pontresina |2 gnd-content | |
| 689 | 0 | 0 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Bennewitz, Roland |d 1967- |e Sonstige |0 (DE-588)115429581 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008950948 | ||
Record in the Search Index
| _version_ | 1804127837235445760 |
|---|---|
| any_adam_object | |
| author_GND | (DE-588)115429581 |
| author_corporate | International Workshop on Noncontact Atomic Force Microscopy Pontresina |
| author_corporate_role | aut |
| author_facet | International Workshop on Noncontact Atomic Force Microscopy Pontresina |
| author_sort | International Workshop on Noncontact Atomic Force Microscopy Pontresina |
| building | Verbundindex |
| bvnumber | BV013139032 |
| ctrlnum | (OCoLC)174820045 (DE-599)BVBBV013139032 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01341nam a2200337 cb4500</leader><controlfield tag="001">BV013139032</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000508s2000 ad|| |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)174820045</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013139032</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Workshop on Noncontact Atomic Force Microscopy</subfield><subfield code="n">2</subfield><subfield code="d">1999</subfield><subfield code="c">Pontresina</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)1901991-9</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy</subfield><subfield code="b">NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999</subfield><subfield code="c">ed. by R. Bennewitz ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">NC-AFM 99</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam [u.a.]</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX S., S. 207 - 428</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Applied surface science</subfield><subfield code="v">157,4</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zeitschr.-H.</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1999</subfield><subfield code="z">Pontresina</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Bennewitz, Roland</subfield><subfield code="d">1967-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)115429581</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008950948</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1999 Pontresina gnd-content |
| genre_facet | Konferenzschrift 1999 Pontresina |
| id | DE-604.BV013139032 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:39:41Z |
| institution | BVB |
| institution_GND | (DE-588)1901991-9 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008950948 |
| oclc_num | 174820045 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-29T DE-706 |
| owner_facet | DE-355 DE-BY-UBR DE-29T DE-706 |
| physical | IX S., S. 207 - 428 Ill., graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Applied surface science |
| spelling | International Workshop on Noncontact Atomic Force Microscopy 2 1999 Pontresina Verfasser (DE-588)1901991-9 aut Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 ed. by R. Bennewitz ... NC-AFM 99 Amsterdam [u.a.] Elsevier 2000 IX S., S. 207 - 428 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Applied surface science 157,4 Einzelaufnahme eines Zeitschr.-H. Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Pontresina gnd-content Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Bennewitz, Roland 1967- Sonstige (DE-588)115429581 oth |
| spellingShingle | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)1071861417 |
| title | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 |
| title_alt | NC-AFM 99 |
| title_auth | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 |
| title_exact_search | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 |
| title_full | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 ed. by R. Bennewitz ... |
| title_fullStr | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 ed. by R. Bennewitz ... |
| title_full_unstemmed | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 ed. by R. Bennewitz ... |
| title_short | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy |
| title_sort | proceedings of the second international workshop on noncontact atomic force microscopy nc afm 99 pontresina switzerland september 1 4 1999 |
| title_sub | NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 |
| topic | Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Rasterkraftmikroskopie Konferenzschrift 1999 Pontresina |
| work_keys_str_mv | AT internationalworkshoponnoncontactatomicforcemicroscopypontresina proceedingsofthesecondinternationalworkshoponnoncontactatomicforcemicroscopyncafm99pontresinaswitzerlandseptember141999 AT bennewitzroland proceedingsofthesecondinternationalworkshoponnoncontactatomicforcemicroscopyncafm99pontresinaswitzerlandseptember141999 AT internationalworkshoponnoncontactatomicforcemicroscopypontresina ncafm99 AT bennewitzroland ncafm99 |