Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy: NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2000
|
| Schriftenreihe: | Applied surface science
157,4 |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zeitschr.-H. |
| Beschreibung: | IX S., S. 207 - 428 Ill., graph. Darst. |
Internformat
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| indexdate | 2024-07-09T18:39:41Z |
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| physical | IX S., S. 207 - 428 Ill., graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
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| publisher | Elsevier |
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| series2 | Applied surface science |
| spelling | International Workshop on Noncontact Atomic Force Microscopy 2 1999 Pontresina Verfasser (DE-588)1901991-9 aut Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 ed. by R. Bennewitz ... NC-AFM 99 Amsterdam [u.a.] Elsevier 2000 IX S., S. 207 - 428 Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Applied surface science 157,4 Einzelaufnahme eines Zeitschr.-H. Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Pontresina gnd-content Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Bennewitz, Roland 1967- Sonstige (DE-588)115429581 oth |
| spellingShingle | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)1071861417 |
| title | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 |
| title_alt | NC-AFM 99 |
| title_auth | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 |
| title_exact_search | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 |
| title_full | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 ed. by R. Bennewitz ... |
| title_fullStr | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 ed. by R. Bennewitz ... |
| title_full_unstemmed | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 ed. by R. Bennewitz ... |
| title_short | Proceedings of the Second International Workshop on Noncontact Atomic Force Microscopy |
| title_sort | proceedings of the second international workshop on noncontact atomic force microscopy nc afm 99 pontresina switzerland september 1 4 1999 |
| title_sub | NC-AFM 99 ; Pontresina, Switzerland, September 1 - 4, 1999 |
| topic | Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Rasterkraftmikroskopie Konferenzschrift 1999 Pontresina |
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