Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces: Strasbourg, France, June 1 - 4, 1999
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Amsterdam u.a.
Elsevier
2000
|
| Series: | Thin solid films
364,1/2 |
| Subjects: | |
| Item Description: | Einzelaufn. eines Zeitschr.-Heftes |
| Physical Description: | VII, 305 S. graph. Darst. |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013127486 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 000502s2000 d||| |||| 10||| eng d | ||
| 035 | |a (OCoLC)43926905 | ||
| 035 | |a (DE-599)BVBBV013127486 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 1 | |a eng | |
| 049 | |a DE-384 |a DE-706 | ||
| 111 | 2 | |a Symposium Optical Characterization of Semiconductor Layers and Surfaces |d 1999 |c Straßburg |j Verfasser |0 (DE-588)3044736-7 |4 aut | |
| 245 | 1 | 0 | |a Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces |b Strasbourg, France, June 1 - 4, 1999 |c guest eds.: O. D. Hunderi ... |
| 264 | 1 | |a Amsterdam u.a. |b Elsevier |c 2000 | |
| 300 | |a VII, 305 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Thin solid films |v 364,1/2 | |
| 500 | |a Einzelaufn. eines Zeitschr.-Heftes | ||
| 650 | 4 | |a Semiconductors |x Testing |x Optical methods |v Congresses | |
| 650 | 0 | 7 | |a Halbleiterschicht |0 (DE-588)4158812-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Optische Spektroskopie |0 (DE-588)4043680-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1999 |z Straßburg |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiterschicht |0 (DE-588)4158812-5 |D s |
| 689 | 0 | 1 | |a Optische Spektroskopie |0 (DE-588)4043680-9 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Hunderi, Ola D. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008944112 | ||
Record in the Search Index
| _version_ | 1804127827154436096 |
|---|---|
| any_adam_object | |
| author_corporate | Symposium Optical Characterization of Semiconductor Layers and Surfaces Straßburg |
| author_corporate_role | aut |
| author_facet | Symposium Optical Characterization of Semiconductor Layers and Surfaces Straßburg |
| author_sort | Symposium Optical Characterization of Semiconductor Layers and Surfaces Straßburg |
| building | Verbundindex |
| bvnumber | BV013127486 |
| ctrlnum | (OCoLC)43926905 (DE-599)BVBBV013127486 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01485nam a2200361 cb4500</leader><controlfield tag="001">BV013127486</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000502s2000 d||| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)43926905</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013127486</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="1" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Symposium Optical Characterization of Semiconductor Layers and Surfaces</subfield><subfield code="d">1999</subfield><subfield code="c">Straßburg</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)3044736-7</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces</subfield><subfield code="b">Strasbourg, France, June 1 - 4, 1999</subfield><subfield code="c">guest eds.: O. D. Hunderi ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam u.a.</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VII, 305 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Thin solid films</subfield><subfield code="v">364,1/2</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufn. eines Zeitschr.-Heftes</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Testing</subfield><subfield code="x">Optical methods</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiterschicht</subfield><subfield code="0">(DE-588)4158812-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Spektroskopie</subfield><subfield code="0">(DE-588)4043680-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1999</subfield><subfield code="z">Straßburg</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiterschicht</subfield><subfield code="0">(DE-588)4158812-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Optische Spektroskopie</subfield><subfield code="0">(DE-588)4043680-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Hunderi, Ola D.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008944112</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1999 Straßburg gnd-content |
| genre_facet | Konferenzschrift 1999 Straßburg |
| id | DE-604.BV013127486 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:39:32Z |
| institution | BVB |
| institution_GND | (DE-588)3044736-7 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008944112 |
| oclc_num | 43926905 |
| open_access_boolean | |
| owner | DE-384 DE-706 |
| owner_facet | DE-384 DE-706 |
| physical | VII, 305 S. graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Thin solid films |
| spelling | Symposium Optical Characterization of Semiconductor Layers and Surfaces 1999 Straßburg Verfasser (DE-588)3044736-7 aut Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 guest eds.: O. D. Hunderi ... Amsterdam u.a. Elsevier 2000 VII, 305 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Thin solid films 364,1/2 Einzelaufn. eines Zeitschr.-Heftes Semiconductors Testing Optical methods Congresses Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf Optische Spektroskopie (DE-588)4043680-9 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Straßburg gnd-content Halbleiterschicht (DE-588)4158812-5 s Optische Spektroskopie (DE-588)4043680-9 s DE-604 Hunderi, Ola D. Sonstige oth |
| spellingShingle | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 Semiconductors Testing Optical methods Congresses Halbleiterschicht (DE-588)4158812-5 gnd Optische Spektroskopie (DE-588)4043680-9 gnd |
| subject_GND | (DE-588)4158812-5 (DE-588)4043680-9 (DE-588)1071861417 |
| title | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 |
| title_auth | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 |
| title_exact_search | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 |
| title_full | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 guest eds.: O. D. Hunderi ... |
| title_fullStr | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 guest eds.: O. D. Hunderi ... |
| title_full_unstemmed | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 guest eds.: O. D. Hunderi ... |
| title_short | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces |
| title_sort | papers presented at the 1999 e mrs spring conference symposium p optical characterization of semiconductor layers and surfaces strasbourg france june 1 4 1999 |
| title_sub | Strasbourg, France, June 1 - 4, 1999 |
| topic | Semiconductors Testing Optical methods Congresses Halbleiterschicht (DE-588)4158812-5 gnd Optische Spektroskopie (DE-588)4043680-9 gnd |
| topic_facet | Semiconductors Testing Optical methods Congresses Halbleiterschicht Optische Spektroskopie Konferenzschrift 1999 Straßburg |
| work_keys_str_mv | AT symposiumopticalcharacterizationofsemiconductorlayersandsurfacesstraßburg paperspresentedatthe1999emrsspringconferencesymposiumpopticalcharacterizationofsemiconductorlayersandsurfacesstrasbourgfrancejune141999 AT hunderiolad paperspresentedatthe1999emrsspringconferencesymposiumpopticalcharacterizationofsemiconductorlayersandsurfacesstrasbourgfrancejune141999 |