Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces: Strasbourg, France, June 1 - 4, 1999
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam u.a.
Elsevier
2000
|
| Schriftenreihe: | Thin solid films
364,1/2 |
| Schlagworte: | |
| Beschreibung: | Einzelaufn. eines Zeitschr.-Heftes |
| Beschreibung: | VII, 305 S. graph. Darst. |
Internformat
MARC
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| 111 | 2 | |a Symposium Optical Characterization of Semiconductor Layers and Surfaces |d 1999 |c Straßburg |j Verfasser |0 (DE-588)3044736-7 |4 aut | |
| 245 | 1 | 0 | |a Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces |b Strasbourg, France, June 1 - 4, 1999 |c guest eds.: O. D. Hunderi ... |
| 264 | 1 | |a Amsterdam u.a. |b Elsevier |c 2000 | |
| 300 | |a VII, 305 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Thin solid films |v 364,1/2 | |
| 500 | |a Einzelaufn. eines Zeitschr.-Heftes | ||
| 650 | 4 | |a Semiconductors |x Testing |x Optical methods |v Congresses | |
| 650 | 0 | 7 | |a Halbleiterschicht |0 (DE-588)4158812-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Optische Spektroskopie |0 (DE-588)4043680-9 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1999 |z Straßburg |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiterschicht |0 (DE-588)4158812-5 |D s |
| 689 | 0 | 1 | |a Optische Spektroskopie |0 (DE-588)4043680-9 |D s |
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| 700 | 1 | |a Hunderi, Ola D. |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008944112 | ||
Datensatz im Suchindex
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| author_corporate | Symposium Optical Characterization of Semiconductor Layers and Surfaces Straßburg |
| author_corporate_role | aut |
| author_facet | Symposium Optical Characterization of Semiconductor Layers and Surfaces Straßburg |
| author_sort | Symposium Optical Characterization of Semiconductor Layers and Surfaces Straßburg |
| building | Verbundindex |
| bvnumber | BV013127486 |
| ctrlnum | (OCoLC)43926905 (DE-599)BVBBV013127486 |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift 1999 Straßburg gnd-content |
| genre_facet | Konferenzschrift 1999 Straßburg |
| id | DE-604.BV013127486 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:39:32Z |
| institution | BVB |
| institution_GND | (DE-588)3044736-7 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008944112 |
| oclc_num | 43926905 |
| open_access_boolean | |
| owner | DE-384 DE-706 |
| owner_facet | DE-384 DE-706 |
| physical | VII, 305 S. graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Thin solid films |
| spelling | Symposium Optical Characterization of Semiconductor Layers and Surfaces 1999 Straßburg Verfasser (DE-588)3044736-7 aut Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 guest eds.: O. D. Hunderi ... Amsterdam u.a. Elsevier 2000 VII, 305 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Thin solid films 364,1/2 Einzelaufn. eines Zeitschr.-Heftes Semiconductors Testing Optical methods Congresses Halbleiterschicht (DE-588)4158812-5 gnd rswk-swf Optische Spektroskopie (DE-588)4043680-9 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Straßburg gnd-content Halbleiterschicht (DE-588)4158812-5 s Optische Spektroskopie (DE-588)4043680-9 s DE-604 Hunderi, Ola D. Sonstige oth |
| spellingShingle | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 Semiconductors Testing Optical methods Congresses Halbleiterschicht (DE-588)4158812-5 gnd Optische Spektroskopie (DE-588)4043680-9 gnd |
| subject_GND | (DE-588)4158812-5 (DE-588)4043680-9 (DE-588)1071861417 |
| title | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 |
| title_auth | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 |
| title_exact_search | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 |
| title_full | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 guest eds.: O. D. Hunderi ... |
| title_fullStr | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 guest eds.: O. D. Hunderi ... |
| title_full_unstemmed | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces Strasbourg, France, June 1 - 4, 1999 guest eds.: O. D. Hunderi ... |
| title_short | Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces |
| title_sort | papers presented at the 1999 e mrs spring conference symposium p optical characterization of semiconductor layers and surfaces strasbourg france june 1 4 1999 |
| title_sub | Strasbourg, France, June 1 - 4, 1999 |
| topic | Semiconductors Testing Optical methods Congresses Halbleiterschicht (DE-588)4158812-5 gnd Optische Spektroskopie (DE-588)4043680-9 gnd |
| topic_facet | Semiconductors Testing Optical methods Congresses Halbleiterschicht Optische Spektroskopie Konferenzschrift 1999 Straßburg |
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