APA (7th ed.) Citation

Symposium Optical Characterization of Semiconductor Layers and Surfaces Straßburg. (2000). Papers presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces: Strasbourg, France, June 1 - 4, 1999. Elsevier.

Chicago Style (17th ed.) Citation

Symposium Optical Characterization of Semiconductor Layers and Surfaces Straßburg. Papers Presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces: Strasbourg, France, June 1 - 4, 1999. Amsterdam u.a: Elsevier, 2000.

MLA (9th ed.) Citation

Symposium Optical Characterization of Semiconductor Layers and Surfaces Straßburg. Papers Presented at the 1999 E-MRS Spring Conference, Symposium P: Optical Characterization of Semiconductor Layers and Surfaces: Strasbourg, France, June 1 - 4, 1999. Elsevier, 2000.