Defects - recognition, imaging and physics in semiconductors 1999: proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999
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| Format: | Conference Proceeding Book |
|---|---|
| Language: | English |
| Published: |
Amsterdam [u.a.]
Elsevier
2000
|
| Series: | Journal of crystal growth
210,1/3 |
| Subjects: | |
| Item Description: | Einzelaufnahme eines Zeitschr.-H. |
| Physical Description: | XII, 420 S. Ill., graph. Darst. |
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| indexdate | 2024-07-09T18:38:07Z |
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| physical | XII, 420 S. Ill., graph. Darst. |
| publishDate | 2000 |
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| series2 | Journal of crystal growth |
| spelling | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 ed. by: T. Ogawa ... Amsterdam [u.a.] Elsevier 2000 XII, 420 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Journal of crystal growth 210,1/3 Einzelaufnahme eines Zeitschr.-H. Semiconducteurs - Défauts - Congrès ram Semiconducteurs - Défauts - Microscopie - Congrès ram Spectroscopie - Congrès ram Image processing Congresses Semiconductors Defects Congresses (DE-588)1071861417 Konferenzschrift gnd-content Ogawa, Tomoya Sonstige oth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors 8 1999 Narita Sonstige (DE-588)1800852-5 oth |
| spellingShingle | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 Semiconducteurs - Défauts - Congrès ram Semiconducteurs - Défauts - Microscopie - Congrès ram Spectroscopie - Congrès ram Image processing Congresses Semiconductors Defects Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 |
| title_auth | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 |
| title_exact_search | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 |
| title_full | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 ed. by: T. Ogawa ... |
| title_fullStr | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 ed. by: T. Ogawa ... |
| title_full_unstemmed | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 ed. by: T. Ogawa ... |
| title_short | Defects - recognition, imaging and physics in semiconductors 1999 |
| title_sort | defects recognition imaging and physics in semiconductors 1999 proceedings of the eighth international conference on defects recognition imaging and physics in semiconductors narita japan september 15 18 1999 |
| title_sub | proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 |
| topic | Semiconducteurs - Défauts - Congrès ram Semiconducteurs - Défauts - Microscopie - Congrès ram Spectroscopie - Congrès ram Image processing Congresses Semiconductors Defects Congresses |
| topic_facet | Semiconducteurs - Défauts - Congrès Semiconducteurs - Défauts - Microscopie - Congrès Spectroscopie - Congrès Image processing Congresses Semiconductors Defects Congresses Konferenzschrift |
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