Defects - recognition, imaging and physics in semiconductors 1999: proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2000
|
| Schriftenreihe: | Journal of crystal growth
210,1/3 |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zeitschr.-H. |
| Beschreibung: | XII, 420 S. Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV013041565 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 000310s2000 ad|| |||| 10||| eng d | ||
| 035 | |a (OCoLC)43669421 | ||
| 035 | |a (DE-599)BVBBV013041565 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 |a DE-706 | ||
| 050 | 0 | |a QD921 | |
| 245 | 1 | 0 | |a Defects - recognition, imaging and physics in semiconductors 1999 |b proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 |c ed. by: T. Ogawa ... |
| 264 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 2000 | |
| 300 | |a XII, 420 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Journal of crystal growth |v 210,1/3 | |
| 500 | |a Einzelaufnahme eines Zeitschr.-H. | ||
| 650 | 7 | |a Semiconducteurs - Défauts - Congrès |2 ram | |
| 650 | 7 | |a Semiconducteurs - Défauts - Microscopie - Congrès |2 ram | |
| 650 | 7 | |a Spectroscopie - Congrès |2 ram | |
| 650 | 4 | |a Image processing |v Congresses | |
| 650 | 4 | |a Semiconductors |x Defects |v Congresses | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Ogawa, Tomoya |e Sonstige |4 oth | |
| 711 | 2 | |a International Conference on Defects - Recognition, Imaging and Physics in Semiconductors |n 8 |d 1999 |c Narita |j Sonstige |0 (DE-588)1800852-5 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008884556 | ||
Datensatz im Suchindex
| _version_ | 1804127737800032256 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV013041565 |
| callnumber-first | Q - Science |
| callnumber-label | QD921 |
| callnumber-raw | QD921 |
| callnumber-search | QD921 |
| callnumber-sort | QD 3921 |
| callnumber-subject | QD - Chemistry |
| ctrlnum | (OCoLC)43669421 (DE-599)BVBBV013041565 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01489nam a2200361 cb4500</leader><controlfield tag="001">BV013041565</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000310s2000 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)43669421</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV013041565</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QD921</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Defects - recognition, imaging and physics in semiconductors 1999</subfield><subfield code="b">proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999</subfield><subfield code="c">ed. by: T. Ogawa ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam [u.a.]</subfield><subfield code="b">Elsevier</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 420 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Journal of crystal growth</subfield><subfield code="v">210,1/3</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zeitschr.-H.</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconducteurs - Défauts - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconducteurs - Défauts - Microscopie - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Spectroscopie - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Image processing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ogawa, Tomoya</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Conference on Defects - Recognition, Imaging and Physics in Semiconductors</subfield><subfield code="n">8</subfield><subfield code="d">1999</subfield><subfield code="c">Narita</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)1800852-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008884556</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV013041565 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:38:07Z |
| institution | BVB |
| institution_GND | (DE-588)1800852-5 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008884556 |
| oclc_num | 43669421 |
| open_access_boolean | |
| owner | DE-703 DE-706 |
| owner_facet | DE-703 DE-706 |
| physical | XII, 420 S. Ill., graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Journal of crystal growth |
| spelling | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 ed. by: T. Ogawa ... Amsterdam [u.a.] Elsevier 2000 XII, 420 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Journal of crystal growth 210,1/3 Einzelaufnahme eines Zeitschr.-H. Semiconducteurs - Défauts - Congrès ram Semiconducteurs - Défauts - Microscopie - Congrès ram Spectroscopie - Congrès ram Image processing Congresses Semiconductors Defects Congresses (DE-588)1071861417 Konferenzschrift gnd-content Ogawa, Tomoya Sonstige oth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors 8 1999 Narita Sonstige (DE-588)1800852-5 oth |
| spellingShingle | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 Semiconducteurs - Défauts - Congrès ram Semiconducteurs - Défauts - Microscopie - Congrès ram Spectroscopie - Congrès ram Image processing Congresses Semiconductors Defects Congresses |
| subject_GND | (DE-588)1071861417 |
| title | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 |
| title_auth | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 |
| title_exact_search | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 |
| title_full | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 ed. by: T. Ogawa ... |
| title_fullStr | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 ed. by: T. Ogawa ... |
| title_full_unstemmed | Defects - recognition, imaging and physics in semiconductors 1999 proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 ed. by: T. Ogawa ... |
| title_short | Defects - recognition, imaging and physics in semiconductors 1999 |
| title_sort | defects recognition imaging and physics in semiconductors 1999 proceedings of the eighth international conference on defects recognition imaging and physics in semiconductors narita japan september 15 18 1999 |
| title_sub | proceedings of the eighth International Conference on Defects - Recognition, Imaging and Physics in Semiconductors, Narita, Japan, September 15 - 18, 1999 |
| topic | Semiconducteurs - Défauts - Congrès ram Semiconducteurs - Défauts - Microscopie - Congrès ram Spectroscopie - Congrès ram Image processing Congresses Semiconductors Defects Congresses |
| topic_facet | Semiconducteurs - Défauts - Congrès Semiconducteurs - Défauts - Microscopie - Congrès Spectroscopie - Congrès Image processing Congresses Semiconductors Defects Congresses Konferenzschrift |
| work_keys_str_mv | AT ogawatomoya defectsrecognitionimagingandphysicsinsemiconductors1999proceedingsoftheeighthinternationalconferenceondefectsrecognitionimagingandphysicsinsemiconductorsnaritajapanseptember15181999 AT internationalconferenceondefectsrecognitionimagingandphysicsinsemiconductorsnarita defectsrecognitionimagingandphysicsinsemiconductors1999proceedingsoftheeighthinternationalconferenceondefectsrecognitionimagingandphysicsinsemiconductorsnaritajapanseptember15181999 |