Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures: Seattle, USA, May 30 - June 1, 1999
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Bibliographic Details
Corporate Author: International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, Wash (Author)
Format: Conference Proceeding Book
Language:English
Published: Amsterdam [u.a.] Elsevier 2000
Series:Ultramicroscopy 82,1/4
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Item Description:Einzelaufnahme eines Zeitschr.-H.
Physical Description:XIII, 314 S. zahlr. Ill. u. graph. Darst.

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