Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures: Seattle, USA, May 30 - June 1, 1999
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Amsterdam [u.a.]
Elsevier
2000
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Schriftenreihe: | Ultramicroscopy
82,1/4 |
Schlagworte: | |
Beschreibung: | Einzelaufnahme eines Zeitschr.-H. |
Beschreibung: | XIII, 314 S. zahlr. Ill. u. graph. Darst. |
Internformat
MARC
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111 | 2 | |a International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures |n 1 |d 1999 |c Seattle, Wash. |j Verfasser |0 (DE-588)3045005-6 |4 aut | |
245 | 1 | 0 | |a Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures |b Seattle, USA, May 30 - June 1, 1999 |c SPM '99. Guest ed.: J. K. Heinrich Hörber |
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655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1999 |z Seattle Wash. |2 gnd-content | |
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Datensatz im Suchindex
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author_corporate | International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, Wash |
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author_facet | International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, Wash |
author_sort | International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, Wash |
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genre_facet | Konferenzschrift 1999 Seattle Wash. |
id | DE-604.BV013016947 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:37:45Z |
institution | BVB |
institution_GND | (DE-588)3045005-6 |
language | English |
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physical | XIII, 314 S. zahlr. Ill. u. graph. Darst. |
publishDate | 2000 |
publishDateSearch | 2000 |
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publisher | Elsevier |
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series2 | Ultramicroscopy |
spelling | International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures 1 1999 Seattle, Wash. Verfasser (DE-588)3045005-6 aut Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, USA, May 30 - June 1, 1999 SPM '99. Guest ed.: J. K. Heinrich Hörber SPM '99 Amsterdam [u.a.] Elsevier 2000 XIII, 314 S. zahlr. Ill. u. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Ultramicroscopy 82,1/4 Einzelaufnahme eines Zeitschr.-H. Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Nanostruktur (DE-588)4204530-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Seattle Wash. gnd-content Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Nanostruktur (DE-588)4204530-7 s Hörber, Johann Karl Heinrich Sonstige oth |
spellingShingle | Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, USA, May 30 - June 1, 1999 Rastersondenmikroskopie (DE-588)4330328-6 gnd Nanostruktur (DE-588)4204530-7 gnd |
subject_GND | (DE-588)4330328-6 (DE-588)4204530-7 (DE-588)1071861417 |
title | Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, USA, May 30 - June 1, 1999 |
title_alt | SPM '99 |
title_auth | Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, USA, May 30 - June 1, 1999 |
title_exact_search | Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, USA, May 30 - June 1, 1999 |
title_full | Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, USA, May 30 - June 1, 1999 SPM '99. Guest ed.: J. K. Heinrich Hörber |
title_fullStr | Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, USA, May 30 - June 1, 1999 SPM '99. Guest ed.: J. K. Heinrich Hörber |
title_full_unstemmed | Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, USA, May 30 - June 1, 1999 SPM '99. Guest ed.: J. K. Heinrich Hörber |
title_short | Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures |
title_sort | proceedings of the international conference on scanning probe microscopy cantilever sensors and nanostructures seattle usa may 30 june 1 1999 |
title_sub | Seattle, USA, May 30 - June 1, 1999 |
topic | Rastersondenmikroskopie (DE-588)4330328-6 gnd Nanostruktur (DE-588)4204530-7 gnd |
topic_facet | Rastersondenmikroskopie Nanostruktur Konferenzschrift 1999 Seattle Wash. |
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