International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, Wash. (2000). Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures: Seattle, USA, May 30 - June 1, 1999. Elsevier.
Chicago Style (17th ed.) CitationInternational Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, Wash. Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures: Seattle, USA, May 30 - June 1, 1999. Amsterdam [u.a.]: Elsevier, 2000.
MLA (9th ed.) CitationInternational Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures Seattle, Wash. Proceedings of the International Conference on Scanning Probe Microscopy, Cantilever Sensors and Nanostructures: Seattle, USA, May 30 - June 1, 1999. Elsevier, 2000.