Electron microscopy and analysis 1999: proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Bristol [u.a.]
IOP Publ.
1999
|
| Schriftenreihe: | Institute of Physics <London>: Institute of Physics conference series
161 |
| Schlagworte: | |
| Beschreibung: | XVII, 632 S. Ill., graph. Darst. |
| ISBN: | 0750305770 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV012989915 | ||
| 003 | DE-604 | ||
| 005 | 20010823 | ||
| 007 | t | ||
| 008 | 000215s1999 ad|| |||| 10||| eng d | ||
| 020 | |a 0750305770 |9 0-7503-0577-0 | ||
| 035 | |a (OCoLC)42888129 | ||
| 035 | |a (DE-599)BVBBV012989915 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-355 |a DE-703 | ||
| 050 | 0 | |a QH212.E4 | |
| 082 | 0 | |a 502/.8/25 |2 21 | |
| 084 | |a UH 6300 |0 (DE-625)159498: |2 rvk | ||
| 245 | 1 | 0 | |a Electron microscopy and analysis 1999 |b proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 |c ed. by C. J. Kiely |
| 264 | 1 | |a Bristol [u.a.] |b IOP Publ. |c 1999 | |
| 300 | |a XVII, 632 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Institute of Physics <London>: Institute of Physics conference series |v 161 | |
| 650 | 7 | |a Microscopie électronique - Congrès |2 ram | |
| 650 | 4 | |a Electron microscopy |v Congresses | |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1999 |z Sheffield |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Kiely, Chris J. |e Sonstige |4 oth | |
| 830 | 0 | |a Institute of Physics <London>: Institute of Physics conference series |v 161 |w (DE-604)BV002806317 |9 161 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008850501 | ||
Datensatz im Suchindex
| _version_ | 1804127687743111168 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV012989915 |
| callnumber-first | Q - Science |
| callnumber-label | QH212 |
| callnumber-raw | QH212.E4 |
| callnumber-search | QH212.E4 |
| callnumber-sort | QH 3212 E4 |
| callnumber-subject | QH - Natural History and Biology |
| classification_rvk | UH 6300 |
| ctrlnum | (OCoLC)42888129 (DE-599)BVBBV012989915 |
| dewey-full | 502/.8/25 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01517nam a2200385 cb4500</leader><controlfield tag="001">BV012989915</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20010823 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000215s1999 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0750305770</subfield><subfield code="9">0-7503-0577-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)42888129</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV012989915</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QH212.E4</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6300</subfield><subfield code="0">(DE-625)159498:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Electron microscopy and analysis 1999</subfield><subfield code="b">proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999</subfield><subfield code="c">ed. by C. J. Kiely</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Bristol [u.a.]</subfield><subfield code="b">IOP Publ.</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVII, 632 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Institute of Physics <London>: Institute of Physics conference series</subfield><subfield code="v">161</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Microscopie électronique - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1999</subfield><subfield code="z">Sheffield</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kiely, Chris J.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Institute of Physics <London>: Institute of Physics conference series</subfield><subfield code="v">161</subfield><subfield code="w">(DE-604)BV002806317</subfield><subfield code="9">161</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008850501</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1999 Sheffield gnd-content |
| genre_facet | Konferenzschrift 1999 Sheffield |
| id | DE-604.BV012989915 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:37:19Z |
| institution | BVB |
| isbn | 0750305770 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008850501 |
| oclc_num | 42888129 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-703 |
| owner_facet | DE-355 DE-BY-UBR DE-703 |
| physical | XVII, 632 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | IOP Publ. |
| record_format | marc |
| series | Institute of Physics <London>: Institute of Physics conference series |
| series2 | Institute of Physics <London>: Institute of Physics conference series |
| spelling | Electron microscopy and analysis 1999 proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 ed. by C. J. Kiely Bristol [u.a.] IOP Publ. 1999 XVII, 632 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Institute of Physics <London>: Institute of Physics conference series 161 Microscopie électronique - Congrès ram Electron microscopy Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1999 Sheffield gnd-content Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Kiely, Chris J. Sonstige oth Institute of Physics <London>: Institute of Physics conference series 161 (DE-604)BV002806317 161 |
| spellingShingle | Electron microscopy and analysis 1999 proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 Institute of Physics <London>: Institute of Physics conference series Microscopie électronique - Congrès ram Electron microscopy Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)1071861417 |
| title | Electron microscopy and analysis 1999 proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 |
| title_auth | Electron microscopy and analysis 1999 proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 |
| title_exact_search | Electron microscopy and analysis 1999 proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 |
| title_full | Electron microscopy and analysis 1999 proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 ed. by C. J. Kiely |
| title_fullStr | Electron microscopy and analysis 1999 proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 ed. by C. J. Kiely |
| title_full_unstemmed | Electron microscopy and analysis 1999 proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 ed. by C. J. Kiely |
| title_short | Electron microscopy and analysis 1999 |
| title_sort | electron microscopy and analysis 1999 proceedings of the institute of physics electron microscopy and analysis group conference university of sheffield 24 27 august 1999 |
| title_sub | proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24 - 27 August 1999 |
| topic | Microscopie électronique - Congrès ram Electron microscopy Congresses Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Microscopie électronique - Congrès Electron microscopy Congresses Elektronenmikroskopie Konferenzschrift 1999 Sheffield |
| volume_link | (DE-604)BV002806317 |
| work_keys_str_mv | AT kielychrisj electronmicroscopyandanalysis1999proceedingsoftheinstituteofphysicselectronmicroscopyandanalysisgroupconferenceuniversityofsheffield2427august1999 |