Advances in scanning probe microscopy:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Berlin ; Heidelberg ; New York ; Barcelona ; Budapest ; Hong Kon
Springer
2000
|
| Schriftenreihe: | Advances in materials research
2 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIV, 341 S. zahlr. Ill., graph. Darst. |
| ISBN: | 3540667180 |
Internformat
MARC
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| 245 | 1 | 0 | |a Advances in scanning probe microscopy |c T. Sakurai ... (ed.) |
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| 300 | |a XIV, 341 S. |b zahlr. Ill., graph. Darst. | ||
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| 490 | 1 | |a Advances in materials research |v 2 | |
| 650 | 4 | |a Scanning probe microscopy | |
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Datensatz im Suchindex
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|---|---|
| adam_text | *. SAKURAI Y. WATANABE (EDS.) ADVANCES IN SCANNING PROBE MICROSCOPY WITH
241 FIGURES SPRINGER CONTENTS 1 THEORY OF SCANNING PROBE MICROSCOPY
NARUO SASAKI AND MASARU TSUKADA 1 1.1 INTRODUCTION 1 1.2 SCANNING
TUNNELING MICROSCOPY 3 1.3 FRICTIONAL FORCE MICROSCOPY 9 1.4
DYNAMIC-MODE ATOMIC FORCE MICROSCOPY 21 1.5 NON-CONTACT MODE ATOMIC
FORCE MICROSCOPY 31 1.6 CONCLUSION 38 REFERENCES 40 2 THE THEORETICAL
BASIS OF SCANNING TUNNELING MICROSCOPY FOR SEMICONDUCTORS
FIRST-PRINCIPLES ELECTRONIC STRUCTURE THEORY FOR SEMICONDUCTOR SURFACES
TAKAHISA OHNO 43 2.1 INTRODUCTION 43 2.2 COMPUTATIONAL METHODS 44 2.3
SURFACE STRUCTURES 47 2.4 SURFACE DYNAMICS 53 REFERENCES 63 3 ATOMIC
STRUCTURE OF 6H-SIC (0001) AND (0001) L. LI AND T. SAKURAI 65 3.1
INTRODUCTION 65 3.2 SURFACE PREPARATION 67 3.3 SURFACE STRUCTURE OF
6H-SIC (0001) AND (0001) 68 3.4 SURFACE PHONONS OF 6H-SIC (0001) 82 3.5
EFFECT OF SURFACE POLARITY FOR GALLIUM ADSORPTION ONTO 6H-SIC SURFACES
84 3.6 CONCLUSIONS 88 REFERENCES 89 X CONTENTS 4 APPLICATION OF ATOM
MANIPULATION FOR FABRICATING NANOSCALE AND ATOMIC-SCALE STRUCTURES ON SI
SURFACES *. HASHIZUME, S. HEIKE, *. HITOSUGI AND K. KITAZAWA 91 4.1
INTRODUCTION 91 4.2 EXPERIMENTAL ASPECTS 93 4.3 PROPERTY CHANGES IN THE
SI(LLL)-7X7 SURFACE 94 4.4 PROPERTIES OF DANGLING BONDS ON THE
SI(100)-2XL-H SURFACE 99 4.5 INTERACTION OF ADSORBATES WITH DANGLING
BONDS ON SI(100)-2XL-H SURFACES AND ATOMIC WIRE FABRICATION 106 4.6
CONCLUSION ILL REFERENCES ILL 5 THEORETICAL INSIGHTS INTO FUUERENES
ADSORBED ON SURFACES: COMPARISON WITH STM STUDIES KAORU OHNO AND
YOSHIYUKI KAWAZOE 113 5.1 INTRODUCTION 113 5.2 FULLERENE RESEARCH
BACKGROUND 115 5.3 UNIVERSAL FEATURES OF *** AND C70 STM IMAGES 117 5.4
DIPOLE FIELD CAUSED BY CHARGE TRANSFER 124 5.5 PHOTO-INDUCED EXCITED
STATES 129 5.6 CONCLUSION 135 APPENDIX: ALL-ELECTRON MIXED BASIS
APPROACH 136 REFERENCES 139 6 APPARENT BARRIER HEIGHT AND BARRIER-HEIGHT
IMAGING OF SURFACES AKIRA SAKAI 143 6.1 INTRODUCTION 143 6.2 PROPERTIES
OF BARRIER HEIGHT 145 6.3 MEASUREMENTS OF BARRIER HEIGHT 153 6.4
BARRIER-HEIGHT IMAGING 155 6.5 APPLICATIONS OF BH IMAGING 158 REFERENCES
163 7 MESOSCOPIC WORK FUNCTION MEASUREMENT BY SCANNING TUNNELING
MICROSCOPY Y. HASEGAWA, J.F. JIA, T. SAKURAI, Z.Q. LI, K. OHNO AND Y.
KAWAZOE . 167 7.1 INTRODUCTION 167 7.2 WORK FUNCTION 168 7.3
EXPERIMENTAL TECHNIQUES 174 7.4 RESULTS 179 7.5 CONCLUSION 190
REFERENCES 190 CONTENTS XI 8 SCANNING TUNNELING MICROSCOPY OF III-V
COMPOUND SEMICONDUCTOR (001) SURFACES QI-KUN XUE, T. HASHIZUME AND T.
SAKURAI 193 8.1 INTRODUCTION 193 8.2 SEMICONDUCTOR SURFACE
RECONSTRUCTION 195 8.3 GAAS(OOL) AS-RICH SURFACE 200 8.4 GAAS(OOL)
GA-RICH SURFACE 227 8.5 OTHER ARSENIDE (001) SURFACES 243 8.6 PHOSPHIDE,
ANTIMONIDE AND NITRIDE (001) SURFACES 261 8.7 CONCLUSIONS 273 REFERENCES
276 9 ADSORPTION OF FULLERENES ON SEMICONDUCTOR AND METAL SURFACES
INVESTIGATED BY FIELD-ION SCANNING TUNNELING MICROSCOPY T. HASHIZUME AND
T. SAKURAI 283 9.1 INTRODUCTION 283 9.2 EXPERIMENT 285 9.3 RESULTS AND
DISCUSSIONS ON SEMICONDUCTOR SUBSTRATES 288 9.4 RESULTS AND DISCUSSIONS
ON METAL SUBSTRATES 313 9.5 CONCLUSIONS 332 REFERENCES 333 INDEX 339
|
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| illustrated | Illustrated |
| indexdate | 2024-07-09T18:37:08Z |
| institution | BVB |
| isbn | 3540667180 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008843228 |
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| physical | XIV, 341 S. zahlr. Ill., graph. Darst. |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Springer |
| record_format | marc |
| series | Advances in materials research |
| series2 | Advances in materials research |
| spelling | Advances in scanning probe microscopy T. Sakurai ... (ed.) Berlin ; Heidelberg ; New York ; Barcelona ; Budapest ; Hong Kon Springer 2000 XIV, 341 S. zahlr. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Advances in materials research 2 Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd rswk-swf Rastersondenmikroskopie (DE-588)4330328-6 s DE-604 Sakurai, Toshio Sonstige oth Advances in materials research 2 (DE-604)BV012271346 2 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008843228&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Advances in scanning probe microscopy Advances in materials research Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| subject_GND | (DE-588)4330328-6 |
| title | Advances in scanning probe microscopy |
| title_auth | Advances in scanning probe microscopy |
| title_exact_search | Advances in scanning probe microscopy |
| title_full | Advances in scanning probe microscopy T. Sakurai ... (ed.) |
| title_fullStr | Advances in scanning probe microscopy T. Sakurai ... (ed.) |
| title_full_unstemmed | Advances in scanning probe microscopy T. Sakurai ... (ed.) |
| title_short | Advances in scanning probe microscopy |
| title_sort | advances in scanning probe microscopy |
| topic | Scanning probe microscopy Rastersondenmikroskopie (DE-588)4330328-6 gnd |
| topic_facet | Scanning probe microscopy Rastersondenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008843228&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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