Design-for-test for digital IC's and embedded core systems:
Gespeichert in:
1. Verfasser: | |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Upper Saddle River, NJ
Prentice Hall
2000
|
Ausgabe: | Repr. with corrections |
Schlagworte: | |
Beschreibung: | 349 S. graph. Darst. CD-ROM (12 cm) |
ISBN: | 0130848271 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV012931598 | ||
003 | DE-604 | ||
005 | 20000519 | ||
007 | t | ||
008 | 000111s2000 d||| |||| 00||| eng d | ||
020 | |a 0130848271 |9 0-13-084827-1 | ||
035 | |a (OCoLC)46316760 | ||
035 | |a (DE-599)BVBBV012931598 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-92 |a DE-Aug4 | ||
050 | 0 | |a TK7874.65 | |
082 | 0 | |a 621.3815 |b C884d, 2000 | |
084 | |a ZN 4900 |0 (DE-625)157417: |2 rvk | ||
100 | 1 | |a Crouch, Alfred L. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Design-for-test for digital IC's and embedded core systems |c Alfred L. Crouch |
250 | |a Repr. with corrections | ||
264 | 1 | |a Upper Saddle River, NJ |b Prentice Hall |c 2000 | |
300 | |a 349 S. |b graph. Darst. |e CD-ROM (12 cm) | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Automatic test equipment | |
650 | 4 | |a Digital integrated circuits |x Design and construction | |
650 | 4 | |a Electronic circuit design | |
650 | 4 | |a Embedded computer systems |x Design and construction | |
650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Prüftechnik |0 (DE-588)4047610-8 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Schaltungsentwurf |0 (DE-588)4179389-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Eingebettetes System |0 (DE-588)4396978-1 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Eingebettetes System |0 (DE-588)4396978-1 |D s |
689 | 0 | 1 | |a Schaltungsentwurf |0 (DE-588)4179389-4 |D s |
689 | 0 | 2 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 1 | 1 | |a Schaltungsentwurf |0 (DE-588)4179389-4 |D s |
689 | 1 | 2 | |a Prüftechnik |0 (DE-588)4047610-8 |D s |
689 | 1 | |5 DE-604 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-008805239 |
Datensatz im Suchindex
_version_ | 1804127622859325440 |
---|---|
any_adam_object | |
author | Crouch, Alfred L. |
author_facet | Crouch, Alfred L. |
author_role | aut |
author_sort | Crouch, Alfred L. |
author_variant | a l c al alc |
building | Verbundindex |
bvnumber | BV012931598 |
callnumber-first | T - Technology |
callnumber-label | TK7874 |
callnumber-raw | TK7874.65 |
callnumber-search | TK7874.65 |
callnumber-sort | TK 47874.65 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | ZN 4900 |
ctrlnum | (OCoLC)46316760 (DE-599)BVBBV012931598 |
dewey-full | 621.3815 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3815 |
dewey-search | 621.3815 |
dewey-sort | 3621.3815 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
edition | Repr. with corrections |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01786nam a2200493 c 4500</leader><controlfield tag="001">BV012931598</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20000519 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">000111s2000 d||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0130848271</subfield><subfield code="9">0-13-084827-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)46316760</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV012931598</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-92</subfield><subfield code="a">DE-Aug4</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874.65</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="b">C884d, 2000</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4900</subfield><subfield code="0">(DE-625)157417:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Crouch, Alfred L.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Design-for-test for digital IC's and embedded core systems</subfield><subfield code="c">Alfred L. Crouch</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Repr. with corrections</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Upper Saddle River, NJ</subfield><subfield code="b">Prentice Hall</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">349 S.</subfield><subfield code="b">graph. Darst.</subfield><subfield code="e">CD-ROM (12 cm)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Automatic test equipment</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Digital integrated circuits</subfield><subfield code="x">Design and construction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuit design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Embedded computer systems</subfield><subfield code="x">Design and construction</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Schaltungsentwurf</subfield><subfield code="0">(DE-588)4179389-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Eingebettetes System</subfield><subfield code="0">(DE-588)4396978-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Eingebettetes System</subfield><subfield code="0">(DE-588)4396978-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Schaltungsentwurf</subfield><subfield code="0">(DE-588)4179389-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Integrierte Schaltung</subfield><subfield code="0">(DE-588)4027242-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Schaltungsentwurf</subfield><subfield code="0">(DE-588)4179389-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">Prüftechnik</subfield><subfield code="0">(DE-588)4047610-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008805239</subfield></datafield></record></collection> |
id | DE-604.BV012931598 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:36:17Z |
institution | BVB |
isbn | 0130848271 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008805239 |
oclc_num | 46316760 |
open_access_boolean | |
owner | DE-92 DE-Aug4 |
owner_facet | DE-92 DE-Aug4 |
physical | 349 S. graph. Darst. CD-ROM (12 cm) |
publishDate | 2000 |
publishDateSearch | 2000 |
publishDateSort | 2000 |
publisher | Prentice Hall |
record_format | marc |
spelling | Crouch, Alfred L. Verfasser aut Design-for-test for digital IC's and embedded core systems Alfred L. Crouch Repr. with corrections Upper Saddle River, NJ Prentice Hall 2000 349 S. graph. Darst. CD-ROM (12 cm) txt rdacontent n rdamedia nc rdacarrier Automatic test equipment Digital integrated circuits Design and construction Electronic circuit design Embedded computer systems Design and construction Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Schaltungsentwurf (DE-588)4179389-4 gnd rswk-swf Eingebettetes System (DE-588)4396978-1 gnd rswk-swf Eingebettetes System (DE-588)4396978-1 s Schaltungsentwurf (DE-588)4179389-4 s Prüftechnik (DE-588)4047610-8 s DE-604 Integrierte Schaltung (DE-588)4027242-4 s |
spellingShingle | Crouch, Alfred L. Design-for-test for digital IC's and embedded core systems Automatic test equipment Digital integrated circuits Design and construction Electronic circuit design Embedded computer systems Design and construction Integrierte Schaltung (DE-588)4027242-4 gnd Prüftechnik (DE-588)4047610-8 gnd Schaltungsentwurf (DE-588)4179389-4 gnd Eingebettetes System (DE-588)4396978-1 gnd |
subject_GND | (DE-588)4027242-4 (DE-588)4047610-8 (DE-588)4179389-4 (DE-588)4396978-1 |
title | Design-for-test for digital IC's and embedded core systems |
title_auth | Design-for-test for digital IC's and embedded core systems |
title_exact_search | Design-for-test for digital IC's and embedded core systems |
title_full | Design-for-test for digital IC's and embedded core systems Alfred L. Crouch |
title_fullStr | Design-for-test for digital IC's and embedded core systems Alfred L. Crouch |
title_full_unstemmed | Design-for-test for digital IC's and embedded core systems Alfred L. Crouch |
title_short | Design-for-test for digital IC's and embedded core systems |
title_sort | design for test for digital ic s and embedded core systems |
topic | Automatic test equipment Digital integrated circuits Design and construction Electronic circuit design Embedded computer systems Design and construction Integrierte Schaltung (DE-588)4027242-4 gnd Prüftechnik (DE-588)4047610-8 gnd Schaltungsentwurf (DE-588)4179389-4 gnd Eingebettetes System (DE-588)4396978-1 gnd |
topic_facet | Automatic test equipment Digital integrated circuits Design and construction Electronic circuit design Embedded computer systems Design and construction Integrierte Schaltung Prüftechnik Schaltungsentwurf Eingebettetes System |
work_keys_str_mv | AT crouchalfredl designfortestfordigitalicsandembeddedcoresystems |