Optoelektronisches Verhalten von Dünnschichtbauelementen aus amorphem und mikrokristallinem Silizium:
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Bibliographic Details
Main Author: Zimmer, Jürgen (Author)
Format: Thesis Book
Language:German
Published: München Walter-Schottky-Inst. 1999
Edition:1. Aufl.
Series:Selected topics of semiconductor physics and technology 23
Subjects:
Online Access:Inhaltsverzeichnis
Physical Description:V, 171 S. Ill., graph. Darst.
ISBN:3932749235

There is no print copy available.

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