1998 IEEE International Reliability Physics Symposium proceedings: 36th annual ; Reno, Nevada, March 31, April 1,2, 1998
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Piscataway, NJ
1998
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| Schlagworte: | |
| Beschreibung: | VII, 421 S. Ill., graph. Darst. |
| ISBN: | 0780344006 0780344014 |
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| genre_facet | Konferenzschrift 1998 Reno Nev. |
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| indexdate | 2024-07-09T18:34:25Z |
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| isbn | 0780344006 0780344014 |
| language | English |
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| physical | VII, 421 S. Ill., graph. Darst. |
| publishDate | 1998 |
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| spelling | International Reliability Physics Symposium 36 1998 Reno, Nev. Verfasser (DE-588)5302943-4 aut 1998 IEEE International Reliability Physics Symposium proceedings 36th annual ; Reno, Nevada, March 31, April 1,2, 1998 Piscataway, NJ 1998 VII, 421 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1998 Reno Nev. gnd-content Elektronisches Bauelement (DE-588)4014360-0 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 International Reliability Physics Symposium 35 1997 Denver, Colo. Sonstige (DE-588)5266313-9 oth |
| spellingShingle | 1998 IEEE International Reliability Physics Symposium proceedings 36th annual ; Reno, Nevada, March 31, April 1,2, 1998 Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Elektronisches Bauelement (DE-588)4014360-0 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4014360-0 (DE-588)4059245-5 (DE-588)1071861417 |
| title | 1998 IEEE International Reliability Physics Symposium proceedings 36th annual ; Reno, Nevada, March 31, April 1,2, 1998 |
| title_auth | 1998 IEEE International Reliability Physics Symposium proceedings 36th annual ; Reno, Nevada, March 31, April 1,2, 1998 |
| title_exact_search | 1998 IEEE International Reliability Physics Symposium proceedings 36th annual ; Reno, Nevada, March 31, April 1,2, 1998 |
| title_full | 1998 IEEE International Reliability Physics Symposium proceedings 36th annual ; Reno, Nevada, March 31, April 1,2, 1998 |
| title_fullStr | 1998 IEEE International Reliability Physics Symposium proceedings 36th annual ; Reno, Nevada, March 31, April 1,2, 1998 |
| title_full_unstemmed | 1998 IEEE International Reliability Physics Symposium proceedings 36th annual ; Reno, Nevada, March 31, April 1,2, 1998 |
| title_short | 1998 IEEE International Reliability Physics Symposium proceedings |
| title_sort | 1998 ieee international reliability physics symposium proceedings 36th annual reno nevada march 31 april 1 2 1998 |
| title_sub | 36th annual ; Reno, Nevada, March 31, April 1,2, 1998 |
| topic | Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Elektronisches Bauelement (DE-588)4014360-0 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Electronic apparatus and appliances Reliability Congresses Electronic apparatus and appliances Testing Congresses Integrated circuits Reliability Congresses Integrated circuits Testing Congresses Elektronisches Bauelement Zuverlässigkeit Konferenzschrift 1998 Reno Nev. |
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