Optical measurement systems for industrial inspection: 16 - 17 June 1999, Munich, Germany
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Washington
SPIE, Internat. Soc. for Optical Engineering
1999
|
| Schriftenreihe: | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE
3824 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | IX, 394 S. Ill. |
| ISBN: | 0819433101 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV012817523 | ||
| 003 | DE-604 | ||
| 005 | 20020709 | ||
| 007 | t| | ||
| 008 | 991019s1999 xx a||| |||| 10||| eng d | ||
| 020 | |a 0819433101 |9 0-8194-3310-1 | ||
| 035 | |a (OCoLC)42747759 | ||
| 035 | |a (DE-599)BVBBV012817523 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-522 | ||
| 050 | 0 | |a TA1505 | |
| 050 | 0 | |a TS156.2 | |
| 082 | 0 | |a 670.42/5 |2 21 | |
| 245 | 1 | 0 | |a Optical measurement systems for industrial inspection |b 16 - 17 June 1999, Munich, Germany |c Małgorzata Kujawińska ... |
| 264 | 1 | |a Washington |b SPIE, Internat. Soc. for Optical Engineering |c 1999 | |
| 300 | |a IX, 394 S. |b Ill. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |v 3824 | |
| 650 | 4 | |a Engineering inspection |v Congresses | |
| 650 | 4 | |a Optical detectors |x Industrial applications |v Congresses | |
| 650 | 4 | |a Optical instruments |x Industrial applications |v Congresses | |
| 650 | 4 | |a Quality control |x Optical methods |v Congresses | |
| 650 | 0 | 7 | |a Optische Messtechnik |0 (DE-588)4172667-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Optische Messtechnik |0 (DE-588)4172667-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Kujawińska, Małgorzata |e Sonstige |4 oth | |
| 830 | 0 | |a Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |v 3824 |w (DE-604)BV000010887 |9 3824 | |
| 856 | 4 | 2 | |m GBV Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008718810&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-008718810 | |
Datensatz im Suchindex
| _version_ | 1820868390189793280 |
|---|---|
| adam_text |
PROCEEDINGS E I I N \ N T , L S E R I E S OPTICAL MEASUREMENT SYSTEMS
FOR INDUSTRIAL INSPECTION MATGORZATA KUJAWIRISKA WOLFGANG OSTEN
CHAIRSI'EDITORS 16-17 JUNE 1999 MUNICH, GERMANY SPONSORED BY
EOS*EUROPEAN OPTICAL SOCIETY SPIE*THE INTERNATIONAL SOCIETY FOR OPTICAL
ENGINEERING COMMISSION OF THE EUROPEAN COMMUNITIES, DIRECTORATE GENERAL
FOR SCIENCE, RESEARCH, AND DEVELOPMENT WLT*WISSENSCHAFTLICHE
GESELLSCHAFT LASERTECHNIK E.V. (GERMANY) PUBLISHED BY SPIE*THE
INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING VOLUME 3824 SPIE IS AN
INTERNATIONAL TECHNICAL SOCIETY DEDICATED TO ADVANCING ENGINEERING AND
SCIENTIFIC APPLICATIONS OF OPTICAL, PHOTONIC, IMAGING, ELECTRONIC, AND
OPTOELECTRONIC TECHNOLOGIES. CONTENTS VII CONFERENCE COMMITTEE IX
INTRODUCTION SESSION 1 NEW MEASUREMENT SYSTEMS AND PRINCIPLES 2 ACTIVE
VISION APPROACH FOR OPTIMIZING ILLUMINATION IN CRITICAL SURFACE
INSPECTION BY MACHINE VISION [3824-02 ] T. PFEIFER, L. WIEGERS,
TECHNISCHE UNIV. AACHEN (GERMANY) 8 ACTIVE APPROACH FOR HOLOGRAPHIC
NONDESTRUCTIVE TESTING OF SATELLITE FUEL TANKS [3824-03] T. MERZ, UNIV.
ERLANGEN-NUERNBERG (GERMANY); F. ELANDALOUSSI, BREMER INSTITUT FUER
ANGEWANDTE STRAHLTECHNIK (GERMANY); D. W. PAULUS, UNIV.
ERLANGEN-NUERNBERG (GERMANY); W. OSTEN, BREMER INSTITUT FUER ANGEWANDTE
STRAHLTECHNIK (GERMANY) 20 COMPACT OPTICAL SENSORS FOR MEASURING LINEAR
AND ANGULAR VELOCITIES [3824-04] B. ROSE, P. E. IBSEN, IBSEN MICRO
STRUCTURES A/S (DENMARK); S. G. HANSON, R. S. HANSEN, RIS0 NATIONAL LAB.
(DENMARK) 30 MINIATURIZATION OF SPECKLE INTERFEROMETRY FOR RAPID STRAIN
ANALYSIS [3824-05] R. WEGNER, A. ETTEMEYER, DR. ETTEMEYER GMBH & CO.
(GERMANY) 38 SHEAROGRAPHY FOR DETERMINATION OF 2D STRAIN DISTRIBUTIONS
[3824-07] R. KAESTLE, E. K. HACK, U. J. SENNHAUSER, SWISS FEDERAL LABS,
FOR MATERIALS TESTING AND RESEARCH 45 THEORETICAL MODELING OF THE LASER
FEEDBACK TECHNIQUE FOR LENGTH MEASUREMENT OF MOVING MATERIALS [3824-08]
T. ALLGEIER, H. HOEFLER, E. E. WAGNER, FRAUNHOFER INSTITUTE OF PHYSICAL
MEASUREMENT TECHNIQUES (GERMANY) 58 THREE-DIMENSIONAL PULSED ESPI
TECHNIQUE OF ANALYSIS OF DYNAMIC PROBLEMS [3824-20] Z. WANG, T. WALZ, H.
R. SCHUBACH, A. ETTEMEYER, DR. ETTEMEYER GMBH & CO. (GERMANY) 65
SIGNAL-TO-NOISE RATIO OF DIFFERENTIAL INTERFEROMETER AND REFERENCE BEAM
INTERFEROMETER: A COMPARATIVE STUDY [3824-21] V. ARANCHUK, SCIENTIFIC
CTR. FOR MACHINE MECHANICS PROBLEMS (BELARUS) SESSION 2 SYSTEMS FOR THE
ACQUISITION OF METROLOGICAL DATA 72 SHAPE MEASUREMENT BY
MULTIPLE-WAVELENGTH INTERFEROMETRY [3824-09] Y. SALVADE, R. DAENDLIKER,
UNIV. OF NEUCHAETEL (SWITZERLAND) 79 FLEXIBLE AUTOCALIBRATING FULL-BODY
3D MEASUREMENT SYSTEM USING DIGITAL LIGHT PROJECTION [3824-11] G. NOTNI,
W. SCHREIBER, M. HEINZE, G. NOTNI, FRAUNHOFER INSTITUTE FOR APPLIED
OPTICS AND PRECISION ENGINEERING (GERMANY) 89 NEW APPROACH: INTELLIGENT
DIGITIZATION WITH AUTOSCAN [3824-12] B. KAUPERT, A. BETSCHE, H.
STEINBICHLER, STEINBICHLER OPTOTECHNIK GMBH (GERMANY) 93
THREE-DIMENSIONAL MICROMEASUREMENTS ON SMOOTH AND ROUGH SURFACES WITH A
NEW CONFOCAL OPTICAL PROFILER [3824-1 3] R. ARTIGAS, A. PINTO, F.
LAGUARTA, UNIV. POLITECNICA DE CATALUNYA (SPAIN) 105 HIGH-SPEED OPTICAL
3D ROUGHNESS MEASUREMENTS [3824-14] R. WINDECKER, S. FRANZ, H. J.
TIZIANI, UNIV. STUTTGART (GERMANY) 11 5 COMPACT SYSTEM FOR MEASURING
ROTATIONAI SPEED IN TWO DIMENSIONS [3824-1 5] S. G. HANSON, R. S.
HANSEN, B. H. HANSEN, RISO NATIONAL LAB. (DENMARK) 124 DIGITAL
REFINEMENT OF INTERFEROGRAMS OBTAINED BY DOUBLE-PULSE INTERFEROMETRY AND
AUTOMATIC SIGN CORRECTION OF PHASE GRADIENTS AFTER FFT EVALUATION
[3824-1 6] W. STEINCHEN, P. MAECKEL, J. NICKEL, F. VOESSING, G. KUPFER,
UNIV. KASSEL (GERMANY) 135 OBJECT POSE MONITORING FOR MULTIFINGER
GRIPPERS BY LASER SCANNING [3824-1 8] T. FISCHER, H. WOERN, UNIV.
KARLSRUHE (GERMANY) 143 DETECTION OF HYDROGEN ISOTOPE ATOMS BY MASS
SPECTROMETRY COMBINED WITH RESONANT IONIZATION [3824-22] Y. OKADA, M.
YOROZU, A. ENDO, SUMITOMO HEAVY INDUSTRIES, LTD. (JAPAN) 149 MEASUREMENT
OF DEPTH PROFILE OF HYDROGEN ISOTOPE ATOM CONTAINED IN SOLID MATERIAL
USING RESONANT LASER ABLATION [3824-23] M. YOROZU, Y. OKADA, T. NAKAJYO,
A. ENDO, SUMITOMO HEAVY INDUSTRIES, LTD. (JAPAN) 1 55 TIME-RESOLVED
MEASUREMENTS OF THE SPECTRA OF A BROADBAND LASER USED AS LIGHT SOURCE
FOR THE COHERENCE RADAR [3824-24] K. MITTLER, D. LORENZ, R. MENZEL,
UNIV. OF POTSDAM (GERMANY) 1 62 METROLOGICAL FEATURES OF LASER
INTERFEROMETERS WITH FREQUENCY CONVERSION IN SUPPORTING CHANNEL
[3824-25] O. G. MOROZOV, G. I. IL'IN, Y. E. POL'SKII, TUPOLEV STATE
TECHNICAL UNIV. (RUSSIA) 1 69 ADAPTIVE OPTICAL 3D MEASUREMENT WITH
STRUCTURED LIGHT [3824-26] R. M. KOWARSCHIK, FRIEDRICH-SCHILLER-UNIV.
JENA (GERMANY); J. GERBER, G. NOTNI, W. SCHREIBER, P. KUEHMSTEDT,
FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING
(GERMANY) 1 79 LASER SYSTEM FOR WAVELENGTH OF LASER INTERFEROMETER
CALIBRATION [3824-28] J. PIENKOWSKI, J. RZEPKA, S. SAMBOR, H. PAWOLKA,
TECHNICAL UNIV. OF WROCFAW (POLAND) 187 NEW PARTICLE TRACKING
VELOCIMETRY [3824-29] A. BALDASSARRE, M. DE LUCIA, P. NESI, F. ROSSI,
UNIV. OF FLORENCE (ITALY) 199 OPTICA! SENSOR FOR MEASUREMENT OF ROLL +
PITCH + YAW ANGLES OVER LARGE DISTANCES WITH HIGH ACCURACY [3824-58] R.
TREICHEL, H. R. SESSELMANN, J. KRIEGER, DORNIER SATELLITENSYSTEME GMBH
(GERMANY) SESSION 3 SYSTEMS FOR NONDESTRUCTIVE EVALUATION AND INSPECTION
210 OPTICAL INSPECTION OF LARGE-SCALE TECHNICAL COMPONENTS [3824-30] W.
P. JUEPTNER, W. OSTEN, M. K. KALMS, BREMER INSTITUT FUER ANGEWANDTE
STRAHLTECHNIK (GERMANY) 21 7 TOWARD ROBUST AND DISTANT ESTIMATION OF THE
WEAR ON A TRACK VEHICLE'S WHEELS [3824-32] D. HOLM, G. STANKE,
GESELLSCHAFT ZUR FOERDERUNG ANGEWANDTER INFORMATIK E.V. (GERMANY) 222
ANALYSIS OF INTERFEROMETRIC FRINGE PATTERNS BY OPTICAL WAVELET TRANSFORM
[3824-33] S. KRUEGER, HUMBOLDT-UNIV. ZU BERLIN (GERMANY); L. BOUAMAMA,
UNIV. FERHAT ABBAS (ALGERIA); H. GRUBER, S. TEIWES, G. K. WERNICKE,
HUMBOLDT-UNIV. ZU BERLIN (GERMANY) 229 APPLICATIO N OF DIGITAL SPECKLE
PHOTOGRAPHY FOR LOCAL STRAIN ANALYSIS [3824-34] D. HOLSTEIN, C. THEILER,
H.-J. HARTMANN, W. P. JUEPTNER, BREMER INSTITUT FUER ANGEWANDTE
STRAHLTECHNIK (GERMANY) 237 DETERMINATION OF MECHANICAL JOINT PROPERTIES
BY AUTOMATED MOIRE INTERFEROMETRY [3824-35] M. KUJAWINSKA, L. A. SATBUT,
WARSAW UNIV. OF TECHNOLOGY (POLAND) 245 NONDESTRUCTIVE LARGE-AREA
COMPOSITE TESTING USING SHEAROGRAPHY [3824-36] R. KRUPKA, H. BURGGRAF,
D. RATHJEN, STN ATLAS ELEKTRONIK GMBH (GERMANY) 255 RAPID DEFECT
INSPECTION OF DISPLAY DEVICES WITH OPTICAL SPATIAL FILTERING [3824-37]
S.-W. KIM, D.-S. YOON, KOREA ADVANCED INSTITUTE OF SCIENCE AND
TECHNOLOGY 262 ESPI WITH HOLOGRAPHICALLY STORED WAVES AND OTHER
INNOVATIVE ESPI METHODS USED FOR REAL-TIME MONITORING OF DYNAMIC THERMAL
DEFORMATIONS IN A PRACTICAL INDUSTRIAL ENVIRONMENT [3824-49] V. PETROV,
B. LAU, FACHHOCHSCHULE ULM (GERMANY) 274 OPTICAL FREQUENCY DOMAIN
REFLECTOMETER FOR FIBER STRUCTURAL TESTING [3824-50] R. G. ZALYALOV,
TATARSTAN MINISTRY OF COMMUNICATIONS (RUSSIA); R. A. AKHTIAMOV, G. A.
MOROZOV, O. G. MOROZOV, Y. E. POL'SKII, TUPOLEV STATE TECHNICAL UNIV.
(RUSSIA) 280 NDT ON WIDE-SCALE AIRCRAFT STRUCTURES WITH DIGITAL SPECKLE
SHEAROGRAPHY [3824-52] M. K. KALMS, W. OSTEN, W. P. JUEPTNER, BREMER
INSTITUT FUER ANGEWANDTE STRAHLTECHNIK (GERMANY); W. BISLE, D. SCHERLING,
G. TOBER, DAIMLERCHRYSLER AEROSPACE AIRBUS GMBH (GERMANY) 287 PARTICIE
IMAGE VELOCIMETRY (PIV) AS A TOOL IN OPTIMIZATION OF FAN-BASED COOLING
SYSTEMS IN CARS [3824-53] H. ZAHN, A. SEYLER, H. HINRICHS, CARL VON
OSSIETZKY UNIV. OLDENBURG (GERMANY) 297 PROTOTYPE OF A FIBER OPTIC
SENSOR FOR ONLINE MEASUREMENT OF COATING THICKNESS [3824-54] G.
D'EMILIA, UNIV. OF L'AQUILA (ITALY) 305 DSPI APPLIED TO RUBBER
VISCOELASTIC BEHAVIOR AT LOW STRESSES [3824-55] I. ROUSSEV, A. CHOULEV,
P. 1. KOULEV, INSTITUTE OF MECHANICS AND BIOMECHANICS (BULGARIA) 313
ONE-POINT-OF-VIEW HIGH-PRECISION AND VERSATILE OPTICAL MEASUREMENT OF
DIFFERENT SIDES OF OBJECTS [3824-56] G. STANKE, D. HOLM, T. WOEHRLE,
GESELLSCHAFT ZUR FOERDERUNG ANGEWANDTER INFORMATIK E.V. (GERMANY) V
SESSION 4 INDUSTRIAL APPLICATIONS 318 APPLICATION OF OPTICAL
SPECTROSCOPY TO PAPER PRODUCTION [3824-38] C. M. NILSSON, J. CARLSSON,
HALMSTAD UNIV. (SWEDEN) AND LUND INSTITUTE OF TECHNOLOGY (SWEDEN); L.
MALMQVIST, W. PERSSON, LUND INSTITUTE OF TECHNOLOGY (SWEDEN) 326
AUTOMATIC SHEAROGRAPHY INSPECTION SYSTEMS FOR AIRCRAFT COMPONENTS IN
PRODUCTION [3824-39] O. ERNE, T. WALTZ, A. ETTEMEYER, DR. ETTEMEYER GMBH
& CO. (GERMANY) 329 SURFACE INSPECTION ON BODIES IN WHITE IN THE
AUTOMOTIVE INDUSTRY [3824-40] G. WAN, AUDI AG (GERMANY); E. H.
NOESEKABEL, STEINBICHLER OPTOTECHNIK GMBH (GERMANY) 334 WINGS: OPTICAL
MEASUREMENT AND INSPECTION SYSTEM FOR AIRCRAFT WIND TUNNEL MODEIS
[3824-41] A. ZILKER, DAIMLERCHRYSLER AG (GERMANY); D. WINTER,
GESELLSCHAFT FUER OPTISCHE MESSTECHNIK (GERMANY) 338 SHAPE MEASUREMENT IN
SHEET METAL FORMATION: REQUIREMENTS AND SOLUTIONS [3824-42] R. HOEFLING,
P. ASWENDT, R. NEUGEBAUER, FRAUNHOFER-INSTITUT FUER WERKZEUGMASCHINEN UND
UMFORMTECHNIK (GERMANY) 346 DETERMINATION OF TECHNOLOGICAL PARAMETERS IN
STRIP MINING BY TIME OF FLIGHT AND IMAGE PROCESSING [3824-43] F.
ELANDALOUSSI, B. MUELLER, W. OSTEN, BREMER INSTITUT FUER ANGEWANDTE
STRAHLTECHNIK (GERMANY) 353 REAL-TIME DEFECT DETECTION ON CLOTHS
[3824-44] A. BALDASSARRE, M. DE LUCIA, P. NESI, F. ROSSI, J. ZAMBERLAN,
UNIV. OF FLORENCE (ITALY) 365 HIGH-RESOLUTION LINEAR SENSOR SYSTEM FOR
SHEET METAL WIDTH MEASUREMENT [3824-45] S. HUSSMANN,
UNIV.-GESAMTHOCHSCHULE SIEGEN (GERMANY); W. KLEUVER, J. GROENEWELLER,
AICOSS GMBH (GERMANY) 373 LASER DIFFRACTION WIRE DIAMETER MEASUREMENTS:
CORRECTION OF DIFFRACTION MODEIS BY INTERFEROMETRIC CALIBRATION
[3824-46] J. C. MARTFNEZ-ANTOEN, I . SERROUKH, E. BERNABEU, UNIV.
COMPLUTENSE DE MADRID (SPAIN) 383 QUALITY MONITORING AND ASSURANCE FOR
LASER BEAM CUTTING USING A THERMOGRAPHIC PROCESS CONTROL [3824-47] H.
HAFERKAMP, M. GOEDE, A. VON BUSSE, LASER ZENTRUM HANNOVER E.V. (GERMANY)
393 AUTHOR INDEX |
| any_adam_object | 1 |
| building | Verbundindex |
| bvnumber | BV012817523 |
| callnumber-first | T - Technology |
| callnumber-label | TA1505 |
| callnumber-raw | TA1505 TS156.2 |
| callnumber-search | TA1505 TS156.2 |
| callnumber-sort | TA 41505 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | SS 1999 |
| ctrlnum | (OCoLC)42747759 (DE-599)BVBBV012817523 |
| dewey-full | 670.42/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 670 - Manufacturing |
| dewey-raw | 670.42/5 |
| dewey-search | 670.42/5 |
| dewey-sort | 3670.42 15 |
| dewey-tens | 670 - Manufacturing |
| discipline | Werkstoffwissenschaften / Fertigungstechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 cb4500</leader><controlfield tag="001">BV012817523</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020709</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">991019s1999 xx a||| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0819433101</subfield><subfield code="9">0-8194-3310-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)42747759</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV012817523</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-522</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TA1505</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TS156.2</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">670.42/5</subfield><subfield code="2">21</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Optical measurement systems for industrial inspection</subfield><subfield code="b">16 - 17 June 1999, Munich, Germany</subfield><subfield code="c">Małgorzata Kujawińska ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Washington</subfield><subfield code="b">SPIE, Internat. Soc. for Optical Engineering</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">IX, 394 S.</subfield><subfield code="b">Ill.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE</subfield><subfield code="v">3824</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering inspection</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical detectors</subfield><subfield code="x">Industrial applications</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical instruments</subfield><subfield code="x">Industrial applications</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Quality control</subfield><subfield code="x">Optical methods</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Optische Messtechnik</subfield><subfield code="0">(DE-588)4172667-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kujawińska, Małgorzata</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE</subfield><subfield code="v">3824</subfield><subfield code="w">(DE-604)BV000010887</subfield><subfield code="9">3824</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">GBV Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008718810&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008718810</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV012817523 |
| illustrated | Illustrated |
| indexdate | 2025-01-10T13:23:36Z |
| institution | BVB |
| isbn | 0819433101 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008718810 |
| oclc_num | 42747759 |
| open_access_boolean | |
| owner | DE-522 |
| owner_facet | DE-522 |
| physical | IX, 394 S. Ill. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | SPIE, Internat. Soc. for Optical Engineering |
| record_format | marc |
| series | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| series2 | Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE |
| spelling | Optical measurement systems for industrial inspection 16 - 17 June 1999, Munich, Germany Małgorzata Kujawińska ... Washington SPIE, Internat. Soc. for Optical Engineering 1999 IX, 394 S. Ill. txt rdacontent n rdamedia nc rdacarrier Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 3824 Engineering inspection Congresses Optical detectors Industrial applications Congresses Optical instruments Industrial applications Congresses Quality control Optical methods Congresses Optische Messtechnik (DE-588)4172667-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Optische Messtechnik (DE-588)4172667-4 s DE-604 Kujawińska, Małgorzata Sonstige oth Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 3824 (DE-604)BV000010887 3824 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008718810&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Optical measurement systems for industrial inspection 16 - 17 June 1999, Munich, Germany Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE Engineering inspection Congresses Optical detectors Industrial applications Congresses Optical instruments Industrial applications Congresses Quality control Optical methods Congresses Optische Messtechnik (DE-588)4172667-4 gnd |
| subject_GND | (DE-588)4172667-4 (DE-588)1071861417 |
| title | Optical measurement systems for industrial inspection 16 - 17 June 1999, Munich, Germany |
| title_auth | Optical measurement systems for industrial inspection 16 - 17 June 1999, Munich, Germany |
| title_exact_search | Optical measurement systems for industrial inspection 16 - 17 June 1999, Munich, Germany |
| title_full | Optical measurement systems for industrial inspection 16 - 17 June 1999, Munich, Germany Małgorzata Kujawińska ... |
| title_fullStr | Optical measurement systems for industrial inspection 16 - 17 June 1999, Munich, Germany Małgorzata Kujawińska ... |
| title_full_unstemmed | Optical measurement systems for industrial inspection 16 - 17 June 1999, Munich, Germany Małgorzata Kujawińska ... |
| title_short | Optical measurement systems for industrial inspection |
| title_sort | optical measurement systems for industrial inspection 16 17 june 1999 munich germany |
| title_sub | 16 - 17 June 1999, Munich, Germany |
| topic | Engineering inspection Congresses Optical detectors Industrial applications Congresses Optical instruments Industrial applications Congresses Quality control Optical methods Congresses Optische Messtechnik (DE-588)4172667-4 gnd |
| topic_facet | Engineering inspection Congresses Optical detectors Industrial applications Congresses Optical instruments Industrial applications Congresses Quality control Optical methods Congresses Optische Messtechnik Konferenzschrift |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008718810&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT kujawinskamałgorzata opticalmeasurementsystemsforindustrialinspection1617june1999munichgermany |