Electron microscopy of semiconducting materials and ULSI devices: symposium held August 15 - 16, 1998, San Francisco, California, USA
Gespeichert in:
Format: | Buch |
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Sprache: | English |
Veröffentlicht: |
Warrendale, PA.
Materials Research Soc.
1998
|
Schriftenreihe: | Materials Research Society: Materials Research Society symposia proceedings
523 |
Schlagworte: | |
Beschreibung: | XI, 270 S. Ill., graph. Darst. |
ISBN: | 1558994297 |
Internformat
MARC
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Datensatz im Suchindex
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genre | (DE-588)1071861417 Konferenzschrift 1998 San Francisco Calif. gnd-content |
genre_facet | Konferenzschrift 1998 San Francisco Calif. |
id | DE-604.BV012724373 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:32:34Z |
institution | BVB |
isbn | 1558994297 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008651013 |
oclc_num | 632889309 |
open_access_boolean | |
owner | DE-703 DE-384 DE-29T DE-83 DE-11 |
owner_facet | DE-703 DE-384 DE-29T DE-83 DE-11 |
physical | XI, 270 S. Ill., graph. Darst. |
publishDate | 1998 |
publishDateSearch | 1998 |
publishDateSort | 1998 |
publisher | Materials Research Soc. |
record_format | marc |
series | Materials Research Society: Materials Research Society symposia proceedings |
series2 | Materials Research Society: Materials Research Society symposia proceedings |
spelling | Electron microscopy of semiconducting materials and ULSI devices symposium held August 15 - 16, 1998, San Francisco, California, USA ed.: Clive Hayzelden ... Warrendale, PA. Materials Research Soc. 1998 XI, 270 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposia proceedings 523 ULSI (DE-588)4226286-0 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1998 San Francisco Calif. gnd-content Elektronenmikroskopie (DE-588)4014327-2 s Halbleiterwerkstoff (DE-588)4158817-4 s DE-604 ULSI (DE-588)4226286-0 s Hayzelden, Clive Sonstige oth Materials Research Society: Materials Research Society symposia proceedings 523 (DE-604)BV001899105 523 |
spellingShingle | Electron microscopy of semiconducting materials and ULSI devices symposium held August 15 - 16, 1998, San Francisco, California, USA Materials Research Society: Materials Research Society symposia proceedings ULSI (DE-588)4226286-0 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
subject_GND | (DE-588)4226286-0 (DE-588)4158817-4 (DE-588)4014327-2 (DE-588)1071861417 |
title | Electron microscopy of semiconducting materials and ULSI devices symposium held August 15 - 16, 1998, San Francisco, California, USA |
title_auth | Electron microscopy of semiconducting materials and ULSI devices symposium held August 15 - 16, 1998, San Francisco, California, USA |
title_exact_search | Electron microscopy of semiconducting materials and ULSI devices symposium held August 15 - 16, 1998, San Francisco, California, USA |
title_full | Electron microscopy of semiconducting materials and ULSI devices symposium held August 15 - 16, 1998, San Francisco, California, USA ed.: Clive Hayzelden ... |
title_fullStr | Electron microscopy of semiconducting materials and ULSI devices symposium held August 15 - 16, 1998, San Francisco, California, USA ed.: Clive Hayzelden ... |
title_full_unstemmed | Electron microscopy of semiconducting materials and ULSI devices symposium held August 15 - 16, 1998, San Francisco, California, USA ed.: Clive Hayzelden ... |
title_short | Electron microscopy of semiconducting materials and ULSI devices |
title_sort | electron microscopy of semiconducting materials and ulsi devices symposium held august 15 16 1998 san francisco california usa |
title_sub | symposium held August 15 - 16, 1998, San Francisco, California, USA |
topic | ULSI (DE-588)4226286-0 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
topic_facet | ULSI Halbleiterwerkstoff Elektronenmikroskopie Konferenzschrift 1998 San Francisco Calif. |
volume_link | (DE-604)BV001899105 |
work_keys_str_mv | AT hayzeldenclive electronmicroscopyofsemiconductingmaterialsandulsidevicessymposiumheldaugust15161998sanfranciscocaliforniausa |