Defect and impurity engineered semiconductors II: symposium held April 13 - 17, 1998, San Francisco, California, U.S.A.
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Warrendale, Pa.
Materials Research Soc.
1998
|
| Schriftenreihe: | Materials Research Society: Materials Research Society symposia proceedings
510 |
| Schlagworte: | |
| Beschreibung: | XVII, 679 S. Ill., graph. Darst. |
| ISBN: | 1558994165 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV012724108 | ||
| 003 | DE-604 | ||
| 005 | 20000704 | ||
| 007 | t | ||
| 008 | 990820s1998 ad|| |||| 10||| eng d | ||
| 020 | |a 1558994165 |9 1-55899-416-5 | ||
| 035 | |a (OCoLC)39455917 | ||
| 035 | |a (DE-599)BVBBV012724108 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-703 |a DE-384 |a DE-29T | ||
| 050 | 0 | |a TK7871.85 | |
| 082 | 0 | |a 621.3815/2 |2 21 | |
| 084 | |a UD 8400 |0 (DE-625)145545: |2 rvk | ||
| 084 | |a UP 3100 |0 (DE-625)146372: |2 rvk | ||
| 245 | 1 | 0 | |a Defect and impurity engineered semiconductors II |b symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. |c ed.: S. Ashok ... |
| 246 | 1 | 3 | |a Defect and impurity engineered semiconductors and devices II |
| 264 | 1 | |a Warrendale, Pa. |b Materials Research Soc. |c 1998 | |
| 300 | |a XVII, 679 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Materials Research Society: Materials Research Society symposia proceedings |v 510 | |
| 650 | 7 | |a Semiconducteurs - Congrès |2 ram | |
| 650 | 7 | |a Semiconducteurs - Diffusion des impuretés - Congrès |2 ram | |
| 650 | 7 | |a Semiconducteurs - Défauts - Congrès |2 ram | |
| 650 | 4 | |a Semiconductors |v Congresses | |
| 650 | 4 | |a Semiconductors |x Defects |v Congresses | |
| 650 | 4 | |a Semiconductors |x Impurity distribution |v Congresses | |
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Verunreinigung |0 (DE-588)4188107-2 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1998 |z San Francisco Calif. |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | 1 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 1 | 1 | |a Verunreinigung |0 (DE-588)4188107-2 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Ashok, S. |e Sonstige |4 oth | |
| 830 | 0 | |a Materials Research Society: Materials Research Society symposia proceedings |v 510 |w (DE-604)BV001899105 |9 510 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008650784 | ||
Datensatz im Suchindex
| _version_ | 1804127389178920960 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV012724108 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UD 8400 UP 3100 |
| ctrlnum | (OCoLC)39455917 (DE-599)BVBBV012724108 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02151nam a2200529 cb4500</leader><controlfield tag="001">BV012724108</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20000704 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">990820s1998 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1558994165</subfield><subfield code="9">1-55899-416-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)39455917</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV012724108</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.85</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815/2</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UD 8400</subfield><subfield code="0">(DE-625)145545:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 3100</subfield><subfield code="0">(DE-625)146372:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Defect and impurity engineered semiconductors II</subfield><subfield code="b">symposium held April 13 - 17, 1998, San Francisco, California, U.S.A.</subfield><subfield code="c">ed.: S. Ashok ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">Defect and impurity engineered semiconductors and devices II</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Warrendale, Pa.</subfield><subfield code="b">Materials Research Soc.</subfield><subfield code="c">1998</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVII, 679 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">510</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconducteurs - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconducteurs - Diffusion des impuretés - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Semiconducteurs - Défauts - Congrès</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Impurity distribution</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Verunreinigung</subfield><subfield code="0">(DE-588)4188107-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1998</subfield><subfield code="z">San Francisco Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Verunreinigung</subfield><subfield code="0">(DE-588)4188107-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Ashok, S.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">510</subfield><subfield code="w">(DE-604)BV001899105</subfield><subfield code="9">510</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008650784</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1998 San Francisco Calif. gnd-content |
| genre_facet | Konferenzschrift 1998 San Francisco Calif. |
| id | DE-604.BV012724108 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:32:34Z |
| institution | BVB |
| isbn | 1558994165 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008650784 |
| oclc_num | 39455917 |
| open_access_boolean | |
| owner | DE-703 DE-384 DE-29T |
| owner_facet | DE-703 DE-384 DE-29T |
| physical | XVII, 679 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Materials Research Soc. |
| record_format | marc |
| series | Materials Research Society: Materials Research Society symposia proceedings |
| series2 | Materials Research Society: Materials Research Society symposia proceedings |
| spelling | Defect and impurity engineered semiconductors II symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. ed.: S. Ashok ... Defect and impurity engineered semiconductors and devices II Warrendale, Pa. Materials Research Soc. 1998 XVII, 679 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposia proceedings 510 Semiconducteurs - Congrès ram Semiconducteurs - Diffusion des impuretés - Congrès ram Semiconducteurs - Défauts - Congrès ram Semiconductors Congresses Semiconductors Defects Congresses Semiconductors Impurity distribution Congresses Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Verunreinigung (DE-588)4188107-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1998 San Francisco Calif. gnd-content Halbleiter (DE-588)4022993-2 s Gitterbaufehler (DE-588)4125030-8 s DE-604 Verunreinigung (DE-588)4188107-2 s Ashok, S. Sonstige oth Materials Research Society: Materials Research Society symposia proceedings 510 (DE-604)BV001899105 510 |
| spellingShingle | Defect and impurity engineered semiconductors II symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. Materials Research Society: Materials Research Society symposia proceedings Semiconducteurs - Congrès ram Semiconducteurs - Diffusion des impuretés - Congrès ram Semiconducteurs - Défauts - Congrès ram Semiconductors Congresses Semiconductors Defects Congresses Semiconductors Impurity distribution Congresses Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd Verunreinigung (DE-588)4188107-2 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4022993-2 (DE-588)4188107-2 (DE-588)1071861417 |
| title | Defect and impurity engineered semiconductors II symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. |
| title_alt | Defect and impurity engineered semiconductors and devices II |
| title_auth | Defect and impurity engineered semiconductors II symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. |
| title_exact_search | Defect and impurity engineered semiconductors II symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. |
| title_full | Defect and impurity engineered semiconductors II symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. ed.: S. Ashok ... |
| title_fullStr | Defect and impurity engineered semiconductors II symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. ed.: S. Ashok ... |
| title_full_unstemmed | Defect and impurity engineered semiconductors II symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. ed.: S. Ashok ... |
| title_short | Defect and impurity engineered semiconductors II |
| title_sort | defect and impurity engineered semiconductors ii symposium held april 13 17 1998 san francisco california u s a |
| title_sub | symposium held April 13 - 17, 1998, San Francisco, California, U.S.A. |
| topic | Semiconducteurs - Congrès ram Semiconducteurs - Diffusion des impuretés - Congrès ram Semiconducteurs - Défauts - Congrès ram Semiconductors Congresses Semiconductors Defects Congresses Semiconductors Impurity distribution Congresses Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd Verunreinigung (DE-588)4188107-2 gnd |
| topic_facet | Semiconducteurs - Congrès Semiconducteurs - Diffusion des impuretés - Congrès Semiconducteurs - Défauts - Congrès Semiconductors Congresses Semiconductors Defects Congresses Semiconductors Impurity distribution Congresses Gitterbaufehler Halbleiter Verunreinigung Konferenzschrift 1998 San Francisco Calif. |
| volume_link | (DE-604)BV001899105 |
| work_keys_str_mv | AT ashoks defectandimpurityengineeredsemiconductorsiisymposiumheldapril13171998sanfranciscocaliforniausa AT ashoks defectandimpurityengineeredsemiconductorsanddevicesii |