Advances and applications in the metallography and characterization of materials and microelectronic components: proceedings of the twenty-eighth annual technical meeting of the International Metallographic Society
Saved in:
Bibliographic Details
Format: Book
Language:English
Published: Material Parks, Ohio ASM Internat. 1996
Edition:1. printing
Series:Microstructural science 23
Subjects:
Physical Description:XI, 318 S. Ill., graph. Darst.
ISBN:0871705702

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!