APA (7th ed.) Citation

(1996). Advances and applications in the metallography and characterization of materials and microelectronic components: Proceedings of the twenty-eighth annual technical meeting of the International Metallographic Society (1. printing.). ASM Internat.

Chicago Style (17th ed.) Citation

Advances and Applications in the Metallography and Characterization of Materials and Microelectronic Components: Proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society. 1. printing. Material Parks, Ohio: ASM Internat, 1996.

MLA (9th ed.) Citation

Advances and Applications in the Metallography and Characterization of Materials and Microelectronic Components: Proceedings of the Twenty-eighth Annual Technical Meeting of the International Metallographic Society. 1. printing. ASM Internat, 1996.