Scattering and surface roughness: 30 - 31 July 1997, San Diego, California
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Bibliographic Details
Format: Book
Language:English
Published: Bellingham, Wash. SPIE 1997
Series:Society of Photo-Optical Instrumentation Engineers: Proceedings of SPIE 3141
Subjects:
Physical Description:IX, 338 S. Ill., graph. Darst.
ISBN:081942563X

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