Diffusion in silicon: 10 years of research
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Bibliographic Details
Format: Book
Language:English
Published: Zürich-Uetikon Scitec Publ. 1998
Series:Diffusion and defect data A, Defect and diffusion forum ; 153/155
Subjects:
Physical Description:IV, 555 S. Ill., graph. Darst.
ISBN:3908450292

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!