Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing: August 9 - 10, 1999, San José, California, USA
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc.
1999
|
| Schlagworte: | |
| Beschreibung: | IX, 131 S. Ill., graph. Darst. |
| ISBN: | 0769502598 076950261X |
Internformat
MARC
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| 111 | 2 | |a International Workshop on Memory Technology, Design and Testing |n 7 |d 1999 |c San José, Calif. |j Verfasser |0 (DE-588)16028146-5 |4 aut | |
| 245 | 1 | 0 | |a Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing |b August 9 - 10, 1999, San José, California, USA |c ed. by R. Rajsuman ... |
| 246 | 1 | 3 | |a MTDT '99 |
| 246 | 1 | 3 | |a MTDT'99 |
| 246 | 1 | 3 | |a Memory technology, design and testing |
| 264 | 1 | |a Los Alamitos, Calif. [u.a.] |b IEEE Computer Soc. |c 1999 | |
| 300 | |a IX, 131 S. |b Ill., graph. Darst. | ||
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| 650 | 4 | |a Random access memory | |
| 650 | 4 | |a Semiconductor storage devices - Testing | |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 700 | 1 | |a Rajsuman, Rochit |e Sonstige |4 oth | |
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Datensatz im Suchindex
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| author_corporate | International Workshop on Memory Technology, Design and Testing San José, Calif |
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| author_facet | International Workshop on Memory Technology, Design and Testing San José, Calif |
| author_sort | International Workshop on Memory Technology, Design and Testing San José, Calif |
| building | Verbundindex |
| bvnumber | BV012649050 |
| callnumber-first | T - Technology |
| callnumber-label | TK7895 |
| callnumber-raw | TK7895.M4 |
| callnumber-search | TK7895.M4 |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
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| dewey-full | 621.39/732 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/732 |
| dewey-search | 621.39/732 |
| dewey-sort | 3621.39 3732 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV012649050 |
| illustrated | Illustrated |
| indexdate | 2025-01-10T13:23:34Z |
| institution | BVB |
| institution_GND | (DE-588)16028146-5 |
| isbn | 0769502598 076950261X |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008593613 |
| oclc_num | 247530251 |
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| owner | DE-739 DE-83 |
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| physical | IX, 131 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | IEEE Computer Soc. |
| record_format | marc |
| spelling | International Workshop on Memory Technology, Design and Testing 7 1999 San José, Calif. Verfasser (DE-588)16028146-5 aut Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing August 9 - 10, 1999, San José, California, USA ed. by R. Rajsuman ... MTDT '99 MTDT'99 Memory technology, design and testing Los Alamitos, Calif. [u.a.] IEEE Computer Soc. 1999 IX, 131 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Random access memory Semiconductor storage devices - Testing (DE-588)1071861417 Konferenzschrift gnd-content Rajsuman, Rochit Sonstige oth |
| spellingShingle | Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing August 9 - 10, 1999, San José, California, USA Random access memory Semiconductor storage devices - Testing |
| subject_GND | (DE-588)1071861417 |
| title | Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing August 9 - 10, 1999, San José, California, USA |
| title_alt | MTDT '99 MTDT'99 Memory technology, design and testing |
| title_auth | Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing August 9 - 10, 1999, San José, California, USA |
| title_exact_search | Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing August 9 - 10, 1999, San José, California, USA |
| title_full | Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing August 9 - 10, 1999, San José, California, USA ed. by R. Rajsuman ... |
| title_fullStr | Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing August 9 - 10, 1999, San José, California, USA ed. by R. Rajsuman ... |
| title_full_unstemmed | Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing August 9 - 10, 1999, San José, California, USA ed. by R. Rajsuman ... |
| title_short | Records of the 1999 IEEE International Workshop on Memory Technology, Design and Testing |
| title_sort | records of the 1999 ieee international workshop on memory technology design and testing august 9 10 1999 san jose california usa |
| title_sub | August 9 - 10, 1999, San José, California, USA |
| topic | Random access memory Semiconductor storage devices - Testing |
| topic_facet | Random access memory Semiconductor storage devices - Testing Konferenzschrift |
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