Deep centers in semiconductors: a state of the art approach
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Yverdon [u.a.]
Gordon and Breach Science Publ.
1992
|
| Ausgabe: | 2. ed. |
| Schlagworte: | |
| Beschreibung: | XV, 928 S. graph. Darst. |
| ISBN: | 2881245625 |
Internformat
MARC
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| 082 | 0 | |a 537.6/22 |2 20 | |
| 084 | |a UQ 2400 |0 (DE-625)146493: |2 rvk | ||
| 245 | 1 | 0 | |a Deep centers in semiconductors |b a state of the art approach |c ed. by Sokrates T. Pantelides |
| 250 | |a 2. ed. | ||
| 264 | 1 | |a Yverdon [u.a.] |b Gordon and Breach Science Publ. |c 1992 | |
| 300 | |a XV, 928 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Complexes donneur-accepteur d'électrons | |
| 650 | 4 | |a Semiconducteurs - Défauts | |
| 650 | 4 | |a Electron donor-acceptor complexes | |
| 650 | 4 | |a Impurity centers | |
| 650 | 4 | |a Semiconductors |x Defects | |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Tiefe Störstelle |0 (DE-588)4185419-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Verunreinigung |0 (DE-588)4188107-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | 1 | |a Tiefe Störstelle |0 (DE-588)4185419-6 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 1 | 1 | |a Verunreinigung |0 (DE-588)4188107-2 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Pantelides, Sokrates |d ca. 20./21. Jh. |e Sonstige |0 (DE-588)1131264401 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008591505 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804127302950322176 |
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| building | Verbundindex |
| bvnumber | BV012646603 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
| callnumber-raw | QC611.6.D4 |
| callnumber-search | QC611.6.D4 |
| callnumber-sort | QC 3611.6 D4 |
| callnumber-subject | QC - Physics |
| classification_rvk | UQ 2400 |
| ctrlnum | (OCoLC)25916061 (DE-599)BVBBV012646603 |
| dewey-full | 537.6/22 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/22 |
| dewey-search | 537.6/22 |
| dewey-sort | 3537.6 222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| edition | 2. ed. |
| format | Book |
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| id | DE-604.BV012646603 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:31:12Z |
| institution | BVB |
| isbn | 2881245625 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008591505 |
| oclc_num | 25916061 |
| open_access_boolean | |
| owner | DE-703 DE-355 DE-BY-UBR DE-11 |
| owner_facet | DE-703 DE-355 DE-BY-UBR DE-11 |
| physical | XV, 928 S. graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Gordon and Breach Science Publ. |
| record_format | marc |
| spelling | Deep centers in semiconductors a state of the art approach ed. by Sokrates T. Pantelides 2. ed. Yverdon [u.a.] Gordon and Breach Science Publ. 1992 XV, 928 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Complexes donneur-accepteur d'électrons Semiconducteurs - Défauts Electron donor-acceptor complexes Impurity centers Semiconductors Defects Halbleiter (DE-588)4022993-2 gnd rswk-swf Tiefe Störstelle (DE-588)4185419-6 gnd rswk-swf Verunreinigung (DE-588)4188107-2 gnd rswk-swf Halbleiter (DE-588)4022993-2 s Tiefe Störstelle (DE-588)4185419-6 s DE-604 Verunreinigung (DE-588)4188107-2 s 1\p DE-604 Pantelides, Sokrates ca. 20./21. Jh. Sonstige (DE-588)1131264401 oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Deep centers in semiconductors a state of the art approach Complexes donneur-accepteur d'électrons Semiconducteurs - Défauts Electron donor-acceptor complexes Impurity centers Semiconductors Defects Halbleiter (DE-588)4022993-2 gnd Tiefe Störstelle (DE-588)4185419-6 gnd Verunreinigung (DE-588)4188107-2 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4185419-6 (DE-588)4188107-2 |
| title | Deep centers in semiconductors a state of the art approach |
| title_auth | Deep centers in semiconductors a state of the art approach |
| title_exact_search | Deep centers in semiconductors a state of the art approach |
| title_full | Deep centers in semiconductors a state of the art approach ed. by Sokrates T. Pantelides |
| title_fullStr | Deep centers in semiconductors a state of the art approach ed. by Sokrates T. Pantelides |
| title_full_unstemmed | Deep centers in semiconductors a state of the art approach ed. by Sokrates T. Pantelides |
| title_short | Deep centers in semiconductors |
| title_sort | deep centers in semiconductors a state of the art approach |
| title_sub | a state of the art approach |
| topic | Complexes donneur-accepteur d'électrons Semiconducteurs - Défauts Electron donor-acceptor complexes Impurity centers Semiconductors Defects Halbleiter (DE-588)4022993-2 gnd Tiefe Störstelle (DE-588)4185419-6 gnd Verunreinigung (DE-588)4188107-2 gnd |
| topic_facet | Complexes donneur-accepteur d'électrons Semiconducteurs - Défauts Electron donor-acceptor complexes Impurity centers Semiconductors Defects Halbleiter Tiefe Störstelle Verunreinigung |
| work_keys_str_mv | AT pantelidessokrates deepcentersinsemiconductorsastateoftheartapproach |