Chemical microanalysis using electron beams:
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
London
Inst. of Materials
1992
|
Schriftenreihe: | Institute of Materials: Book
523 |
Schlagworte: | |
Beschreibung: | 241 S. Ill., graph. Darst. |
ISBN: | 0901716065 |
Internformat
MARC
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100 | 1 | |a Jones, Ian P. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Chemical microanalysis using electron beams |c I. P. Jones |
264 | 1 | |a London |b Inst. of Materials |c 1992 | |
300 | |a 241 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Institute of Materials: Book |v 523 | |
650 | 4 | |a Electron probe microanalysis | |
650 | 4 | |a Microchemistry | |
650 | 4 | |a Scanning electron microscopes | |
650 | 4 | |a Transmission electron microscopes | |
650 | 4 | |a X-ray microanalysis | |
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Datensatz im Suchindex
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any_adam_object | |
author | Jones, Ian P. |
author_facet | Jones, Ian P. |
author_role | aut |
author_sort | Jones, Ian P. |
author_variant | i p j ip ipj |
building | Verbundindex |
bvnumber | BV012591743 |
callnumber-first | Q - Science |
callnumber-label | QD117 |
callnumber-raw | QD117.E42 |
callnumber-search | QD117.E42 |
callnumber-sort | QD 3117 E42 |
callnumber-subject | QD - Chemistry |
classification_rvk | UX 1380 |
ctrlnum | (OCoLC)26649524 (DE-599)BVBBV012591743 |
dewey-full | 543.08586 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 543 - Analytical chemistry |
dewey-raw | 543.08586 |
dewey-search | 543.08586 |
dewey-sort | 3543.08586 |
dewey-tens | 540 - Chemistry and allied sciences |
discipline | Chemie / Pharmazie Physik |
format | Book |
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id | DE-604.BV012591743 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:30:13Z |
institution | BVB |
isbn | 0901716065 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008550446 |
oclc_num | 26649524 |
open_access_boolean | |
owner | DE-703 |
owner_facet | DE-703 |
physical | 241 S. Ill., graph. Darst. |
publishDate | 1992 |
publishDateSearch | 1992 |
publishDateSort | 1992 |
publisher | Inst. of Materials |
record_format | marc |
series | Institute of Materials: Book |
series2 | Institute of Materials: Book |
spelling | Jones, Ian P. Verfasser aut Chemical microanalysis using electron beams I. P. Jones London Inst. of Materials 1992 241 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Institute of Materials: Book 523 Electron probe microanalysis Microchemistry Scanning electron microscopes Transmission electron microscopes X-ray microanalysis Elektronenstrahl (DE-588)4151894-9 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 s Elektronenstrahl (DE-588)4151894-9 s DE-604 Institute of Materials: Book 523 (DE-604)BV007847337 523 |
spellingShingle | Jones, Ian P. Chemical microanalysis using electron beams Institute of Materials: Book Electron probe microanalysis Microchemistry Scanning electron microscopes Transmission electron microscopes X-ray microanalysis Elektronenstrahl (DE-588)4151894-9 gnd Mikroanalyse (DE-588)4169804-6 gnd |
subject_GND | (DE-588)4151894-9 (DE-588)4169804-6 |
title | Chemical microanalysis using electron beams |
title_auth | Chemical microanalysis using electron beams |
title_exact_search | Chemical microanalysis using electron beams |
title_full | Chemical microanalysis using electron beams I. P. Jones |
title_fullStr | Chemical microanalysis using electron beams I. P. Jones |
title_full_unstemmed | Chemical microanalysis using electron beams I. P. Jones |
title_short | Chemical microanalysis using electron beams |
title_sort | chemical microanalysis using electron beams |
topic | Electron probe microanalysis Microchemistry Scanning electron microscopes Transmission electron microscopes X-ray microanalysis Elektronenstrahl (DE-588)4151894-9 gnd Mikroanalyse (DE-588)4169804-6 gnd |
topic_facet | Electron probe microanalysis Microchemistry Scanning electron microscopes Transmission electron microscopes X-ray microanalysis Elektronenstrahl Mikroanalyse |
volume_link | (DE-604)BV007847337 |
work_keys_str_mv | AT jonesianp chemicalmicroanalysisusingelectronbeams |