Recombination lifetime measurements in silicon: [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997]
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
West Conshohocken, PA
ASTM
1998
|
| Schriftenreihe: | American Society for Testing and Materials: ASTM special technical publication
1340 |
| Schlagworte: | |
| Beschreibung: | 392 S. Ill., graph. Darst. |
| ISBN: | 0803124899 |
Internformat
MARC
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| 245 | 1 | 0 | |a Recombination lifetime measurements in silicon |b [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] |c Dinesh C. Gupta ..., ed. |
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| genre | (DE-588)1071861417 Konferenzschrift 1997 Santa Clara Calif. gnd-content |
| genre_facet | Konferenzschrift 1997 Santa Clara Calif. |
| id | DE-604.BV012496133 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:28:38Z |
| institution | BVB |
| isbn | 0803124899 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008483593 |
| oclc_num | 633346221 |
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| owner_facet | DE-703 DE-83 |
| physical | 392 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | ASTM |
| record_format | marc |
| series | American Society for Testing and Materials: ASTM special technical publication |
| series2 | American Society for Testing and Materials: ASTM special technical publication |
| spelling | Recombination lifetime measurements in silicon [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] Dinesh C. Gupta ..., ed. West Conshohocken, PA ASTM 1998 392 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier American Society for Testing and Materials: ASTM special technical publication 1340 Silicium (DE-588)4077445-4 gnd rswk-swf Messtechnik (DE-588)4114575-6 gnd rswk-swf Lebensdauer (DE-588)4034837-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1997 Santa Clara Calif. gnd-content Silicium (DE-588)4077445-4 s Lebensdauer (DE-588)4034837-4 s Messtechnik (DE-588)4114575-6 s DE-604 Gupta, Dinesh C. Sonstige oth American Society for Testing and Materials: ASTM special technical publication 1340 (DE-604)BV035417629 1340 |
| spellingShingle | Recombination lifetime measurements in silicon [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] American Society for Testing and Materials: ASTM special technical publication Silicium (DE-588)4077445-4 gnd Messtechnik (DE-588)4114575-6 gnd Lebensdauer (DE-588)4034837-4 gnd |
| subject_GND | (DE-588)4077445-4 (DE-588)4114575-6 (DE-588)4034837-4 (DE-588)1071861417 |
| title | Recombination lifetime measurements in silicon [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] |
| title_auth | Recombination lifetime measurements in silicon [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] |
| title_exact_search | Recombination lifetime measurements in silicon [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] |
| title_full | Recombination lifetime measurements in silicon [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] Dinesh C. Gupta ..., ed. |
| title_fullStr | Recombination lifetime measurements in silicon [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] Dinesh C. Gupta ..., ed. |
| title_full_unstemmed | Recombination lifetime measurements in silicon [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] Dinesh C. Gupta ..., ed. |
| title_short | Recombination lifetime measurements in silicon |
| title_sort | recombination lifetime measurements in silicon papers presented at the advanced workshop on silicon recombination lifetime characterization methods held in santa clara calif on june 2 3 1997 |
| title_sub | [papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif., on June 2 - 3, 1997] |
| topic | Silicium (DE-588)4077445-4 gnd Messtechnik (DE-588)4114575-6 gnd Lebensdauer (DE-588)4034837-4 gnd |
| topic_facet | Silicium Messtechnik Lebensdauer Konferenzschrift 1997 Santa Clara Calif. |
| volume_link | (DE-604)BV035417629 |
| work_keys_str_mv | AT guptadineshc recombinationlifetimemeasurementsinsiliconpaperspresentedattheadvancedworkshoponsiliconrecombinationlifetimecharacterizationmethodsheldinsantaclaracalifonjune231997 |