Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy: NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Amsterdam [u.a.]
Elsevier
1999
|
| Series: | Applied surface science
140,3/4 |
| Subjects: | |
| Item Description: | Einzelaufnahme eines Zeitschr.-H. |
| Physical Description: | X S., S. 244 - 455 S. Ill., graph. Darst. |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV012441193 | ||
| 003 | DE-604 | ||
| 005 | 20020830 | ||
| 007 | t | ||
| 008 | 990304s1999 ad|| |||| 00||| eng d | ||
| 035 | |a (OCoLC)313368177 | ||
| 035 | |a (DE-599)BVBBV012441193 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-355 |a DE-29T |a DE-706 | ||
| 111 | 2 | |a International Workshop on Noncontact Atomic Force Microscopy |n 1 |d 1998 |c Osaka |j Verfasser |0 (DE-588)1602363-8 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy |b NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 |c ed. by S. Morita ... |
| 246 | 1 | 3 | |a NC-AFM 98 |
| 264 | 1 | |a Amsterdam [u.a.] |b Elsevier |c 1999 | |
| 300 | |a X S., S. 244 - 455 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Applied surface science |v 140,3/4 | |
| 500 | |a Einzelaufnahme eines Zeitschr.-H. | ||
| 650 | 0 | 7 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1998 |z Osaka |2 gnd-content | |
| 689 | 0 | 0 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Morita, Seizō |d 1948- |e Sonstige |0 (DE-588)123650178 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008441407 | ||
Record in the Search Index
| _version_ | 1804127077868240896 |
|---|---|
| any_adam_object | |
| author_GND | (DE-588)123650178 |
| author_corporate | International Workshop on Noncontact Atomic Force Microscopy Osaka |
| author_corporate_role | aut |
| author_facet | International Workshop on Noncontact Atomic Force Microscopy Osaka |
| author_sort | International Workshop on Noncontact Atomic Force Microscopy Osaka |
| building | Verbundindex |
| bvnumber | BV012441193 |
| ctrlnum | (OCoLC)313368177 (DE-599)BVBBV012441193 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01315nam a2200337 cb4500</leader><controlfield tag="001">BV012441193</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20020830 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">990304s1999 ad|| |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)313368177</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV012441193</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">International Workshop on Noncontact Atomic Force Microscopy</subfield><subfield code="n">1</subfield><subfield code="d">1998</subfield><subfield code="c">Osaka</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)1602363-8</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy</subfield><subfield code="b">NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998</subfield><subfield code="c">ed. by S. Morita ...</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">NC-AFM 98</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam [u.a.]</subfield><subfield code="b">Elsevier</subfield><subfield code="c">1999</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">X S., S. 244 - 455 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Applied surface science</subfield><subfield code="v">140,3/4</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zeitschr.-H.</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1998</subfield><subfield code="z">Osaka</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Morita, Seizō</subfield><subfield code="d">1948-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)123650178</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008441407</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1998 Osaka gnd-content |
| genre_facet | Konferenzschrift 1998 Osaka |
| id | DE-604.BV012441193 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:27:37Z |
| institution | BVB |
| institution_GND | (DE-588)1602363-8 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008441407 |
| oclc_num | 313368177 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-29T DE-706 |
| owner_facet | DE-355 DE-BY-UBR DE-29T DE-706 |
| physical | X S., S. 244 - 455 S. Ill., graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Applied surface science |
| spelling | International Workshop on Noncontact Atomic Force Microscopy 1 1998 Osaka Verfasser (DE-588)1602363-8 aut Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 ed. by S. Morita ... NC-AFM 98 Amsterdam [u.a.] Elsevier 1999 X S., S. 244 - 455 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Applied surface science 140,3/4 Einzelaufnahme eines Zeitschr.-H. Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1998 Osaka gnd-content Rasterkraftmikroskopie (DE-588)4274473-8 s DE-604 Morita, Seizō 1948- Sonstige (DE-588)123650178 oth |
| spellingShingle | Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 (DE-588)1071861417 |
| title | Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 |
| title_alt | NC-AFM 98 |
| title_auth | Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 |
| title_exact_search | Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 |
| title_full | Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 ed. by S. Morita ... |
| title_fullStr | Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 ed. by S. Morita ... |
| title_full_unstemmed | Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 ed. by S. Morita ... |
| title_short | Proceedings of the First International Workshop on Noncontact Atomic Force Microscopy |
| title_sort | proceedings of the first international workshop on noncontact atomic force microscopy nc afm 98 osaka japan july 21 23 1998 |
| title_sub | NC-AFM 98 ; Osaka, Japan, July 21 - 23, 1998 |
| topic | Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Rasterkraftmikroskopie Konferenzschrift 1998 Osaka |
| work_keys_str_mv | AT internationalworkshoponnoncontactatomicforcemicroscopyosaka proceedingsofthefirstinternationalworkshoponnoncontactatomicforcemicroscopyncafm98osakajapanjuly21231998 AT moritaseizo proceedingsofthefirstinternationalworkshoponnoncontactatomicforcemicroscopyncafm98osakajapanjuly21231998 AT internationalworkshoponnoncontactatomicforcemicroscopyosaka ncafm98 AT moritaseizo ncafm98 |