APA-Zitierstil (7. Ausg.)

Atomic Force Microscopy, Scanning Tunneling Microscopy Symposium Natick, Mass, & Cohen, S. H. (1997). Atomic force microscopy, scanning tunneling microscopy 2: Proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts. Plenum Press.

Chicago-Zitierstil (17. Ausg.)

Atomic Force Microscopy, Scanning Tunneling Microscopy Symposium Natick, Mass, und Samuel H. Cohen. Atomic Force Microscopy, Scanning Tunneling Microscopy 2: Proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, Held June 7 - 9, 1994, in Natick, Massachusetts. New York [u.a.]: Plenum Press, 1997.

MLA-Zitierstil (9. Ausg.)

Atomic Force Microscopy, Scanning Tunneling Microscopy Symposium Natick, Mass, und Samuel H. Cohen. Atomic Force Microscopy, Scanning Tunneling Microscopy 2: Proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, Held June 7 - 9, 1994, in Natick, Massachusetts. Plenum Press, 1997.

Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.