Atomic force microscopy, scanning tunneling microscopy 2: proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts
Gespeichert in:
| Körperschaft: | |
|---|---|
| Weitere Verfasser: | |
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Plenum Press
1997
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| Schriftenreihe: | Atomic force microscopy, scanning tunneling microscopy
2 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | IX, 250 S. zahlr. Ill., graph. Darst. |
| ISBN: | 030645596X |
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Datensatz im Suchindex
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| adam_text | ATOMIC FORCE MICROSCOPY/SCANNING TUNNELING MICROSCOPY 2 EDITED BY SAMUEL
H. COHEN AND MARCIA L. LIGHTBODY U.S. ARMY SOLDIER SYSTEMS COMMAND
NATICK RESEARCH, DEVELOPMENT AND ENGINEERING CENTER NATICK,
MASSACHUSETTS PLENUM PRESS * NEW YORK AND LONDON CONTENTS KEYNOTE
ADDRESS: SCANNED PROBE MICROSCOPY 1 MICHAEL F. CROMMIE SEMICONDUCTOR
CHARACTERIZATION AND ADSORBATE CHARACTERIZATION MODERATOR: ARNOLD J.
HOWARD, SANDIA NATIONAL LABORATORIES SCANNING TUNNELING MICROSCOPY FOR
VERY LARGE-SCALE INTEGRATION (VLSI) 7 INSPECTION SHANE Y. HONG SCANNING
TUNNELING MICROSCOPY-BASED FABRICATION OF NANOMETER SCALE STRUCTURES . .
23 MUNIR H. NAYFEH A MICROSCOPY FOR OUR TIME 41 ELINOR SOLIT SCANNING
TUNNELING MICROSCOPY OF CHEMICAL VAPOR DEPOSITION DIAMOND FILM 45 GROWTH
ON HIGHLY ORIENTED PYROLYTIC GRAPHITE AND SILICON A.F. AVILES, R.E.
STALLCUP, W. RIVERA, L.M. VILLARREAL, AND J.M. PEREZ SCANNING TUNNELING
MICROSCOPY AND ATOMIC FORCE MICROSCOPY OF CHEMICAL- 53 VAPOR-DEPOSITION
DIAMOND AND DIAMOND-LIKE CARBON THIN FILMS T.W. MERCER, D.L. CARROLL,
YONG LIANG, D. BONNEIL, T.A. FRIEDMANN, M.P. SIEGAL, AND N.J. DINARDO
ATOMIC RESOLUTION ULTRAHIGH VACUUM SCANNING TUNNELING MICROSCOPY OF 59
DIAMOND (100) EPITAXIAL FILMS R.E. STALLCUP, L.M. VILLARREAL, A.F.
AVILES, AND J.M. PEREZ SCANNING FORCE MICROSCOPY CHARACTERIZATION OF
BIOPOLYMER FILMS: GELATIN ON MICA . . 65 GREG HAUGSTAD, WAYNE L.
GLADFELTER, E.B. WEBERG, R.T. WEBERG, AND T.D. WETHERILL GASIFICATION
STUDIES OF GRAPHITE SURFACE BY SCANNING TUNNELING MICROSCOPY 75 DEEPAK
TANDON AND E.J. HIPPO VII SCANNING TUNNELING MICROSCOPY STUDIES OF
HYDROCARBONS ADSORBED ON 83 GRAPHITE SURFACES BHAWANI VENKATARAMAN AND
GEORGE W. FLYNN BIOLOGICAL AND CHEMICAL NANOSTRUCTURE MODERATOR: C.
PATRICK DUNNE, U.S. ARMY SOLDIER SYSTEMS COMMAND, NATICK RESEARCH,
DEVELOPMENT AND ENGINEERING CENTER VISUALIZATION OF THE SURFACE
DEGRADATION OF BIOMEDICAL POLYMERS IN SITU 93 WITH AN ATOMIC FORCE
MICROSCOPE K. M. SHAKESHEFF, M.C. DAVIES, A. DOMB, C.J. ROBERTS, A.J.
SHARD, S.J.B. TENDIER, AND P.M. WILLIAMS SCANNING TUNNELING MICROSCOPY
INVESTIGATIONS ON HETEROEPITAXIALLY GROWN 99 OVERLAYERS OF
CU-PHTHALOCYANINE ON AU(L 11) SURFACES TORSTEN FRITZ, MASAHIKO HARA,
WOLFGANG KNOLL, AND HIROYUKI SASABE CHARACTERIZATION OF
POLY(TETRAFLUOROETHYLENE) SURFACES BY ATOMIC FORCE 107
MICROSCOPY*RESULTS AND ARTIFACTS A. J. HOWARD, R. R. RYE, AND K. KJ
OILER SCANNING PROBE MICROSCOPY STUDIES OF ISOCYANIDE FUNCTIONALIZED
POLYANILINE * . . . . 115 THIN FILMS TIMOTHY L. PORTER AND ANDREW G.
SYKES NEW DEVELOPMENTS IN AFM/STM MODERATOR: JOSE PEREZ, UNIVERSITY OF
NORTH TEXAS INVESTIGATIONS ON THE TOPOGRAPHIC AND SPECTROSCOPIC IMAGING
BY THE SCANNING 127 TUNNELING MICROSCOPE M. HIETSCHOLD, O. PESTER, D.
POREZAG, M. ROEDER, H. SBOSNY, K.WALZER, AND L. KOENDERS OBSERVING
REACTIONS VIA FLOW INJECTION SCANNING TUNNELING MICROSCOPY 137 JAMES D.
NOLL, PAUL G. VAN PATTEN, AND M. L. MYRICK ADVANCES IN PIEZORESISTIVE
CANTILEVERS FOR ATOMIC FORCE MICROSCOPY 147 M. TORTONESE NANOMETER-SCALE
QUALITATIVE ANALYSIS OF SURFACES WITH A MODIFIED SCANNING 155 TUNNELING
MICROSCOPE/FIELD EMISSION SOURCE P. G VAN PATTEN, J. D. NOLL, AND M. L.
MYRICK ATOMIC FORCE MICROSCOPY IMAGING OF SINGLE ION IMPACTS ON MICA 161
D. * PARKS, R. BASTASZ, R. W. SCHMIEDER, AND M. STOCKLI VIII AFM/STM IN
MATERIALS SCIENCE MODERATORS: ERNEST * HAMMOND, MORGAN STATE UNIVERSITY
TIMOTHY L. PORTER, NORTHERN ARIZONA UNIVERSITY APPLICATIONS OF ATOMIC
FORCE MICROSCOPY IN OPTICAL FIBER RESEARCH 171 Q. ZHONG AND D. INNISS
ATOMIC FORCE MICROSCOPY STUDIES ON OPTICAL FIBERS 179 M. JOHN
MATTHEWSON, VINCENZO V. RONDINELLA, AND JAMES COLAIZZI SCANNING
TUNNELING MICROSCOPY STUDIES OF SOLVENT-DEPOSITED MATERIALS ON 189
HIGHLY ORIENTED PYROLYTIC GRAPHITE EDWIN J. HIPPO AND DEEPAK TANDON IN
SITU STUDY OF STAINLESS STEEL S PASSIVE LAYER EXPOSED TO HCL USING A
SCANNING . . 195 TUNNELING MICROSCOPE T. J. M C KRELL AND J. M. GALLIGAN
APPLICATION OF MAGNETIC FORCE MICROSCOPY IN MAGNETIC RECORDING 203
THOMAS L. ALTSHULER SCANNING ELECTRON MICROSCOPY, SCANNING TUNNELING
MICROSCOPY, AND ATOMIC .... 215 FORCE MICROSCOPY STUDIES OF SELECTED
VIDEOTAPES ERNEST * HAMMOND, JR. SURFACE CHARACTERISTICS EVALUATION OF
THIN FILMS BY ATOMIC FORCE MICROSCOPY . . . . 227 G.LI CURRENT VERSUS
VOLTAGE CHARACTERISTICS FOR DEPOSITION AND REMOVAL OF GOLD 233
NANOSTRUCTURES ON A GOLD SURFACE USING SCANNING TUNNELING MICROSCOPY
J.M. PEREZ AND J.L. LARGE ATOMIC FORCE MICROSCOPY OF ION-BEAM MODIFIED
CARBON FIBERS 241 PEARL W.YIP AND SIN-SHONG LIN INDEX 249 *
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| spelling | Atomic Force Microscopy, Scanning Tunneling Microscopy Symposium 2 1994 Natick, Mass. Verfasser (DE-588)5260827-X aut Atomic force microscopy, scanning tunneling microscopy 2 proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts ed. by Samuel H. Cohen ... New York [u.a.] Plenum Press 1997 IX, 250 S. zahlr. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Atomic force microscopy, scanning tunneling microscopy 2 Atomic force microscopy Scanning tunneling microscopy Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1994 Natick Mass. gnd-content Rastertunnelmikroskopie (DE-588)4252995-5 s DE-604 Rasterkraftmikroskopie (DE-588)4274473-8 s Cohen, Samuel H. edt U.S. Army Natick Research, Development, and Engineering Center Sonstige (DE-588)5153707-2 oth Atomic force microscopy, scanning tunneling microscopy 2 (DE-604)BV024434075 2 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008390159&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Atomic force microscopy, scanning tunneling microscopy 2 proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts Atomic force microscopy, scanning tunneling microscopy Atomic force microscopy Scanning tunneling microscopy Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4252995-5 (DE-588)4274473-8 (DE-588)1071861417 |
| title | Atomic force microscopy, scanning tunneling microscopy 2 proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts |
| title_auth | Atomic force microscopy, scanning tunneling microscopy 2 proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts |
| title_exact_search | Atomic force microscopy, scanning tunneling microscopy 2 proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts |
| title_full | Atomic force microscopy, scanning tunneling microscopy 2 proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts ed. by Samuel H. Cohen ... |
| title_fullStr | Atomic force microscopy, scanning tunneling microscopy 2 proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts ed. by Samuel H. Cohen ... |
| title_full_unstemmed | Atomic force microscopy, scanning tunneling microscopy 2 proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts ed. by Samuel H. Cohen ... |
| title_short | Atomic force microscopy, scanning tunneling microscopy 2 |
| title_sort | atomic force microscopy scanning tunneling microscopy 2 proceedings of the second us army soldier systems command natick research development and engineering center atomic force microscopy scanning tunneling microscopy afm stm symposium held june 7 9 1994 in natick massachusetts |
| title_sub | proceedings of the Second US Army Soldier Systems Command, Natick Research, Development and Engineering Center Atomic Force Microscopy, Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 - 9, 1994, in Natick, Massachusetts |
| topic | Atomic force microscopy Scanning tunneling microscopy Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Atomic force microscopy Scanning tunneling microscopy Rastertunnelmikroskopie Rasterkraftmikroskopie Konferenzschrift 1994 Natick Mass. |
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