Digest of papers:
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Los Alamitos, Calif. [u. a.]
IEEE Computer Society
1997
|
| Schlagworte: | |
| Beschreibung: | IX, 119 S. graph. Darst. |
| ISBN: | 0818681233 |
Internformat
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| 245 | 1 | 0 | |a Digest of papers |c IEEE International Workshop on IDDQ Testing, November 5-6. 1997, Washington, D.C. Sponsored by IEEE Computer Society, Technical Commitee on Test Technology. Ed. by Anura P. Jayasumana ... |
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| 264 | 1 | |a Los Alamitos, Calif. [u. a.] |b IEEE Computer Society |c 1997 | |
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Datensatz im Suchindex
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| author_corporate_role | aut |
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| genre_facet | Konferenzschrift 1997 Washington DC |
| id | DE-604.BV012294991 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:25:07Z |
| institution | BVB |
| institution_GND | (DE-588)5279086-1 (DE-588)1692-5 (DE-588)5079499-1 |
| isbn | 0818681233 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008336717 |
| oclc_num | 633829794 |
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| physical | IX, 119 S. graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | IEEE Computer Society |
| record_format | marc |
| spelling | International Workshop on IDDQ Testing 3 1997 Washington, DC Verfasser (DE-588)5279086-1 aut Digest of papers IEEE International Workshop on IDDQ Testing, November 5-6. 1997, Washington, D.C. Sponsored by IEEE Computer Society, Technical Commitee on Test Technology. Ed. by Anura P. Jayasumana ... IDDQ testing Los Alamitos, Calif. [u. a.] IEEE Computer Society 1997 IX, 119 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1997 Washington DC gnd-content Integrierte Schaltung (DE-588)4027242-4 s Test (DE-588)4059549-3 s DE-604 Jayasumana, Anura P. Sonstige oth Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth IEEE Computer Society Test Technology Technical Committee Sonstige (DE-588)5079499-1 oth |
| spellingShingle | Digest of papers Integrierte Schaltung (DE-588)4027242-4 gnd Test (DE-588)4059549-3 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4059549-3 (DE-588)1071861417 |
| title | Digest of papers |
| title_alt | IDDQ testing |
| title_auth | Digest of papers |
| title_exact_search | Digest of papers |
| title_full | Digest of papers IEEE International Workshop on IDDQ Testing, November 5-6. 1997, Washington, D.C. Sponsored by IEEE Computer Society, Technical Commitee on Test Technology. Ed. by Anura P. Jayasumana ... |
| title_fullStr | Digest of papers IEEE International Workshop on IDDQ Testing, November 5-6. 1997, Washington, D.C. Sponsored by IEEE Computer Society, Technical Commitee on Test Technology. Ed. by Anura P. Jayasumana ... |
| title_full_unstemmed | Digest of papers IEEE International Workshop on IDDQ Testing, November 5-6. 1997, Washington, D.C. Sponsored by IEEE Computer Society, Technical Commitee on Test Technology. Ed. by Anura P. Jayasumana ... |
| title_short | Digest of papers |
| title_sort | digest of papers |
| topic | Integrierte Schaltung (DE-588)4027242-4 gnd Test (DE-588)4059549-3 gnd |
| topic_facet | Integrierte Schaltung Test Konferenzschrift 1997 Washington DC |
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