Proceedings: April 26 - 30, 1998 Monterey, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc.
1998
|
| Schlagworte: | |
| Beschreibung: | XXXX, 472 S. Ill., graph. Darst. |
| ISBN: | 0818684364 0818684380 |
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Datensatz im Suchindex
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| isbn | 0818684364 0818684380 |
| language | English |
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| physical | XXXX, 472 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
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| publisher | IEEE Computer Soc. |
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| spelling | VLSI Test Symposium 16 1998 Monterey, Calif. Verfasser (DE-588)5316136-1 aut Proceedings April 26 - 30, 1998 Monterey, California 16th IEEE VLSI Test Symposium VTS'98 Los Alamitos, Calif. [u.a.] IEEE Computer Soc. 1998 XXXX, 472 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Testen (DE-588)4367264-4 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content VLSI (DE-588)4117388-0 s Testen (DE-588)4367264-4 s 1\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Proceedings April 26 - 30, 1998 Monterey, California Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4117388-0 (DE-588)1071861417 |
| title | Proceedings April 26 - 30, 1998 Monterey, California |
| title_alt | VTS'98 |
| title_auth | Proceedings April 26 - 30, 1998 Monterey, California |
| title_exact_search | Proceedings April 26 - 30, 1998 Monterey, California |
| title_full | Proceedings April 26 - 30, 1998 Monterey, California 16th IEEE VLSI Test Symposium |
| title_fullStr | Proceedings April 26 - 30, 1998 Monterey, California 16th IEEE VLSI Test Symposium |
| title_full_unstemmed | Proceedings April 26 - 30, 1998 Monterey, California 16th IEEE VLSI Test Symposium |
| title_short | Proceedings |
| title_sort | proceedings april 26 30 1998 monterey california |
| title_sub | April 26 - 30, 1998 Monterey, California |
| topic | Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Testen VLSI Konferenzschrift |
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