Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis: ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Oxford
Pergamon
1997
|
| Series: | Microelectronics and reliability
37,10/11 |
| Subjects: | |
| Item Description: | Einzelaufnahme eines Zeitschr.-H. |
| Physical Description: | X, S. 1421 - 1798, II S. Ill., graph. Darst. |
Staff View
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV012157275 | ||
| 003 | DE-604 | ||
| 005 | 19980917 | ||
| 007 | t | ||
| 008 | 980917s1997 ad||j |||| 00||| eng d | ||
| 035 | |a (OCoLC)632511632 | ||
| 035 | |a (DE-599)BVBBV012157275 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 111 | 2 | |a ESREF |n 8 |d 1997 |c Arcachon |j Verfasser |0 (DE-588)5262587-4 |4 aut | |
| 245 | 1 | 0 | |a Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis |b ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France |c ed. by N. Labat ... |
| 264 | 1 | |a Oxford |b Pergamon |c 1997 | |
| 300 | |a X, S. 1421 - 1798, II S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Microelectronics and reliability |v 37,10/11 | |
| 500 | |a Einzelaufnahme eines Zeitschr.-H. | ||
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronisches Gerät |0 (DE-588)4127635-8 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1997 |z Bordeaux |2 gnd-content | |
| 689 | 0 | 0 | |a Elektronisches Gerät |0 (DE-588)4127635-8 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Labat, Nathalie |e Sonstige |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008235419 | ||
Record in the Search Index
| _version_ | 1804126768162930688 |
|---|---|
| any_adam_object | |
| author_corporate | ESREF Arcachon |
| author_corporate_role | aut |
| author_facet | ESREF Arcachon |
| author_sort | ESREF Arcachon |
| building | Verbundindex |
| bvnumber | BV012157275 |
| ctrlnum | (OCoLC)632511632 (DE-599)BVBBV012157275 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01347nam a2200349 cb4500</leader><controlfield tag="001">BV012157275</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19980917 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">980917s1997 ad||j |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)632511632</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV012157275</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">ESREF</subfield><subfield code="n">8</subfield><subfield code="d">1997</subfield><subfield code="c">Arcachon</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5262587-4</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis</subfield><subfield code="b">ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France</subfield><subfield code="c">ed. by N. Labat ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Oxford</subfield><subfield code="b">Pergamon</subfield><subfield code="c">1997</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">X, S. 1421 - 1798, II S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Microelectronics and reliability</subfield><subfield code="v">37,10/11</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zeitschr.-H.</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronisches Gerät</subfield><subfield code="0">(DE-588)4127635-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1997</subfield><subfield code="z">Bordeaux</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronisches Gerät</subfield><subfield code="0">(DE-588)4127635-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Labat, Nathalie</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-008235419</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1997 Bordeaux gnd-content |
| genre_facet | Konferenzschrift 1997 Bordeaux |
| id | DE-604.BV012157275 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:22:42Z |
| institution | BVB |
| institution_GND | (DE-588)5262587-4 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008235419 |
| oclc_num | 632511632 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | X, S. 1421 - 1798, II S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | Pergamon |
| record_format | marc |
| series2 | Microelectronics and reliability |
| spelling | ESREF 8 1997 Arcachon Verfasser (DE-588)5262587-4 aut Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France ed. by N. Labat ... Oxford Pergamon 1997 X, S. 1421 - 1798, II S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microelectronics and reliability 37,10/11 Einzelaufnahme eines Zeitschr.-H. Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Elektronisches Gerät (DE-588)4127635-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1997 Bordeaux gnd-content Elektronisches Gerät (DE-588)4127635-8 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Labat, Nathalie Sonstige oth |
| spellingShingle | Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France Zuverlässigkeit (DE-588)4059245-5 gnd Elektronisches Gerät (DE-588)4127635-8 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4127635-8 (DE-588)1071861417 |
| title | Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France |
| title_auth | Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France |
| title_exact_search | Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France |
| title_full | Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France ed. by N. Labat ... |
| title_fullStr | Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France ed. by N. Labat ... |
| title_full_unstemmed | Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France ed. by N. Labat ... |
| title_short | Proceedings of the 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis |
| title_sort | proceedings of the 8th european symposium on reliability of electron devices failure physics and analysis esref 97 7 10 octtober 1997 bordeaux france |
| title_sub | ESREF 97 ; 7 - 10 Octtober 1997, Bordeaux, France |
| topic | Zuverlässigkeit (DE-588)4059245-5 gnd Elektronisches Gerät (DE-588)4127635-8 gnd |
| topic_facet | Zuverlässigkeit Elektronisches Gerät Konferenzschrift 1997 Bordeaux |
| work_keys_str_mv | AT esrefarcachon proceedingsofthe8theuropeansymposiumonreliabilityofelectrondevicesfailurephysicsandanalysisesref97710octtober1997bordeauxfrance AT labatnathalie proceedingsofthe8theuropeansymposiumonreliabilityofelectrondevicesfailurephysicsandanalysisesref97710octtober1997bordeauxfrance |