Guidebook for managing silicon chip reliability:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boca Raton u.a.
CRC Press
1999
|
| Schriftenreihe: | Electronic packaging series
|
| Schlagworte: | |
| Beschreibung: | 214 S. graph. Darst. |
| ISBN: | 0849396247 |
Internformat
MARC
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| 035 | |a (OCoLC)39229671 | ||
| 035 | |a (DE-599)BVBBV012154192 | ||
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| 041 | 0 | |a eng | |
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| 100 | 1 | |a Pecht, Michael G. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Guidebook for managing silicon chip reliability |c Michael G. Pecht ; Riko Radojcic ; Gopal Rao |
| 264 | 1 | |a Boca Raton u.a. |b CRC Press |c 1999 | |
| 300 | |a 214 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Electronic packaging series | |
| 650 | 4 | |a Electronic packaging |x Reliability | |
| 650 | 4 | |a Integrated circuits |x Reliability | |
| 650 | 4 | |a Semiconductors |x Reliability | |
| 650 | 4 | |a Silicon | |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
| 689 | 0 | 1 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Radojcic, Riko |e Verfasser |4 aut | |
| 700 | 1 | |a Rao, Gopal |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-008232806 | ||
Datensatz im Suchindex
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| author | Pecht, Michael G. Radojcic, Riko Rao, Gopal |
| author_facet | Pecht, Michael G. Radojcic, Riko Rao, Gopal |
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| author_sort | Pecht, Michael G. |
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| building | Verbundindex |
| bvnumber | BV012154192 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4040 |
| ctrlnum | (OCoLC)39229671 (DE-599)BVBBV012154192 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV012154192 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:22:38Z |
| institution | BVB |
| isbn | 0849396247 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008232806 |
| oclc_num | 39229671 |
| open_access_boolean | |
| owner | DE-703 DE-858 DE-706 DE-634 DE-83 |
| owner_facet | DE-703 DE-858 DE-706 DE-634 DE-83 |
| physical | 214 S. graph. Darst. |
| publishDate | 1999 |
| publishDateSearch | 1999 |
| publishDateSort | 1999 |
| publisher | CRC Press |
| record_format | marc |
| series2 | Electronic packaging series |
| spelling | Pecht, Michael G. Verfasser aut Guidebook for managing silicon chip reliability Michael G. Pecht ; Riko Radojcic ; Gopal Rao Boca Raton u.a. CRC Press 1999 214 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Electronic packaging series Electronic packaging Reliability Integrated circuits Reliability Semiconductors Reliability Silicon Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Radojcic, Riko Verfasser aut Rao, Gopal Verfasser aut |
| spellingShingle | Pecht, Michael G. Radojcic, Riko Rao, Gopal Guidebook for managing silicon chip reliability Electronic packaging Reliability Integrated circuits Reliability Semiconductors Reliability Silicon Integrierte Schaltung (DE-588)4027242-4 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| subject_GND | (DE-588)4027242-4 (DE-588)4059245-5 |
| title | Guidebook for managing silicon chip reliability |
| title_auth | Guidebook for managing silicon chip reliability |
| title_exact_search | Guidebook for managing silicon chip reliability |
| title_full | Guidebook for managing silicon chip reliability Michael G. Pecht ; Riko Radojcic ; Gopal Rao |
| title_fullStr | Guidebook for managing silicon chip reliability Michael G. Pecht ; Riko Radojcic ; Gopal Rao |
| title_full_unstemmed | Guidebook for managing silicon chip reliability Michael G. Pecht ; Riko Radojcic ; Gopal Rao |
| title_short | Guidebook for managing silicon chip reliability |
| title_sort | guidebook for managing silicon chip reliability |
| topic | Electronic packaging Reliability Integrated circuits Reliability Semiconductors Reliability Silicon Integrierte Schaltung (DE-588)4027242-4 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
| topic_facet | Electronic packaging Reliability Integrated circuits Reliability Semiconductors Reliability Silicon Integrierte Schaltung Zuverlässigkeit |
| work_keys_str_mv | AT pechtmichaelg guidebookformanagingsiliconchipreliability AT radojcicriko guidebookformanagingsiliconchipreliability AT raogopal guidebookformanagingsiliconchipreliability |