Modern developments and applications in microbeam analysis:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | German |
| Veröffentlicht: |
Wien ; New York
Springer
1998
|
| Schriftenreihe: | [Mikrochimica acta / Supplementum]
15 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XI, 392 S. Ill., graph. Darst. |
| ISBN: | 3211831061 |
Internformat
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Datensatz im Suchindex
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| adam_text | INHALTSVERZEICHNIS
STATHAM, P. J.
RECENT DEVELOPMENTS IN INSTRUMENTATION FOR X-RAY MICROANALYSIS
S. 1-
STRUEDER, L. / FIORINI, C. / GATTI, E. / HARTMANN, R. / HOLL, P. /
KRAUSE, N. / LECHNER, P. / LONGONI, A. / LUTZ, G. / KEMMER, J.
HIGH RESOLUTION NON DISPERSIVE X-RAY SPECTROSCOPY WITH STATE OF THE ART
SILICON DETECTORS
S. 11-
ROEHRBACHER, K. / ANDRAE, M. / VOELKERER, M. / WERNISCH, J.
EFFICIENCY CALIBRATION OF A SI(LI) DETECTOR BY EPMA
S. 21-
REED, S. J. B.
WAVELENGTH-DISPERSIVE X-RAY SPECTROMETRY
S. 29-
TITCHMARSH, J. M.
X-RAY SPECTRUM PROCESSING AND MULTIVARIATE ANALYSIS
S. 37-
WILLIAMS, D. B. / WATANABE, M. / CARPENTER, D. T.
THIN FILM ANALYSIS AND CHEMICAL MAPPING IN THE ANALYTICAL ELECTRON
MICROSCOPE
S. 49-
ARMIGLIATO, A. / HOWARD, D. J. / BALBONI, R. / FRABBONI, S. / CAYMAX, M.
R.
ON THE SPATIAL RESOLUTION IN ANALYTICAL ELECTRON MICROSCOPY
S. 59-
LABAR, J. L. / ADAMIK, M. / DODONY, I.
CONTAMINATION IN ANALYTICAL ELECTRON MICROSCOPY AND IN ALCHEMI
S. 65-
ZIBA, P.
ANALYTICAL ELECTRON MICROSCOPY OF DIFFUSIONAL INTERFACES IN AN AL-22 AT.
% ZN ALLOY
S. 73-
DRAI, G. / MALI, B. / KOSEC, M.
QUANTITATIVE TEM-EDXS OF SOL-GEL DERIVED PZT CERAMIC MATERIALS
S. 77-
FARYNA, M. / LITYSKA, L. / HABERKO, K. / PDZICH, Z. / BABIARZ, J.
PARTICULATE COMPOSITES OF TZP-CHROMIUM OXIDE AND TZP-CHROMIUM CARBIDE;
MICROBEAM INVESTIGATIONS
S. 83-
OLESHKO, V. P. / GIJBELS, R. H. / JACOB, W. A. / VAN DAELE, A. J.
CRYO-ELECTRON SPECTROSCOPIC IMAGING, ELECTRON ENERGY-LOSS SPECTROSCOPY
AND ENERGY-DISPERSIVE X-RAY ANALYSIS OF AG(BR, I) NANO- AND
MICROCRYSTALS
S. 87-
LEVIN, I. / BERNER, A. / SCHEU, C. / MUELLEJANS, H. / BRANDON, D. G.
ELECTRON ENERGY-LOSS NEAR-EDGE STRUCTURE OF ALUMINA POLYMORPHS
S. 93-
FAN, Y. / FITZGERALD, A. G. / XU, H.
SPM STUDY OF YBCO FILMS PREPARED BY PLASMA ASSISTED LASER ABLATION
S. 97-
FITZGERALD, A. G. / FAN, Y. / XU, H.
SURFACE CHARACTERISATION AND MODIFICATION OF YBCO THIN FILMS BY STM
S. 101-
KARDUCK, P.
QUANTITATIVE NEAR-SURFACE MICROANALYSIS AND DEPTH PROFILING BY EPMA
S. 109-
RICHTER, S. / LESCH, N. / KARDUCK, P.
EPMA SPUTTER DEPTH PROFILING, PART I: THEORY AND EVALUATION
S. 125-
LESCH, N. / RICHTER, S. / KARDUCK, P.
EPMA SPUTTER DEPTH PROFILING, PART II: EXPERIMENT
S. 133-
WILLICH, P. / WISCHMANN, U.
QUANTITATIVE ANALYSIS OF BN (C, O, AR, H)-COATINGS USING EPMA AND SIMS
S. 141-
RICKERBY, D. G. / WAECHTER, N. / REICHELT, R.
QUANTITATIVE EDS ANALYSIS OF SIO2/AL2O3/TIO2 MULTILAYER FILMS
S. 149-
LLOVET, X. / MERLET, C. / SALVAT, F.
SURFACE IONIZATION OF THIN FILMS ON SUBSTRATES: MEASUREMENT AND
SIMULATION
S. 155-
ESSER, H. G. / KARDUCK, P. / RUBEL, M. / ALMQVIST, N. / GROBUSCH, L. /
VON SEGGERN, J. / WESCHENFELDER, F. / WIENHOLD, P.
COMPARISON OF DIFFERENT METHODS TO CHARACTERIZE THIN A-SI:H FILMS
S. 163-
HAMMER, H. / KULOW, S. / SCHMIDT, C. / SCHMIDT, G. / ZANEL, P.
EPMA STUDIES OF THE GROWTH OF THIN SURFACE COATINGS PRODUCED BY
EVAPORATION
S. 171-
OHLIDAL, I. / FRANTA, D. / HORA, J. / NAVRATIL, K. / WEBER, J. / JANDA,
P.
ANALYSIS OF THIN FILMS WITH SLIGHTLY ROUGH BOUNDARIES
S. 177-
GLOZMAN, O. / BERNER, A. / SHECHTMAN, D. / HOFFMAN, A.
EFFECT OF CHROMIUM SUBSTRATE PRETREATMENT ON DIAMOND GROWTH BY THE
CHEMICAL VAPOUR DEPOSITION METHOD
S. 181-
CHALDYSHEV, V. V. / TRETYAKOV, V. V.
EPMA DETERMINATION OF ARSENIC EXCESS IN LOW TEMPERATURE GROWN GAAS
S. 187-
BOTTOMLEY, P. D. W. / MONTIGNY, F. / STALIOS, A. D. / WALKER, C. T.
EPMA OF MELTED UO2 FUEL RODS FROM THE PHEBUS-FP REACTOR ACCIDENT
EXPERIMENT
S. 191-
POELT, P. / FIAN, A.
STEELS, CARBON CONCENTRATION, AND MICROHARDNESS
S. 201-
ELECHOWER, M. / SMOKA, D. / JABOSKA, M. / DYTKOWICZ, A.
DETERMINATION OF CHEMICAL AND PHASE COMPOSITION OF FLY-ASHES BY COMBINED
EPMA AND XRD METHODS
S. 207-
TRETYAKOV, V. V. / ROMANOV, S. G. / FOKIN, A. V. / ALPEROVICH, V. I.
EPMA OF THE COMPOSITION OF OPAL-BASED NANOSTRUCTURED MATERIALS
S. 211-
SANTO, A. P. / BOMPAROLA, R. M.
NDIC AND EMP STUDY OF PLAGIOCLASE MINERAL ZONING: AN EXAMPLE FROM NEA
KAMENI LAVAS
S. 219-
BORGHI, A. / COSSIO, R. / OLMI, F. / VAGGELLI, G.
COMPOSITIONAL X-RAY MAPS OF METAMORPHIC AND MAGMATIC MINERALS
S. 227-
HACHMANN, W. / TIETZ, G.
CHEMICAL MAPPING OF WEATHERING STAGES IN LATERITES
S. 237-
LAPUTINA, I. P. / BATYREV, V. A.
ELECTRON MICROPROBE DETERMINATION OF MINOR AND TRACE CONCENTRATIONS OF
GOLD AND PLATINUM GROUP ELEMENTS IN SULPHIDES AND SULPHARSENIDES:
PROBLEMS, SOLUTIONS, AND APPLICATIONS
S. 247-
JANSSENS, K. H. / DERAEDT, I. / SCHALM, O. / VEECKMAN, J.
COMPOSITION OF 1517TH CENTURY ARCHAEOLOGICAL GLASS VESSELS EXCAVATED IN
ANTWERP, BELGIUM
S. 253-
JUREK, K. / GEDEON, O. / HULINSKY, V.
POTASSIUM MIGRATION IN SILICA GLASS DURING ELECTRON BEAM IRRADIATION
S. 269-
MARSHALL, A. T.
X-RAY MICROANALYSIS OF FROZEN-HYDRATED BIOLOGICAL BULK SAMPLES
S. 273-
SIGEE, D. C.
ENVIRONMENTAL SEM AND X-RAY MICROANALYSIS OF BIOLOGICAL MATERIALS
S. 283-
MATHIEU, C.
EFFECTS OF ELECTRON-BEAM/GAS INTERACTIONS ON X-RAY MICROANALYSIS IN THE
VARIABLE PRESSURE SEM
S. 295-
GEDEON, O. / HULINSKY, V. / JUREK, K.
THE ANALYTICAL SIGNAL IN EPMA AND THE INFLUENCE OF THE ELECTRIC FIELD
CREATED BY THE PRIMARY BEAM
S. 301-
WERNISCH, J. / ROEHRBACHER, K.
STANDARDLESS ANALYSIS
S. 307-
VOELKERER, M. / ANDRAE, M. / ROEHRBACHER, K. / WERNISCH, J.
A NEW TECHNIQUE FOR STANDARDLESS ANALYSIS BY EPMA-TWIX
S. 317-
LOSIC, B. I. / TABAK, F. A.
STOPPING POWER FACTOR FOR STANDARDLESS QEPMA
S. 321-
EL-GOMATI, M. M. / ASSAD, A. M. D.
ON THE MEASUREMENT OF THE BACKSCATTERING COEFFICIENT FOR LOW ENERGY
ELECTRONS
S. 325-
EL-GOMATI, M. M. / ASSAD, A. M. D.
MONTE CARLO SIMULATIONS OF EDGE ARTEFACTS IN MULSAM IMAGES
S. 333-
STARY, V.
ASSESSMENT OF THE INELASTIC SCATTERING MODEL IN MONTE-CARLO SIMULATIONS
S. 341-
FITZGERALD, A. G.
A RAPID COMPARISON OF MATRIX CORRECTIONS IN AES AND XPS BY MEANS OF
COMPUTER PROGRAMS
S. 351-
MITI, V. V. / KOCI, L. M. / MILJKOVI, M. / PETKOVI, I.
FRACTALS AND BATIO3-CERAMIC MICROSTRUCTURE ANALYSIS
S. 365-
BEKKERMAN, A. D. / DZHEMILEV, N. K. / VERKHOTUROV, S. V. / VERYOVKIN, I.
V. / ADRIAENS, A.
FRAGMENTATION OF SPUTTERED CLUSTER IONS OF TRANSITION METALS:
DISTRIBUTIONS OF LIFETIMES AND INTERNAL ENERGIES
S. 371-
BELYKH, S. F. / RASULEV, U. K. / SAMARTSEV, A. V. / VERKHOTUROV, S. V. /
VERYOVKIN, I. V.
SPUTTERING OF TANTALUM BY ATOMIC AND MOLECULAR GOLD IONS: COMPARATIVE
STUDY OF YIELDS AND KINETIC ENERGY DISTRIBUTIONS OF ATOMIC AND CLUSTER
IONS
S. 379-
BOENKE, A.
THE STANDARDS, MEASUREMENTS AND TESTING PROGRAMME (SMT), THE EUROPEAN
SUPPORT TO STANDARDISATION, MEASUREMENTS AND TESTING PROJECTS
S. 387-
INHALTSVERZEICHNIS ALS PDF
2000- OESTERR. BIBLIOTHEKENVERBUND & SERVICE GMBH [HTML 4.0 /
GENERATED: 2008.06.16]
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| spelling | Modern developments and applications in microbeam analysis ed. by G. Love ... Wien ; New York Springer 1998 XI, 392 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier [Mikrochimica acta / Supplementum] 15 Electron microscopy Congresses Electron probe microanalysis Congresses Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content (DE-588)1071861417 Konferenzschrift gnd-content Elektronenstrahlmikroanalyse (DE-588)4151898-6 s DE-604 Love, Glyn Sonstige oth Supplementum] [Mikrochimica acta 15 (DE-604)BV011053038 15 OEBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008169163&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
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| title | Modern developments and applications in microbeam analysis |
| title_auth | Modern developments and applications in microbeam analysis |
| title_exact_search | Modern developments and applications in microbeam analysis |
| title_full | Modern developments and applications in microbeam analysis ed. by G. Love ... |
| title_fullStr | Modern developments and applications in microbeam analysis ed. by G. Love ... |
| title_full_unstemmed | Modern developments and applications in microbeam analysis ed. by G. Love ... |
| title_short | Modern developments and applications in microbeam analysis |
| title_sort | modern developments and applications in microbeam analysis |
| topic | Electron microscopy Congresses Electron probe microanalysis Congresses Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| topic_facet | Electron microscopy Congresses Electron probe microanalysis Congresses Elektronenstrahlmikroanalyse Aufsatzsammlung Konferenzschrift |
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