High resolution x-ray diffractometry and topography:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London [u.a.]
Taylor & Francis
1998
|
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | X, 252 S. Ill., graph. Darst. |
| ISBN: | 0850667585 |
Internformat
MARC
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| 650 | 7 | |a Rayons X |2 ram | |
| 650 | 4 | |a Crystals | |
| 650 | 4 | |a X-ray crystallography | |
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Datensatz im Suchindex
| _version_ | 1804126652747218944 |
|---|---|
| adam_text | Titel: High resolution x-ray diffractometry and topography
Autor: Bowen, David Keith
Jahr: 1998
Contents
Preface ix
1 Introduction: Diffraction Studies of Crystal Perfection 1
1.1 The response of a crystal to a plane wave 2
1.2 Comparison of radiations for diffraction 6
1.3 Comparison of surface analytic techniques 7
1.4 High resolution X-ray diffractometry 7
1.5 Triple-axis diffractometry 9
1.6 X-ray topography 11
1.7 Summary 13
References 13
2 High Resolution X-ray Diffraction Techniques 14
2.1 Limitations of single-axis diffraction 14
2.2 X-ray sources 15
2.3 High resolution systems 18
2.4 The duMond diagram 19
2.5 Beam conditioners 25
2.6 Aberrations in high resolution diffractometry 36
2.7 Detectors 43
2.8 Setting up a high resolution experiment 46
2.9 Summary 48
References 48
3 Analysis of Epitaxial Layers 50
3.1 Introduction 50
3.2 Plane wave diffraction from heteroepilayers 50
3.3 Selection of experimental conditions 52
3.4 Derivation of layer parameters 54
3.5 Summary 67
References 68
Contents
4 X-ray Scattering Theory 69
4.1 Introduction 69
4.2 Kinematical theory 70
4.3 Dynamical theory 79
4.4 Scattering in imperfect crystals 96
4.5 Formulae for rocking curve widths, profiles and intensities 98
4.6 Summary 105
References 105
5 Simulation of X-ray Diffraction Rocking Curves 106
5.1 Introduction 106
5.2 Numerical solution procedures 108
5.3 Matching an experimental measurement 112
5.4 Limitations of the simulation approach 114
5.5 Examples of simulations 116
5.6 Summary 125
References 126
6 Analysis of Thin Films and Multiple Layers 127
6.1 Review of rocking curves from thick layers 127
6.2 Thin single layers 129
6.3 Graded thick layers 131
6.4 Bragg case interferometers 132
6.5 Superlattices 136
6.6 General characteristics of large repeat superlattices 139
6.7 Summary 147
References 148
7 Triple-axis X-ray Diffractometry 149
7.1 Introduction 149
7.2 Instrumentation 149
7.3 Setting up a triple-axis experiment 152
7.4 Separation of lattice tilts and strains 153
7.5 Measurement of kinematical scattering from a defective surface 154
7.6 Measurement of distorted specimens 154
7.7 Full reciprocal space mapping 157
7.8 Applications of reciprocal space mapping 162
7.9 Summary 170
References 170
8 Single-crystal X-ray Topography 172
8.1 Introduction 172
8.2 Contrast mechanisms 173
8.3 The Berg-Barrett technique 174
8.4 Lang topography 176
8.5 Experimental procedures for taking Lang topographs 177
8.6 Topographic resolution 179
8.7 Contrast on X-ray topographs 183
vi
Contents
8.8 Theoretical tools for the interpretation of X-ray
topograph contrast 189
8.9 Dislocation and stacking fault images in X-ray topographs 196
8.10 Summary 205
References 205
9 Double-crystal X-ray Topography 207
9.1 Introduction 207
9.2 Principles and experimental geometries 207
9.3 Defect contrast in double-crystal topographs 210
9.4 Spatial resolution 213
9.5 Synchrotron radiation double-crystal topography 214
9.6 Applications of double-axis topography 215
9.7 Summary 220
References 220
10 Synchrotron Radiation Topography 221
10.1 Introduction 221
10.2 Synchrotron radiation sources 221
10.3 Source requirements for synchrotron X-ray topography 224
10.4 Applicability of synchrotron radiation for X-ray topography 227
10.5 Techniques of synchrotron radiation topography 230
10.6 Summary 248
References 248
Index 250
vu
|
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| illustrated | Illustrated |
| indexdate | 2024-07-09T18:20:52Z |
| institution | BVB |
| isbn | 0850667585 |
| language | English |
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| physical | X, 252 S. Ill., graph. Darst. |
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| spelling | Bowen, David Keith 1940- Verfasser (DE-588)13163156X aut High resolution x-ray diffractometry and topography D. Keith Bowen and Brian K. Tanner London [u.a.] Taylor & Francis 1998 X, 252 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Cristallographie ram Radiocristallographie ram Rayons X - Diffraction ram Rayons X ram Crystals X-ray crystallography X-rays Diffraction Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 s Hochauflösendes Verfahren (DE-588)4287503-1 s DE-604 Tanner, Brian K. Verfasser aut HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=008159280&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Bowen, David Keith 1940- Tanner, Brian K. High resolution x-ray diffractometry and topography Cristallographie ram Radiocristallographie ram Rayons X - Diffraction ram Rayons X ram Crystals X-ray crystallography X-rays Diffraction Hochauflösendes Verfahren (DE-588)4287503-1 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| subject_GND | (DE-588)4287503-1 (DE-588)4336833-5 |
| title | High resolution x-ray diffractometry and topography |
| title_auth | High resolution x-ray diffractometry and topography |
| title_exact_search | High resolution x-ray diffractometry and topography |
| title_full | High resolution x-ray diffractometry and topography D. Keith Bowen and Brian K. Tanner |
| title_fullStr | High resolution x-ray diffractometry and topography D. Keith Bowen and Brian K. Tanner |
| title_full_unstemmed | High resolution x-ray diffractometry and topography D. Keith Bowen and Brian K. Tanner |
| title_short | High resolution x-ray diffractometry and topography |
| title_sort | high resolution x ray diffractometry and topography |
| topic | Cristallographie ram Radiocristallographie ram Rayons X - Diffraction ram Rayons X ram Crystals X-ray crystallography X-rays Diffraction Hochauflösendes Verfahren (DE-588)4287503-1 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| topic_facet | Cristallographie Radiocristallographie Rayons X - Diffraction Rayons X Crystals X-ray crystallography X-rays Diffraction Hochauflösendes Verfahren Röntgendiffraktometrie |
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