Schroder, D. K. (1998). Semiconductor material and device characterization (2. ed.). Wiley.
Chicago Style (17th ed.) CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. 2. ed. New York [u.a.]: Wiley, 1998.
MLA (9th ed.) CitationSchroder, Dieter K. Semiconductor Material and Device Characterization. 2. ed. Wiley, 1998.
Warning: These citations may not always be 100% accurate.