Semiconductor material and device characterization:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Wiley
1998
|
| Ausgabe: | 2. ed. |
| Schlagworte: | |
| Beschreibung: | XXIV, 760 S. Ill., graph. Darst. |
| ISBN: | 0471241393 |
Internformat
MARC
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| 100 | 1 | |a Schroder, Dieter K. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Semiconductor material and device characterization |c Dieter K. Schroder |
| 250 | |a 2. ed. | ||
| 264 | 1 | |a New York [u.a.] |b Wiley |c 1998 | |
| 300 | |a XXIV, 760 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 650 | 7 | |a Semiconducteurs |2 ram | |
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Datensatz im Suchindex
| _version_ | 1804126652721004544 |
|---|---|
| any_adam_object | |
| author | Schroder, Dieter K. |
| author_facet | Schroder, Dieter K. |
| author_role | aut |
| author_sort | Schroder, Dieter K. |
| author_variant | d k s dk dks |
| building | Verbundindex |
| bvnumber | BV012055544 |
| callnumber-first | Q - Science |
| callnumber-label | QC611 |
| callnumber-raw | QC611 |
| callnumber-search | QC611 |
| callnumber-sort | QC 3611 |
| callnumber-subject | QC - Physics |
| classification_rvk | UP 2800 UP 3100 ZN 4800 |
| classification_tum | ELT 300f ELT 072f |
| ctrlnum | (OCoLC)38130720 (OCoLC)245843290 (DE-599)BVBBV012055544 |
| dewey-full | 621.3815/2 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/2 |
| dewey-search | 621.3815/2 |
| dewey-sort | 3621.3815 12 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 2. ed. |
| format | Book |
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| id | DE-604.BV012055544 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:20:52Z |
| institution | BVB |
| isbn | 0471241393 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008159265 |
| oclc_num | 38130720 245843290 |
| open_access_boolean | |
| owner | DE-29T DE-703 DE-20 DE-1050 DE-91 DE-BY-TUM DE-898 DE-BY-UBR DE-91G DE-BY-TUM DE-634 |
| owner_facet | DE-29T DE-703 DE-20 DE-1050 DE-91 DE-BY-TUM DE-898 DE-BY-UBR DE-91G DE-BY-TUM DE-634 |
| physical | XXIV, 760 S. Ill., graph. Darst. |
| publishDate | 1998 |
| publishDateSearch | 1998 |
| publishDateSort | 1998 |
| publisher | Wiley |
| record_format | marc |
| spelling | Schroder, Dieter K. Verfasser aut Semiconductor material and device characterization Dieter K. Schroder 2. ed. New York [u.a.] Wiley 1998 XXIV, 760 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiter (DE-588)4022993-2 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Halbleiterschaltung (DE-588)4158811-3 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Halbleiterschaltung (DE-588)4158811-3 s Prüftechnik (DE-588)4047610-8 s DE-604 Halbleiter (DE-588)4022993-2 s Halbleiterwerkstoff (DE-588)4158817-4 s Halbleiterbauelement (DE-588)4113826-0 s |
| spellingShingle | Schroder, Dieter K. Semiconductor material and device characterization Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiter (DE-588)4022993-2 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Halbleiterschaltung (DE-588)4158811-3 gnd Prüftechnik (DE-588)4047610-8 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4158817-4 (DE-588)4158811-3 (DE-588)4047610-8 (DE-588)4113826-0 |
| title | Semiconductor material and device characterization |
| title_auth | Semiconductor material and device characterization |
| title_exact_search | Semiconductor material and device characterization |
| title_full | Semiconductor material and device characterization Dieter K. Schroder |
| title_fullStr | Semiconductor material and device characterization Dieter K. Schroder |
| title_full_unstemmed | Semiconductor material and device characterization Dieter K. Schroder |
| title_short | Semiconductor material and device characterization |
| title_sort | semiconductor material and device characterization |
| topic | Semiconducteurs ram Semiconductors Semiconductors Testing Halbleiter (DE-588)4022993-2 gnd Halbleiterwerkstoff (DE-588)4158817-4 gnd Halbleiterschaltung (DE-588)4158811-3 gnd Prüftechnik (DE-588)4047610-8 gnd Halbleiterbauelement (DE-588)4113826-0 gnd |
| topic_facet | Semiconducteurs Semiconductors Semiconductors Testing Halbleiter Halbleiterwerkstoff Halbleiterschaltung Prüftechnik Halbleiterbauelement |
| work_keys_str_mv | AT schroderdieterk semiconductormaterialanddevicecharacterization |