Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures: Strasbourg, France, June 16 - 20, 1997
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Amsterdam u.a.
Elsevier
1998
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Schriftenreihe: | Thin solid films
319 |
Schlagworte: | |
Beschreibung: | Einzelaufn. eines Zeitschr.-Heftes |
Beschreibung: | VII, 223 S. Ill., graph. Darst. |
Internformat
MARC
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245 | 1 | 0 | |a Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures |b Strasbourg, France, June 16 - 20, 1997 |c guest eds.: A. M. Rocher ... |
246 | 1 | 3 | |a Papers presented at the 1997 ICAM/E-MRS Spring Conference, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures |
246 | 1 | 3 | |a Papers presented at the 1997 ICAM/E-MRS Spring Conference, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures |
264 | 1 | |a Amsterdam u.a. |b Elsevier |c 1998 | |
300 | |a VII, 223 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a Thin solid films |v 319 | |
500 | |a Einzelaufn. eines Zeitschr.-Heftes | ||
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689 | 1 | 1 | |a Röntgendiffraktometrie |0 (DE-588)4336833-5 |D s |
689 | 1 | |5 DE-604 | |
700 | 1 | |a Rocher, André M. |e Sonstige |4 oth | |
710 | 2 | |a European Materials Research Society |e Sonstige |0 (DE-588)5000064-0 |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-008139345 |
Datensatz im Suchindex
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any_adam_object | |
author_corporate | Symposium Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Straßburg |
author_corporate_role | aut |
author_facet | Symposium Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Straßburg |
author_sort | Symposium Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Straßburg |
building | Verbundindex |
bvnumber | BV012024595 |
ctrlnum | (OCoLC)633820052 (DE-599)BVBBV012024595 |
format | Conference Proceeding Book |
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genre | (DE-588)1071861417 Konferenzschrift 1997 Straßburg gnd-content |
genre_facet | Konferenzschrift 1997 Straßburg |
id | DE-604.BV012024595 |
illustrated | Illustrated |
indexdate | 2024-07-09T18:20:24Z |
institution | BVB |
institution_GND | (DE-588)5287637-8 (DE-588)5000064-0 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-008139345 |
oclc_num | 633820052 |
open_access_boolean | |
owner | DE-384 DE-706 |
owner_facet | DE-384 DE-706 |
physical | VII, 223 S. Ill., graph. Darst. |
publishDate | 1998 |
publishDateSearch | 1998 |
publishDateSort | 1998 |
publisher | Elsevier |
record_format | marc |
series2 | Thin solid films |
spelling | Symposium Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures 1997 Straßburg Verfasser (DE-588)5287637-8 aut Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Strasbourg, France, June 16 - 20, 1997 guest eds.: A. M. Rocher ... Papers presented at the 1997 ICAM/E-MRS Spring Conference, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Amsterdam u.a. Elsevier 1998 VII, 223 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Thin solid films 319 Einzelaufn. eines Zeitschr.-Heftes Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1997 Straßburg gnd-content Dünne Schicht (DE-588)4136925-7 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Röntgendiffraktometrie (DE-588)4336833-5 s Rocher, André M. Sonstige oth European Materials Research Society Sonstige (DE-588)5000064-0 oth |
spellingShingle | Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Strasbourg, France, June 16 - 20, 1997 Elektronenmikroskopie (DE-588)4014327-2 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd Dünne Schicht (DE-588)4136925-7 gnd |
subject_GND | (DE-588)4014327-2 (DE-588)4336833-5 (DE-588)4136925-7 (DE-588)1071861417 |
title | Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Strasbourg, France, June 16 - 20, 1997 |
title_alt | Papers presented at the 1997 ICAM/E-MRS Spring Conference, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures |
title_auth | Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Strasbourg, France, June 16 - 20, 1997 |
title_exact_search | Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Strasbourg, France, June 16 - 20, 1997 |
title_full | Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Strasbourg, France, June 16 - 20, 1997 guest eds.: A. M. Rocher ... |
title_fullStr | Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Strasbourg, France, June 16 - 20, 1997 guest eds.: A. M. Rocher ... |
title_full_unstemmed | Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures Strasbourg, France, June 16 - 20, 1997 guest eds.: A. M. Rocher ... |
title_short | Papers presented at the European Materials Research Society 1997 Spring Meeting, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures |
title_sort | papers presented at the european materials research society 1997 spring meeting symposium c recent developments in electron microscopy and x ray diffraction of thin film structures strasbourg france june 16 20 1997 |
title_sub | Strasbourg, France, June 16 - 20, 1997 |
topic | Elektronenmikroskopie (DE-588)4014327-2 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd Dünne Schicht (DE-588)4136925-7 gnd |
topic_facet | Elektronenmikroskopie Röntgendiffraktometrie Dünne Schicht Konferenzschrift 1997 Straßburg |
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