3rd IEEE International Mixed Signal Testing Workshop: June 3 - 6, 1997, Seattle, Washington, USA
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| Format: | Tagungsbericht Buch |
| Sprache: | English |
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1997
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| Beschreibung: | 205 S. graph. Darst. 1 Beil. |
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| adam_text | TABLE OF CONTENTS SESSION 1: FAULT MODELING AND DIAGNOSIS 1 MODERATOR:
M. OHLETZ (UNIV. OF HANNOVER, GERMANY) 1.1 FAULT DIAGNOSIS OF LARGE
SCALE ANALOG CIRCUITS BASED ON SYMBOLIC METHOD 3 T. WEI, M.W.T. WONG,
Y.S. LEE (HONG KONG POLYTECHNIC UNIV., HK) 1.2 DEVELOPMENT OFHDL-A
MODELED TEST PROGRAMS FOR FAULT DIAGNOSIS OF 9 ANALOG/MIXED-SIGNAL
CIRCUITS W.H. HUANG, C.-L. WEY (MICHIGAN STATE UNIV., USA) 1.3 ANALOG
FAULT DIAGNOSIS FOR UNPOWERED CIRCUIT BOARDS 15 J.-L.HUANG AND K.T.
CHENG (UNIV. OF CALIFORNIA, SANTA BARBARA, USA) 1.4 USING SABER/VERILOG
AND IMAGE EXCHANGE MIXED-SIGNAL FAULT SIMULATION TO REDUCE IC PRODUCT
TIME-TO-MARKET B. LYNCH, D. MAJERNIK, C. SIEGEL (ANALOGY, USA), B.
WEBSTER (TERADYNE, USA) 1.5P HIERARCHICAL APPROACH TO ANALOGUE FAULT
DIAGNOSIS 25 C.K. HO, P. SHEPHERD (BATH UNIV., UK), W. TENTEN, F.
EBERHARDT (ROBERT BOSCH GMBH, GERMANY) 1.6P A COMPARISON OF GLOBAL AND
LOCAL PARAMETRIC FAULT MODELS FOR ANALOGUE CIRCUITS 31 A. MILNE, D.
TAYLOR (UNIV. OF HUDDERSFIELD, UK) 1.7P MINIMUM OBSERVABLE SIGNAL
VARIATION: A NEW MIXED-SIGNAL FAULT MODEL R. RAMADOSS, M.L. BUSHNELL
(RUTGERS UNIV., USA), V.D. AGRAWAL (LUCENT TECHNOLOGIES, USA) SESSION 2:
FAULT SIMULATION 40 MODERATOR: M. RENOVELL (LIRMM, FRANCE) 2.1
CONCURRENT ANALOGUE FAULT SIMULATION 42 M. ZWOLINSKI, A.D. BROWN, CD.
CHALK (UNIV. OF SOUTHAMPTON, UK) 2.2 FAULT SIMULATION REDUCTION THROUGH
OUT-OF-BAND RANGE DEFINITION FOR FUNCTIONAL BLOCKS OF ANALOG AND
MIXED-SIGNAL CIRCUITS S. TABATABAEI, A. IVANOV, M. DALMIA (UNIV. OF
BRITISH COLUMBIA, CANADA) 2.3 HIERARCHICAL FAULT SIMULATION OF FEEDBACK
EMBEDDED ANALOG CIRCUITS WITH 48 APPROXIMATELY LINEAR TO QUADRATIC
SPEEDUP R.VOORAKARANAM, A.V. GOMES, S. CHERUBAL, A. CHATTERJEE (GEORGIA
INST. OF TECHNOLOGY, USA) 2.4 A PERTURBATION BASED FAULT MODELING AND
SIMULATION FOR MIXED-SIGNAL CIRCUITS N. BEN-HAMIDA, K. SAAB, D. MARCHE,
B. KAMINSKA (OPMAXX, USA) SESSION 3: DESIGN FOR TEST 60 MODERATOR: B.
COURTOIS (TTMA, FRANCE) 3.1 FLASH A/D CONVERTERS - DESIGN FOR
TESTABILITY 62 R. RAMADOSS, M.L. BUSHNELL (RUTGERS UNIV., USA) 3.2
EFFICIENT TESTABILITY DESIGN METHODOLOGIES FOR ANALOG/MIXED-SIGNAL
INTEGRATED 68 CIRCUITS C.-P. WANG, C.-L. WEY (MICHIGAN STATE UNIV., USA)
3.3 TOWARDS REALISTIC FAULTS PREDICTION AND LAYOUT DESIGN FOR
TESTABILITY IN ANALOG 75 CIRCUITS J.A. PRIETO, A. RUEDA, E. PERALIAS, I.
GROUT, J.-L. HUERTAS (CNM SEVILLE, SPAIN, AND UNIV. OF LANCASTER, UK)
3.4 INTEGRATION OFDFT TECHNOLOGY INTO THE DESIGN ENVIRONMENT FOR
MIXED-SIGNAL INTEGRATED SYSTEMS A. RICHARDSON, Y. EBEN AIMINE, T.
OLBRICH (LANCASTER UNIV., UK) DEMO 1 MIXED-SIGNAL TEST SYSTEMS, IMS DEMO
2 MIXED-SIGNAL FAULT SIMULATION TOOLS, ANALOGY PANEL 1: TAMING THE
ANALOG FAULT SIMULATION 81 BEAST MODERATOR: J.A. ABRAHAM (UNIV. OF
TEXAS, USA) A. CHATTERJEE (GEORGIA INST. OF TECHNOLOGY, USA) B. KAMINSKA
(OPMAXX, USA) H. G. KERKHOFF (MESA RESEARCH INST., THE NETHERLANDS) B.
STRAUBE (FRAUNHOFER IIS, GERMANY) SESSION 4: TEST GENERATION 83
MODERATOR: M. LUBASZEWSKI (DELET/UFRGS, BRASIL) TUTORIAL 1: ANALOG HDL:
WHAT, WHY, AND HOW C.-J. SHI (UNIV. OF IOWA, USA) 4.1 TEST STIMULUS
GENERATION FOR STEADY-STATE ANALYSIS OF ANALOGUE AND MIXED-SIGNAL 85
CIRCUITS CD. CHALK, M. ZWOLINSKI, B.R. WILKINS (UNIV. OF SOUTHAMPTON,
UK) 4.2 TEST GENERATION FOR LINEAR, TIME-INVARIANT ANALOG CIRCUITS 93
C.-Y. PAN, K.-T. CHENG (UNIV. OF CALIFORNIA, SANTA BARBARA, USA) 4.3
TEST SIGNAL GENERATION USING SPECTRAL WARPING S. DEMIDENKO (SINGAPORE
POLYTECHNIC), V. PIURI (POLITECNICO DI MILANO, ITALY), V. YARMOLIK
(BELARUSIAN STATE UNIV.) 4.4P IC-LEVEL TESTABILITY FOR ANALOG MACROS 101
V. KAAL, H.G. KERKHOFF, J. HOLLEMA (MESA RESEARCH INST., THE
NETHERLANDS) 4.5P TESTABILITY IMPROVEMENT EVALUATION IN ANALOG
MULTI-CONFIGURATION DFT TECHNIQUE 106 F. AZAIS, M. RENOVELL, Y. BERTRANT
(LIRMM, FRANCE) SESSION 5: SYSTEM TEST AND TEST PLANNING 113 MODERATOR:
A. OSSEIRAN (ECOLE ING. DE GENEVE, SWITZERLAND) 5.1 TECHNIQUES FOR THE
GENERATION OF TEST ROUTINES FROM A HIGH-LEVEL DESCRIPTION 115 M. MIEGLER
(UNIV. OF ERLANGEN-NUERNBERG, GERMANY) 5.2 SYSTEM TESTING WITH AN
HIERARCHICAL APPROACH W.R. SIMPSON (INST. FOR DEFENSE ANALYSES, USA) 5.3
SIMULATOR-INDEPENDENT TEST PROGRAM VERIFICATION 122 M. GOLDBACH, W.
GLAUERT, T. SCHLAAFF, H. GRAMS (UNIV. OF ERLANGEN, GERMANY) 5.4
AUTOMATIC TEST PLAN GENERATION FOR MIXED-SIGNAL CIRCUITS IN AN
INTEGRATED DESIGN 126 AND TEST ENVIRONMENT N. ENGIN, H.G. KERKHOFF, R.
TANGELDER, H. SPEEK (MESA RESEARCH INST., THE NETHERLANDS) SESSION 6:
STATIC/DYNAMIC TESTING 132 MODERATOR: J. MIELKE (IMS, USA) 6.1 ANALOG
CIRCUIT TESTING WITH ADAPTIVE FILTER TECHNIQUES 134 L. CAIRO, M.
NEGREIROS (UNIV. FEDERAL DO RIO GRANDE DO SUL, BRASIL) 6.2 DETECTION OF
PARAMETRIC FAULTS IN MIXED-SIGNAL ICS BY OPERATING POINTS CHECKING H.
IHS, C. DUFAZA (LIRMM, FRANCE) 6.3 DYNAMIC TESTING OFADCS USING WAVELET
TRANSFORMS 144 T. YAMAGUCHI (ADVANTEST, JAPAN) 6.4 METRICS MEASUREMENT
BY MODELING THE CIRCUIT RESPONSE AS A STATE TRANSITION 148 PROBABILITY
MATRICES M. ZINEB, M. SLAMANI, M. BOUKADOUM (UNIV. DU QUEBEC A MONTREAL,
CANADA) 6.5P BEYOND FAULT COVERAGE: ESTIMATING TEST QUALITY COMPARING
TEST METHODOLOGIES OR 156 EVALUATING TESTABILITY S.J. SPINKS, I.M. BELL
(UNIV. OF HULL, UK) 6.6P A NEW ATPG TOOL FOR ANALOGUE AC-TESTING 162 M.
LUBASZEWSKI, E. FERNANDES COTA, E. DIDOMOMEGANICO (DELET/UFRGS, BRASU)
6.7P UNIFIED OFF- AND ON-LINE TESTING IN ANALOG CIRCUITS: CONCEPTS AND
PRACTICAL 169 DEMONSTRATOR D. VAZQUEZ, A. RUEDA, J.-L. HUERTAS, E.
PERALIAS (CNM SEVILLE, SPAIN) 6.8P POWER SUPPLY CURRENT MONITORING
TECHNIQUES FOR TESTING A VCO M. DALMIA, S. TABATABAEI, A. IVANOV (UNIV.
OF BRITISH COLUMBIA, CANADA) DEMO 1: MIXED-SIGNAL TEST SYSTEMS, IMS DEMO
2: MIXED-SIGNAL FAULT SIMULATION TOOLS, ANALOGY PANEL 2: PRACTICAL DFT
FOR MIXED-SIGNAL CIRCUITS 175 MODERATOR: J. FRANCA (I. SUPERIOR TECNICO,
PORTUGAL) K. LOFSTROM (KLIC, USA) W. TENTEN (BOSCH, GERMANY) J.-L.
HUERTAS (CNM SEVILLE, SPAIN) T. BOCEK (BOEING, USA) SESSION 7: BIST 177
MODERATOR: B. VLNNAKOTA (UNIV. OF MINNESOTA, USA) TUTORIAL 2:
MIXED-SIGNAL BIST: DOES INDUSTRY NEED IT? S. SUNTER (LOGICVISION,
CANADA) 7.1 A BIST TECHNIQUE FOR SIGMA-DELTA MODULATORS BASED ON CIRCUIT
RECONFIGURATION 179 S. MIR, A. RUEDA, J.-L. HUERTAS, V. IIBERALI (CNM
SEVILLE, SPAIN AND UNIV. PAVIA, ITALY) 7.2 A PRACTICAL AND LOW COST TEST
METHOD TO DESIGN RELIABLE IMPLANTABLE SYSTEMS K. ARABI, B. KAMINSKA
(OPMAXX, USA) 7.3 ENHANCING THE TESTABILITY OF TOTALLY-SELF-CHECKING
ANALOGUE CHECKERS 185 C.H. CHEE, I.M. BELL (UNIV. OF HULL, UK) 7.4
OPTICAL COMMUNICATION CHANNEL TEST USING THE BIST APPROACH M. GAGNON
(ECOLE POLY, DE MONTREAL, CANADA), B. KAMINSKA (OPMAXX, USA) SESSION 8:
MULTI-CHIP MODULES 193 MODERATOR: W. RUSSELL (AIR FORCE WRIGHT
LABORATORY/DARPA, USA) 8.1 MIXED-SIGNAL TESTING IN A SILICON-BASED MCM
195 H.G. KERKHOFF, G. BOOM, H. SPEEK (MESA RESEARCH INST, THE
NETHERLANDS) 8.2 RF TESTING OF MULTI-DROP NETS IN MCM SUBSTRATES 198
B.C. KIM (TUFTS UNIV., USA), A. CHATTERJEE, M. SWAMINATHAN (GEORGIA
INST. OF TECHNOLOGY, USA)
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| spelling | International Mixed Signal Testing Workshop 3 1997 Seattle, Wash. Verfasser (DE-588)1901436-3 aut 3rd IEEE International Mixed Signal Testing Workshop June 3 - 6, 1997, Seattle, Washington, USA [general chair: M. Soma] Third IEEE International Mixed Signal Testing Workshop S.l. 1997 205 S. graph. Darst. 1 Beil. txt rdacontent n rdamedia nc rdacarrier Mixed signal circuits Testing Congresses Testen (DE-588)4367264-4 gnd rswk-swf Hybridschaltung (DE-588)4026281-9 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1997 Seattle Wash. gnd-content Hybridschaltung (DE-588)4026281-9 s Testen (DE-588)4367264-4 s DE-604 Soma, M. Sonstige oth GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007963524&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | 3rd IEEE International Mixed Signal Testing Workshop June 3 - 6, 1997, Seattle, Washington, USA Mixed signal circuits Testing Congresses Testen (DE-588)4367264-4 gnd Hybridschaltung (DE-588)4026281-9 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4026281-9 (DE-588)1071861417 |
| title | 3rd IEEE International Mixed Signal Testing Workshop June 3 - 6, 1997, Seattle, Washington, USA |
| title_alt | Third IEEE International Mixed Signal Testing Workshop |
| title_auth | 3rd IEEE International Mixed Signal Testing Workshop June 3 - 6, 1997, Seattle, Washington, USA |
| title_exact_search | 3rd IEEE International Mixed Signal Testing Workshop June 3 - 6, 1997, Seattle, Washington, USA |
| title_full | 3rd IEEE International Mixed Signal Testing Workshop June 3 - 6, 1997, Seattle, Washington, USA [general chair: M. Soma] |
| title_fullStr | 3rd IEEE International Mixed Signal Testing Workshop June 3 - 6, 1997, Seattle, Washington, USA [general chair: M. Soma] |
| title_full_unstemmed | 3rd IEEE International Mixed Signal Testing Workshop June 3 - 6, 1997, Seattle, Washington, USA [general chair: M. Soma] |
| title_short | 3rd IEEE International Mixed Signal Testing Workshop |
| title_sort | 3rd ieee international mixed signal testing workshop june 3 6 1997 seattle washington usa |
| title_sub | June 3 - 6, 1997, Seattle, Washington, USA |
| topic | Mixed signal circuits Testing Congresses Testen (DE-588)4367264-4 gnd Hybridschaltung (DE-588)4026281-9 gnd |
| topic_facet | Mixed signal circuits Testing Congresses Testen Hybridschaltung Konferenzschrift 1997 Seattle Wash. |
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