Full-band Monte Carlo simulation of electrons and holes in strained Si and SiGe:
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Bibliographic Details
Main Author: Bufler, Fabian M. (Author)
Format: Book
Language:English
Published: München Utz, Wiss. 1998
Series:Elektrotechnik
Subjects:
Item Description:Zugl.: Bremen, Univ., Diss., 1997
Physical Description:VI, 178 S. Ill.
ISBN:3896752707

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