Proceedings: April 27 - May 1, 1997, Monterey, California
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Bibliographic Details
Corporate Author: VLSI Test Symposium Monterey, Calif (Author)
Format: Conference Proceeding Book
Language:English
Published: Los Alamitos, Calif. [u.a.] IEEE Computer Soc. Press 1997
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Physical Description:XXXII, 466 S. graph. Darst.
ISBN:0818678100

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