Proceedings: April 27 - May 1, 1997, Monterey, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. [u.a.]
IEEE Computer Soc. Press
1997
|
| Schlagworte: | |
| Beschreibung: | XXXII, 466 S. graph. Darst. |
| ISBN: | 0818678100 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV011716726 | ||
| 003 | DE-604 | ||
| 005 | 20051006 | ||
| 007 | t | ||
| 008 | 980114s1997 d||| |||| 10||| eng d | ||
| 020 | |a 0818678100 |9 0-8186-7810-0 | ||
| 035 | |a (OCoLC)36897887 | ||
| 035 | |a (DE-599)BVBBV011716726 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T |a DE-83 | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.3950287 |b Ie2d, 1997 |2 21 | |
| 084 | |a ZN 4030 |0 (DE-625)157339: |2 rvk | ||
| 111 | 2 | |a VLSI Test Symposium |n 15 |d 1997 |c Monterey, Calif. |j Verfasser |0 (DE-588)5254941-0 |4 aut | |
| 245 | 1 | 0 | |a Proceedings |b April 27 - May 1, 1997, Monterey, California |c 15th IEEE VLSI Test Symposium |
| 264 | 1 | |a Los Alamitos, Calif. [u.a.] |b IEEE Computer Soc. Press |c 1997 | |
| 300 | |a XXXII, 466 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing |v Congresses | |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1997 |z Monterey Calif. |2 gnd-content | |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007901239 | ||
Datensatz im Suchindex
| _version_ | 1804126254619688960 |
|---|---|
| any_adam_object | |
| author_corporate | VLSI Test Symposium Monterey, Calif |
| author_corporate_role | aut |
| author_facet | VLSI Test Symposium Monterey, Calif |
| author_sort | VLSI Test Symposium Monterey, Calif |
| building | Verbundindex |
| bvnumber | BV011716726 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4030 |
| ctrlnum | (OCoLC)36897887 (DE-599)BVBBV011716726 |
| dewey-full | 621.3950287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3950287 |
| dewey-search | 621.3950287 |
| dewey-sort | 3621.3950287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01345nam a2200373 c 4500</leader><controlfield tag="001">BV011716726</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20051006 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">980114s1997 d||| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818678100</subfield><subfield code="9">0-8186-7810-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)36897887</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV011716726</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3950287</subfield><subfield code="b">Ie2d, 1997</subfield><subfield code="2">21</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 4030</subfield><subfield code="0">(DE-625)157339:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">VLSI Test Symposium</subfield><subfield code="n">15</subfield><subfield code="d">1997</subfield><subfield code="c">Monterey, Calif.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5254941-0</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Proceedings</subfield><subfield code="b">April 27 - May 1, 1997, Monterey, California</subfield><subfield code="c">15th IEEE VLSI Test Symposium</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif. [u.a.]</subfield><subfield code="b">IEEE Computer Soc. Press</subfield><subfield code="c">1997</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XXXII, 466 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1997</subfield><subfield code="z">Monterey Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007901239</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1997 Monterey Calif. gnd-content |
| genre_facet | Konferenzschrift 1997 Monterey Calif. |
| id | DE-604.BV011716726 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:14:32Z |
| institution | BVB |
| institution_GND | (DE-588)5254941-0 |
| isbn | 0818678100 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007901239 |
| oclc_num | 36897887 |
| open_access_boolean | |
| owner | DE-29T DE-83 |
| owner_facet | DE-29T DE-83 |
| physical | XXXII, 466 S. graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | IEEE Computer Soc. Press |
| record_format | marc |
| spelling | VLSI Test Symposium 15 1997 Monterey, Calif. Verfasser (DE-588)5254941-0 aut Proceedings April 27 - May 1, 1997, Monterey, California 15th IEEE VLSI Test Symposium Los Alamitos, Calif. [u.a.] IEEE Computer Soc. Press 1997 XXXII, 466 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Integrated circuits Very large scale integration Testing Congresses VLSI (DE-588)4117388-0 gnd rswk-swf Testen (DE-588)4367264-4 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1997 Monterey Calif. gnd-content VLSI (DE-588)4117388-0 s Testen (DE-588)4367264-4 s DE-604 |
| spellingShingle | Proceedings April 27 - May 1, 1997, Monterey, California Integrated circuits Very large scale integration Testing Congresses VLSI (DE-588)4117388-0 gnd Testen (DE-588)4367264-4 gnd |
| subject_GND | (DE-588)4117388-0 (DE-588)4367264-4 (DE-588)1071861417 |
| title | Proceedings April 27 - May 1, 1997, Monterey, California |
| title_auth | Proceedings April 27 - May 1, 1997, Monterey, California |
| title_exact_search | Proceedings April 27 - May 1, 1997, Monterey, California |
| title_full | Proceedings April 27 - May 1, 1997, Monterey, California 15th IEEE VLSI Test Symposium |
| title_fullStr | Proceedings April 27 - May 1, 1997, Monterey, California 15th IEEE VLSI Test Symposium |
| title_full_unstemmed | Proceedings April 27 - May 1, 1997, Monterey, California 15th IEEE VLSI Test Symposium |
| title_short | Proceedings |
| title_sort | proceedings april 27 may 1 1997 monterey california |
| title_sub | April 27 - May 1, 1997, Monterey, California |
| topic | Integrated circuits Very large scale integration Testing Congresses VLSI (DE-588)4117388-0 gnd Testen (DE-588)4367264-4 gnd |
| topic_facet | Integrated circuits Very large scale integration Testing Congresses VLSI Testen Konferenzschrift 1997 Monterey Calif. |
| work_keys_str_mv | AT vlsitestsymposiummontereycalif proceedingsapril27may11997montereycalifornia |