Microelectronic systems: design, modelling and testing
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London [u.a.]
Arnold [u.a.]
1997
|
| Ausgabe: | 1. publ. |
| Schlagworte: | |
| Beschreibung: | XIV, 314 S. graph. Darst. |
| ISBN: | 0340677716 |
Internformat
MARC
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| 245 | 1 | 0 | |a Microelectronic systems |b design, modelling and testing |c W. Buchanan |
| 250 | |a 1. publ. | ||
| 264 | 1 | |a London [u.a.] |b Arnold [u.a.] |c 1997 | |
| 300 | |a XIV, 314 S. |b graph. Darst. | ||
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| 337 | |b n |2 rdamedia | ||
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| 650 | 7 | |a Microélectronique |2 ram | |
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| 650 | 4 | |a Microelectronics | |
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Datensatz im Suchindex
| _version_ | 1804126233897730048 |
|---|---|
| any_adam_object | |
| author | Buchanan, William J. |
| author_facet | Buchanan, William J. |
| author_role | aut |
| author_sort | Buchanan, William J. |
| author_variant | w j b wj wjb |
| building | Verbundindex |
| bvnumber | BV011695870 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4900 |
| ctrlnum | (OCoLC)37200255 (DE-599)BVBBV011695870 |
| dewey-full | 621.39/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5 |
| dewey-search | 621.39/5 |
| dewey-sort | 3621.39 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 1. publ. |
| format | Book |
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| id | DE-604.BV011695870 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:14:12Z |
| institution | BVB |
| isbn | 0340677716 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007887182 |
| oclc_num | 37200255 |
| open_access_boolean | |
| owner | DE-Aug4 |
| owner_facet | DE-Aug4 |
| physical | XIV, 314 S. graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | Arnold [u.a.] |
| record_format | marc |
| spelling | Buchanan, William J. Verfasser aut Microelectronic systems design, modelling and testing W. Buchanan 1. publ. London [u.a.] Arnold [u.a.] 1997 XIV, 314 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Microélectronique ram Integrated circuits Design and construction Microelectronics Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 s DE-604 |
| spellingShingle | Buchanan, William J. Microelectronic systems design, modelling and testing Microélectronique ram Integrated circuits Design and construction Microelectronics Mikroelektronik (DE-588)4039207-7 gnd |
| subject_GND | (DE-588)4039207-7 |
| title | Microelectronic systems design, modelling and testing |
| title_auth | Microelectronic systems design, modelling and testing |
| title_exact_search | Microelectronic systems design, modelling and testing |
| title_full | Microelectronic systems design, modelling and testing W. Buchanan |
| title_fullStr | Microelectronic systems design, modelling and testing W. Buchanan |
| title_full_unstemmed | Microelectronic systems design, modelling and testing W. Buchanan |
| title_short | Microelectronic systems |
| title_sort | microelectronic systems design modelling and testing |
| title_sub | design, modelling and testing |
| topic | Microélectronique ram Integrated circuits Design and construction Microelectronics Mikroelektronik (DE-588)4039207-7 gnd |
| topic_facet | Microélectronique Integrated circuits Design and construction Microelectronics Mikroelektronik |
| work_keys_str_mv | AT buchananwilliamj microelectronicsystemsdesignmodellingandtesting |