Failure mechanisms in semiconductor devices:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Chichester [u.a.]
Wiley
1997
|
| Ausgabe: | 2. ed. |
| Schlagworte: | |
| Beschreibung: | XII, 345 S. Ill., graph. Darst. |
| ISBN: | 0471954829 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV011582408 | ||
| 003 | DE-604 | ||
| 005 | 19971020 | ||
| 007 | t | ||
| 008 | 971020s1997 ad|| |||| 00||| eng d | ||
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| 082 | 0 | |a 621.3815 |2 21 | |
| 084 | |a ZN 4800 |0 (DE-625)157408: |2 rvk | ||
| 100 | 1 | |a Amerasekera, Ajith |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Failure mechanisms in semiconductor devices |c E. Ajith Amerasekera ; Farid N. Najm |
| 250 | |a 2. ed. | ||
| 264 | 1 | |a Chichester [u.a.] |b Wiley |c 1997 | |
| 300 | |a XII, 345 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Semiconductors - Failures | |
| 650 | 0 | 7 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Defekt |0 (DE-588)4202158-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Störstelle |0 (DE-588)4193400-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 0 | 1 | |a Defekt |0 (DE-588)4202158-3 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Halbleiterbauelement |0 (DE-588)4113826-0 |D s |
| 689 | 1 | 1 | |a Störstelle |0 (DE-588)4193400-3 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Najm, Farid N. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007800150 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804126109107748864 |
|---|---|
| any_adam_object | |
| author | Amerasekera, Ajith Najm, Farid N. |
| author_facet | Amerasekera, Ajith Najm, Farid N. |
| author_role | aut aut |
| author_sort | Amerasekera, Ajith |
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| building | Verbundindex |
| bvnumber | BV011582408 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.852 |
| callnumber-search | TK7871.852 |
| callnumber-sort | TK 47871.852 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | ZN 4800 |
| ctrlnum | (OCoLC)473423445 (DE-599)BVBBV011582408 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | 2. ed. |
| format | Book |
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| id | DE-604.BV011582408 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:12:13Z |
| institution | BVB |
| isbn | 0471954829 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007800150 |
| oclc_num | 473423445 |
| open_access_boolean | |
| owner | DE-703 DE-83 |
| owner_facet | DE-703 DE-83 |
| physical | XII, 345 S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | Wiley |
| record_format | marc |
| spelling | Amerasekera, Ajith Verfasser aut Failure mechanisms in semiconductor devices E. Ajith Amerasekera ; Farid N. Najm 2. ed. Chichester [u.a.] Wiley 1997 XII, 345 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Semiconductors - Failures Halbleiterbauelement (DE-588)4113826-0 gnd rswk-swf Defekt (DE-588)4202158-3 gnd rswk-swf Störstelle (DE-588)4193400-3 gnd rswk-swf Halbleiterbauelement (DE-588)4113826-0 s Defekt (DE-588)4202158-3 s DE-604 Störstelle (DE-588)4193400-3 s 1\p DE-604 Najm, Farid N. Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Amerasekera, Ajith Najm, Farid N. Failure mechanisms in semiconductor devices Semiconductors - Failures Halbleiterbauelement (DE-588)4113826-0 gnd Defekt (DE-588)4202158-3 gnd Störstelle (DE-588)4193400-3 gnd |
| subject_GND | (DE-588)4113826-0 (DE-588)4202158-3 (DE-588)4193400-3 |
| title | Failure mechanisms in semiconductor devices |
| title_auth | Failure mechanisms in semiconductor devices |
| title_exact_search | Failure mechanisms in semiconductor devices |
| title_full | Failure mechanisms in semiconductor devices E. Ajith Amerasekera ; Farid N. Najm |
| title_fullStr | Failure mechanisms in semiconductor devices E. Ajith Amerasekera ; Farid N. Najm |
| title_full_unstemmed | Failure mechanisms in semiconductor devices E. Ajith Amerasekera ; Farid N. Najm |
| title_short | Failure mechanisms in semiconductor devices |
| title_sort | failure mechanisms in semiconductor devices |
| topic | Semiconductors - Failures Halbleiterbauelement (DE-588)4113826-0 gnd Defekt (DE-588)4202158-3 gnd Störstelle (DE-588)4193400-3 gnd |
| topic_facet | Semiconductors - Failures Halbleiterbauelement Defekt Störstelle |
| work_keys_str_mv | AT amerasekeraajith failuremechanismsinsemiconductordevices AT najmfaridn failuremechanismsinsemiconductordevices |