Statistical test limits in quality control:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
1996
|
| Schriftenreihe: | Centrum voor Wiskunde en Informatica <Amsterdam>: CWI Tract
116 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | VI, 144 S. |
| ISBN: | 9061964695 |
Internformat
MARC
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| 245 | 1 | 0 | |a Statistical test limits in quality control |c G. D. Otten |
| 264 | 1 | |a Amsterdam |c 1996 | |
| 300 | |a VI, 144 S. | ||
| 336 | |b txt |2 rdacontent | ||
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| 490 | 1 | |a Centrum voor Wiskunde en Informatica <Amsterdam>: CWI Tract |v 116 | |
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| 650 | 4 | |a Quality control |x Statistical methods | |
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Datensatz im Suchindex
| _version_ | 1804126067049365504 |
|---|---|
| adam_text | Contents
Introduction 1
1 Test limits and consumer loss 3
1.1 The problem of finding correct test limits 4
1.2 Improvements in yield 7
1.3 Literature on test limits 7
1.4 Estimation of parameters and nonnormality 8
1.5 Test limits which allow for estimation 9
1.6 Outline of this book 9
2 Implementation in practice 11
2.1 Characteristic and measurement error are normally distributed . 13
2.2 The measurement error only is normally distributed 17
2.3 The characteristic only is normally distributed 20
2.4 Characteristic and measurement error have unknown distributions 27
3 The normal case 31
3.1 Introduction and notations 31
3.2 The case of known parameters 32
3.3 Numerical results 38
3.4 Estimation of parameters 40
3.4.1 Second order unbiased test limits 40
3.4.2 Test limits for which 7 is violated with small probability . 47
3.4.3 Choosing the number of observations 49
3.5 An application in semiconductor industry 51
3.6 Sampling schemes 53
4 Normality assumption on the measurement error only 55
4.1 The normal test limit under nonnormal distributions 56
4.2 Second order unbiased test limits based on density estimation . . 64
4.2.1 Deconvolution 64
4.2.2 Selecting estimators 65
4.2.3 Expansion of the consumer loss 66
iii
4.2.4 The correction term 68
4.2.5 Optimal rates of bandwidths 71
4.2.6 Choice of bandwidths 72
4.2.7 Numerical results 73
4.2.8 No observations in [s h, s + h] 75
4.2.9 Conclusions, recommendations 76
4.3 Test limits for which 7 is violated with small probability 76
5 A comparison between parametric density estimators and Rosen¬
blatt s estimator 79
5.1 Overview of the investigations 80
5.2 Set up and notations 80
5.3 Normal distribution 82
5.4 Exponential Power Distribution 86
5.5 Pearson system 88
5.6 Johnson system 90
5.7 Power transformation 92
5.8 Conclusions 94
5.A Appendix 95
5.A.I Regularity conditions on the parametric estimator .... 95
5.A.2 Maximum likelihood estimation in the exponential power
distribution 96
5. A.3 Estimators of the Johnson system 97
5.A.4 Estimators of the Box Cox model 99
6 Nonnormal measurement error 114
6.1 Preliminaries 114
6.2 Consumer loss under incorrect assumption of normality 116
6.3 Second order unbiased test limits 117
6.3.1 Definition of the test limit 117
6.3.2 Second order unbiased test limits if /% and /j. are known . 118
6.3.3 Simulation results 126
6.3.4 Generalization: estimation of fj. 128
6.3.5 Generalization: estimation of fg but fi known 131
6.3.6 Generalization: estimation of f^ and x 134
6.4 Test limits for which 7 is violated with small probability 139
6.5 An application in semiconductor industry 140
References 142
|
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| id | DE-604.BV011543645 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T18:11:33Z |
| institution | BVB |
| isbn | 9061964695 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007771193 |
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| physical | VI, 144 S. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| record_format | marc |
| series | Centrum voor Wiskunde en Informatica <Amsterdam>: CWI Tract |
| series2 | Centrum voor Wiskunde en Informatica <Amsterdam>: CWI Tract |
| spelling | Otten, G. D. Verfasser aut Statistical test limits in quality control G. D. Otten Amsterdam 1996 VI, 144 S. txt rdacontent n rdamedia nc rdacarrier Centrum voor Wiskunde en Informatica <Amsterdam>: CWI Tract 116 Kwaliteitscontrole gtt Statistische methoden gtt Quality control Statistical methods Centrum voor Wiskunde en Informatica <Amsterdam>: CWI Tract 116 (DE-604)BV001902011 116 HBZ Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007771193&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Otten, G. D. Statistical test limits in quality control Centrum voor Wiskunde en Informatica <Amsterdam>: CWI Tract Kwaliteitscontrole gtt Statistische methoden gtt Quality control Statistical methods |
| title | Statistical test limits in quality control |
| title_auth | Statistical test limits in quality control |
| title_exact_search | Statistical test limits in quality control |
| title_full | Statistical test limits in quality control G. D. Otten |
| title_fullStr | Statistical test limits in quality control G. D. Otten |
| title_full_unstemmed | Statistical test limits in quality control G. D. Otten |
| title_short | Statistical test limits in quality control |
| title_sort | statistical test limits in quality control |
| topic | Kwaliteitscontrole gtt Statistische methoden gtt Quality control Statistical methods |
| topic_facet | Kwaliteitscontrole Statistische methoden Quality control Statistical methods |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=007771193&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
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