Embedded systems: trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS
Gespeichert in:
Hauptverfasser: | , |
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Format: | Tagungsbericht Buch |
Sprache: | Undetermined |
Veröffentlicht: |
[Los Alamitos, Calif.]
[IEEE Computer Soc. Press]
1996
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Schriftenreihe: | Tutorial notes
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Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV011394333 | ||
003 | DE-604 | ||
005 | 19970728 | ||
007 | t | ||
008 | 970623s1996 |||| 00||| und d | ||
035 | |a (OCoLC)632606028 | ||
035 | |a (DE-599)BVBBV011394333 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | |a und | ||
049 | |a DE-91 | ||
084 | |a ELT 360f |2 stub | ||
100 | 1 | |a Paulin, Pierre G. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Embedded systems |b trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS |c P. G. Paulin and C. Liem. The European Design & Test Conference and Exhibition |
264 | 1 | |a [Los Alamitos, Calif.] |b [IEEE Computer Soc. Press] |c 1996 | |
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a Tutorial notes | |
700 | 1 | |a Liem, Clifford |e Verfasser |4 aut | |
711 | 2 | |a European Design and Test Conference |d 1996 |c Paris |j Sonstige |0 (DE-588)1900624-X |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-007659336 |
Datensatz im Suchindex
_version_ | 1804125907077562368 |
---|---|
any_adam_object | |
author | Paulin, Pierre G. Liem, Clifford |
author_facet | Paulin, Pierre G. Liem, Clifford |
author_role | aut aut |
author_sort | Paulin, Pierre G. |
author_variant | p g p pg pgp c l cl |
building | Verbundindex |
bvnumber | BV011394333 |
classification_tum | ELT 360f |
ctrlnum | (OCoLC)632606028 (DE-599)BVBBV011394333 |
discipline | Elektrotechnik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00976nam a2200277 c 4500</leader><controlfield tag="001">BV011394333</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19970728 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">970623s1996 |||| 00||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)632606028</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV011394333</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ELT 360f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Paulin, Pierre G.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Embedded systems</subfield><subfield code="b">trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS</subfield><subfield code="c">P. G. Paulin and C. Liem. The European Design & Test Conference and Exhibition</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">[Los Alamitos, Calif.]</subfield><subfield code="b">[IEEE Computer Soc. Press]</subfield><subfield code="c">1996</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Tutorial notes</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Liem, Clifford</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">European Design and Test Conference</subfield><subfield code="d">1996</subfield><subfield code="c">Paris</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)1900624-X</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007659336</subfield></datafield></record></collection> |
id | DE-604.BV011394333 |
illustrated | Not Illustrated |
indexdate | 2024-07-09T18:09:01Z |
institution | BVB |
institution_GND | (DE-588)1900624-X |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007659336 |
oclc_num | 632606028 |
open_access_boolean | |
owner | DE-91 DE-BY-TUM |
owner_facet | DE-91 DE-BY-TUM |
publishDate | 1996 |
publishDateSearch | 1996 |
publishDateSort | 1996 |
publisher | [IEEE Computer Soc. Press] |
record_format | marc |
series2 | Tutorial notes |
spelling | Paulin, Pierre G. Verfasser aut Embedded systems trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS P. G. Paulin and C. Liem. The European Design & Test Conference and Exhibition [Los Alamitos, Calif.] [IEEE Computer Soc. Press] 1996 txt rdacontent n rdamedia nc rdacarrier Tutorial notes Liem, Clifford Verfasser aut European Design and Test Conference 1996 Paris Sonstige (DE-588)1900624-X oth |
spellingShingle | Paulin, Pierre G. Liem, Clifford Embedded systems trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS |
title | Embedded systems trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS |
title_auth | Embedded systems trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS |
title_exact_search | Embedded systems trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS |
title_full | Embedded systems trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS P. G. Paulin and C. Liem. The European Design & Test Conference and Exhibition |
title_fullStr | Embedded systems trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS P. G. Paulin and C. Liem. The European Design & Test Conference and Exhibition |
title_full_unstemmed | Embedded systems trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS P. G. Paulin and C. Liem. The European Design & Test Conference and Exhibition |
title_short | Embedded systems |
title_sort | embedded systems trends and tools tutorial a edac etc asic from asics to systems |
title_sub | trends and tools ; tutorial a ; EDAC, ETC, ASIC ; from ASICS to SYSTEMS |
work_keys_str_mv | AT paulinpierreg embeddedsystemstrendsandtoolstutorialaedacetcasicfromasicstosystems AT liemclifford embeddedsystemstrendsandtoolstutorialaedacetcasicfromasicstosystems AT europeandesignandtestconferenceparis embeddedsystemstrendsandtoolstutorialaedacetcasicfromasicstosystems |