Semiconductor memories: technology, testing, and reliability
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Piscataway
IEEE Press
1997
|
| Schlagworte: | |
| Beschreibung: | XII, 462 S. Ill., graph. Darst. |
| ISBN: | 0780310004 |
Internformat
MARC
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| 245 | 1 | 0 | |a Semiconductor memories |b technology, testing, and reliability |c Ashok K. Sharma |
| 264 | 1 | |a Piscataway |b IEEE Press |c 1997 | |
| 300 | |a XII, 462 S. |b Ill., graph. Darst. | ||
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Datensatz im Suchindex
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| callnumber-first | T - Technology |
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| dewey-search | 621.39/732 |
| dewey-sort | 3621.39 3732 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV011344534 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:08:09Z |
| institution | BVB |
| isbn | 0780310004 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007622490 |
| oclc_num | 34281977 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-29T DE-706 |
| owner_facet | DE-91 DE-BY-TUM DE-29T DE-706 |
| physical | XII, 462 S. Ill., graph. Darst. |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | IEEE Press |
| record_format | marc |
| spelling | Sharma, Ashok K. Verfasser (DE-588)120604752 aut Semiconductor memories technology, testing, and reliability Ashok K. Sharma Piscataway IEEE Press 1997 XII, 462 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Mocroélectronique ram Ordinateurs - Mémoires ram Semiconducteurs ram accès memoire inriac conception mémoire inriac mémoire non volatile inriac semiconducteur inriac technologie mémoire inriac Semiconductor storage devices Halbleiterspeicher (DE-588)4120419-0 gnd rswk-swf Halbleiterspeicher (DE-588)4120419-0 s DE-604 |
| spellingShingle | Sharma, Ashok K. Semiconductor memories technology, testing, and reliability Mocroélectronique ram Ordinateurs - Mémoires ram Semiconducteurs ram accès memoire inriac conception mémoire inriac mémoire non volatile inriac semiconducteur inriac technologie mémoire inriac Semiconductor storage devices Halbleiterspeicher (DE-588)4120419-0 gnd |
| subject_GND | (DE-588)4120419-0 |
| title | Semiconductor memories technology, testing, and reliability |
| title_auth | Semiconductor memories technology, testing, and reliability |
| title_exact_search | Semiconductor memories technology, testing, and reliability |
| title_full | Semiconductor memories technology, testing, and reliability Ashok K. Sharma |
| title_fullStr | Semiconductor memories technology, testing, and reliability Ashok K. Sharma |
| title_full_unstemmed | Semiconductor memories technology, testing, and reliability Ashok K. Sharma |
| title_short | Semiconductor memories |
| title_sort | semiconductor memories technology testing and reliability |
| title_sub | technology, testing, and reliability |
| topic | Mocroélectronique ram Ordinateurs - Mémoires ram Semiconducteurs ram accès memoire inriac conception mémoire inriac mémoire non volatile inriac semiconducteur inriac technologie mémoire inriac Semiconductor storage devices Halbleiterspeicher (DE-588)4120419-0 gnd |
| topic_facet | Mocroélectronique Ordinateurs - Mémoires Semiconducteurs accès memoire conception mémoire mémoire non volatile semiconducteur technologie mémoire Semiconductor storage devices Halbleiterspeicher |
| work_keys_str_mv | AT sharmaashokk semiconductormemoriestechnologytestingandreliability |