Reliability and degradation of III - V optical devices:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston [u.a.]
Artech House
1996
|
| Schlagworte: | |
| Beschreibung: | XII, 353 S. Ill., graph. Darst. |
| ISBN: | 0890066523 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV011336135 | ||
| 003 | DE-604 | ||
| 005 | 20140724 | ||
| 007 | t | ||
| 008 | 970509s1996 ad|| |||| 00||| eng d | ||
| 020 | |a 0890066523 |9 0-89006-652-3 | ||
| 035 | |a (OCoLC)34878925 | ||
| 035 | |a (DE-599)BVBBV011336135 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T |a DE-703 |a DE-20 |a DE-1050 |a DE-634 |a DE-11 |a DE-83 | ||
| 050 | 0 | |a TK7871.85 | |
| 082 | 0 | |a 621.36/93 |2 20 | |
| 084 | |a UH 6700 |0 (DE-625)145770: |2 rvk | ||
| 084 | |a UP 3050 |0 (DE-625)146370: |2 rvk | ||
| 084 | |a UP 3100 |0 (DE-625)146372: |2 rvk | ||
| 084 | |a ZN 5030 |0 (DE-625)157431: |2 rvk | ||
| 100 | 1 | |a Ueda, Osamu |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Reliability and degradation of III - V optical devices |c Osamu Ueda |
| 264 | 1 | |a Boston [u.a.] |b Artech House |c 1996 | |
| 300 | |a XII, 353 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Crystals |x Defects | |
| 650 | 4 | |a Gallium arsenide semiconductors |x Reliability | |
| 650 | 4 | |a Light emitting diodes |x Reliability | |
| 650 | 4 | |a Semiconductors |x Failures | |
| 650 | 0 | 7 | |a Optisches Bauelement |0 (DE-588)4172681-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Drei-Fünf-Halbleiter |0 (DE-588)4150649-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Drei-Fünf-Halbleiter |0 (DE-588)4150649-2 |D s |
| 689 | 0 | 1 | |a Optisches Bauelement |0 (DE-588)4172681-9 |D s |
| 689 | 0 | |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-007615906 | ||
Datensatz im Suchindex
| _version_ | 1804125843399639040 |
|---|---|
| any_adam_object | |
| author | Ueda, Osamu |
| author_facet | Ueda, Osamu |
| author_role | aut |
| author_sort | Ueda, Osamu |
| author_variant | o u ou |
| building | Verbundindex |
| bvnumber | BV011336135 |
| callnumber-first | T - Technology |
| callnumber-label | TK7871 |
| callnumber-raw | TK7871.85 |
| callnumber-search | TK7871.85 |
| callnumber-sort | TK 47871.85 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_rvk | UH 6700 UP 3050 UP 3100 ZN 5030 |
| ctrlnum | (OCoLC)34878925 (DE-599)BVBBV011336135 |
| dewey-full | 621.36/93 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36/93 |
| dewey-search | 621.36/93 |
| dewey-sort | 3621.36 293 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01485nam a2200433 c 4500</leader><controlfield tag="001">BV011336135</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20140724 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">970509s1996 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0890066523</subfield><subfield code="9">0-89006-652-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)34878925</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV011336135</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-20</subfield><subfield code="a">DE-1050</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-11</subfield><subfield code="a">DE-83</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7871.85</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.36/93</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6700</subfield><subfield code="0">(DE-625)145770:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 3050</subfield><subfield code="0">(DE-625)146370:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 3100</subfield><subfield code="0">(DE-625)146372:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZN 5030</subfield><subfield code="0">(DE-625)157431:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Ueda, Osamu</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Reliability and degradation of III - V optical devices</subfield><subfield code="c">Osamu Ueda</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston [u.a.]</subfield><subfield code="b">Artech House</subfield><subfield code="c">1996</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XII, 353 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Crystals</subfield><subfield code="x">Defects</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Gallium arsenide semiconductors</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Light emitting diodes</subfield><subfield code="x">Reliability</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Failures</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Optisches Bauelement</subfield><subfield code="0">(DE-588)4172681-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Drei-Fünf-Halbleiter</subfield><subfield code="0">(DE-588)4150649-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Drei-Fünf-Halbleiter</subfield><subfield code="0">(DE-588)4150649-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Optisches Bauelement</subfield><subfield code="0">(DE-588)4172681-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-007615906</subfield></datafield></record></collection> |
| id | DE-604.BV011336135 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T18:08:00Z |
| institution | BVB |
| isbn | 0890066523 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-007615906 |
| oclc_num | 34878925 |
| open_access_boolean | |
| owner | DE-29T DE-703 DE-20 DE-1050 DE-634 DE-11 DE-83 |
| owner_facet | DE-29T DE-703 DE-20 DE-1050 DE-634 DE-11 DE-83 |
| physical | XII, 353 S. Ill., graph. Darst. |
| publishDate | 1996 |
| publishDateSearch | 1996 |
| publishDateSort | 1996 |
| publisher | Artech House |
| record_format | marc |
| spelling | Ueda, Osamu Verfasser aut Reliability and degradation of III - V optical devices Osamu Ueda Boston [u.a.] Artech House 1996 XII, 353 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Crystals Defects Gallium arsenide semiconductors Reliability Light emitting diodes Reliability Semiconductors Failures Optisches Bauelement (DE-588)4172681-9 gnd rswk-swf Drei-Fünf-Halbleiter (DE-588)4150649-2 gnd rswk-swf Drei-Fünf-Halbleiter (DE-588)4150649-2 s Optisches Bauelement (DE-588)4172681-9 s DE-604 |
| spellingShingle | Ueda, Osamu Reliability and degradation of III - V optical devices Crystals Defects Gallium arsenide semiconductors Reliability Light emitting diodes Reliability Semiconductors Failures Optisches Bauelement (DE-588)4172681-9 gnd Drei-Fünf-Halbleiter (DE-588)4150649-2 gnd |
| subject_GND | (DE-588)4172681-9 (DE-588)4150649-2 |
| title | Reliability and degradation of III - V optical devices |
| title_auth | Reliability and degradation of III - V optical devices |
| title_exact_search | Reliability and degradation of III - V optical devices |
| title_full | Reliability and degradation of III - V optical devices Osamu Ueda |
| title_fullStr | Reliability and degradation of III - V optical devices Osamu Ueda |
| title_full_unstemmed | Reliability and degradation of III - V optical devices Osamu Ueda |
| title_short | Reliability and degradation of III - V optical devices |
| title_sort | reliability and degradation of iii v optical devices |
| topic | Crystals Defects Gallium arsenide semiconductors Reliability Light emitting diodes Reliability Semiconductors Failures Optisches Bauelement (DE-588)4172681-9 gnd Drei-Fünf-Halbleiter (DE-588)4150649-2 gnd |
| topic_facet | Crystals Defects Gallium arsenide semiconductors Reliability Light emitting diodes Reliability Semiconductors Failures Optisches Bauelement Drei-Fünf-Halbleiter |
| work_keys_str_mv | AT uedaosamu reliabilityanddegradationofiiivopticaldevices |